公开(公告)号：US6124559A

公开(公告)日：2000-09-26

申请号：US150818

申请日：1998-09-11

申请人： Yiak Khian Heng ,  Zheng Zhu ,  Seok Hiong Tan ,  Chee Keong Tan ,  Jong Yong Foo

发明人： Yiak Khian Heng ,  Zheng Zhu ,  Seok Hiong Tan ,  Chee Keong Tan ,  Jong Yong Foo

IPC分类号： B07C5/344 ,  G01R31/01

CPC分类号： G01R31/01 ,  B07C5/344 ,  Y10S414/135 ,  Y10S414/137

摘要： An integrated circuit sorter automatically prevents the binning of a tested integrated circuit into a wrong container, such as a wrong tube, depending on the results of testing the integrated circuit. The automated integrated circuit sorter includes a respective switch for indicating that each output carries one of good or bad integrated circuits. A container identifier at each output identifies the type of container placed at the output. The container is determined to be for carrying good integrated circuits or bad integrated circuits. If the type of container placed at the output does not correspond to the type of integrated circuits at the output, then an integrated circuit stopper automatically blocks the admission of those integrated circuits into that container. The container identifier includes a light emitter and an optical sensor. A data processor determines whether a correct container or a wrong container is at the output. The data processor communicates with the integrated circuit sorter for affecting action of the integrated circuit stopper via the integrated circuit sorter. A data processor disable jumper may be coupled to the integrated circuit sorter to allow manual control of the integrated circuit stopper. Such a data processor disable jumper is especially advantageous in the event any component of the present invention is inoperative when the integrated circuit sorter may advantageously be manually controlled.

摘要翻译： 集成电路分拣机根据集成电路测试的结果，自动防止将被测集成电路装入错误的容器（如错误​​的管）中。 自动化集成电路分选机包括用于指示每个输出承载有益或不良集成电路之一的相应开关。 每个输出处的容器标识符标识放置在输出端的容器的类型。 该容器被确定为用于承载良好的集成电路或不良集成电路。 如果放置在输出端的容器类型与输出端的集成电路类型不对应，则集成电路限位器会自动阻止这些集成电路进入该容器。 容器标识符包括光发射器和光学传感器。 数据处理器确定正确的容器或错误的容器是否在输出端。 数据处理器与集成电路分拣机通信，用于通过集成电路分拣机影响集成电路限制器的动作。 数据处理器禁用跳线可以耦合到集成电路分类器以允许手动控制集成电路停止器。 当集成电路分拣机可以有利地被手动控制时，这种数据处理器禁用跳线在本发明的任何组件都不起作用的情况下是特别有利的。

公开(公告)号：US06445174B1

公开(公告)日：2002-09-03

申请号：US10101918

申请日：2002-03-20

申请人： Hock Chuan Koh ,  Jin Wee Lim ,  Yiak Khian Heng

发明人： Hock Chuan Koh ,  Jin Wee Lim ,  Yiak Khian Heng

IPC分类号： G01R3128

CPC分类号： G01R31/2851 ,  G01R31/01 ,  G01R31/2893

摘要： A sliding tray holder is coupled to an IC (integrated circuit) package test system having a plurality of test stations, for holding the trays of IC packages during testing of a high quantity of IC packages through the plurality of test stations. The sliding tray holder includes a platform for holding a first tray of untested IC packages and for holding a second tray of tested IC packages. Each untested IC package from the first tray of untested IC packages is loaded to at least one of the plurality of test stations for testing of the untested IC package such that the untested IC package becomes a tested IC package. The tested IC package is unloaded from one of the plurality of test stations to the second tray of tested IC packages. The platform holds the first tray of untested IC packages and the second tray of tested IC packages such that an operator does not hold the first tray and the second tray during loading of the untested IC packages to the plurality of test stations from the first tray and during unloading of the tested IC packages from the plurality of test stations to the second tray. A linear slide holds the platform and guides the platform holding the first tray and the second tray along the plurality of test stations as the platform is moved along the plurality of test stations during loading of the untested IC packages to the plurality of test stations from the first tray and during unloading of the tested IC packages from the plurality of test stations to the second tray. In this manner, the operator is relieved from constantly holding trays of IC packages during testing of a high quantity of IC packages.

摘要翻译： 滑动托架支架耦合到具有多个测试站的IC（集成电路）封装测试系统，用于在通过多个测试站测试大量IC封装期间保持IC封装的托盘。 滑动托盘支架包括用于保持未测试的IC封装的第一托盘并用于保持被测IC封装的第二托盘的平台。 来自未经测试的IC封装的第一托盘的每个未经测试的IC封装被加载到多个测试站中的至少一个测试站，用于测试未测试的IC封装，使得未经测试的IC封装成为测试IC封装。 测试的IC封装从多个测试站之一卸载到第二测试IC封装盘。 平台保持未测试的IC封装的第一托盘和经测试的IC封装的第二托盘，使得操作者在将未经测试的IC封装从第一托盘加载到多个测试站期间不保持第一托盘和第二托盘，并且 在将所测试的IC封装从多个测试站卸载到第二托盘期间。 线性滑块保持平台并引导平台沿着多个测试台保持第一托盘和平台沿着多个测试站移动，在将未经测试的IC封装从多个测试站从 第一托盘和在将测试的IC封装从多个测试站卸载到第二托盘期间。 以这种方式，在大量IC封装的测试期间，操作者不用持续地托盘IC封装。

公开(公告)号：US06396258B1

公开(公告)日：2002-05-28

申请号：US09602857

申请日：2000-06-26

申请人： Hock Chuan Koh ,  Jin Wee Lim ,  Yiak Khian Heng

发明人： Hock Chuan Koh ,  Jin Wee Lim ,  Yiak Khian Heng

IPC分类号： G01R3128

CPC分类号： G01R31/2851 ,  G01R31/01 ,  G01R31/2893

摘要： A sliding tray holder is coupled to an IC (integrated circuit) package test system having a plurality of test stations, for holding the trays of IC packages during testing of a high quantity of IC packages through the plurality of test stations. The sliding tray holder includes a platform for holding a first tray of untested IC packages and for holding a second tray of tested IC packages. Each untested IC package from the first tray of untested IC packages is loaded to at least one of the plurality of test stations for testing of the untested IC package such that the untested IC package becomes a tested IC package. The tested IC package is unloaded from one of the plurality of test stations to the second tray of tested IC packages. The platform holds the first tray of untested IC packages and the second tray of tested IC packages such that an operator does not hold the first tray and the second tray during loading of the untested IC packages to the plurality of test stations from the first tray and during unloading of the tested IC packages from the plurality of test stations to the second tray. A linear slide holds the platform and guides the platform holding the first tray and the second tray along the plurality of test stations as the platform is moved along the plurality of test stations during loading of the untested IC packages to the plurality of test stations from the first tray and during unloading of the tested IC packages from the plurality of test stations to the second tray. In this manner, the operator is relieved from constantly holding trays of IC packages during testing of a high quantity of IC packages.