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公开(公告)号：US20080192888A1
公开(公告)日：2008-08-14
申请号：US11587930
申请日：2005-04-25
IPC分类号： G01N23/223
CPC分类号： G01N23/223 , G01N2223/076
摘要： In a fluorescent X-ray analysis method, a sample (1) is set on a sample stage (2) on an upper side of an X-ray irradiation chamber (7) and a sample cover (6) is closed from the upper part of the sample (1) to surround the sample (1), and then, a lower plane of the sample (1) is irradiated with X-ray for analysis. When the sample (1) is set on the sample stage (2) and the sample cover (6) is closed, a cover detecting means (8) detects that the sample cover (6) is closed and X-ray is automatically projected from an X-ray source (3) to start analysis.
摘要翻译： 在荧光X射线分析方法中，将样品（1）设置在X射线照射室（7）的上侧的样品台（2）上，并且样品盖（6）从上部 的样品（1）包围样品（1），然后用X射线照射样品（1）的下平面用于分析。 当样品（1）被放置在样品台（2）上并且样品盖（6）被关闭时，盖检测装置（8）检测到样品盖（6）被关闭并且X射线从 X射线源（3）开始分析。
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2.发明授权公开(公告)号：US07170970B2
公开(公告)日：2007-01-30
申请号：US11197303
申请日：2005-08-05
IPC分类号： G01N23/223
CPC分类号： G01N23/223 , G01N2223/076
摘要： The concentration(s) of element(s) contained in an unknown sample is measured without necessity of judging the sample relying on a human's eye and obtaining information from a supplier of the sample previously. The concentration(s) of trace element(s) such as Cd, Pb and Hg contained in parts for electronic or electric equipment is determined by (1) irradiating the sample with an X-ray so as to identify whether the type of the sample is a nonmetal-based material or a metal-based material; (2) selecting measuring conditions for a fluorescent X-ray analysis depending on the identified type of the sample; and (3) measuring the concentration(s) of one or more element(s) contained in the sample by the fluorescent X-ray analysis according to the selected measuring conditions.
摘要翻译： 测量未知样品中所含元素的浓度，而不必依赖人眼判定样品，并从先前样品供应商获取信息。 用于电子或电气设备的部件中所含的痕量元素如Cd，Pb和Hg的浓度由（1）用X射线照射样品来确定样品的类型 是非金属基材料或金属基材料; （2）根据识别出的样品类型选择荧光X射线分析的测定条件; 和（3）根据所选择的测量条件通过荧光X射线分析测量样品中所含的一种或多种元素的浓度。
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公开(公告)号：US07515685B2
公开(公告)日：2009-04-07
申请号：US11587930
申请日：2005-04-25
IPC分类号： G01N23/223
CPC分类号： G01N23/223 , G01N2223/076
摘要： In a fluorescent X-ray analysis method, a sample (1) is set on a sample stage (2) on an upper side of an X-ray irradiation chamber (7) and a sample cover (6) is closed from the upper part of the sample (1) to surround the sample (1), and then, a lower plane of the sample (1) is irradiated with X-ray for analysis. When the sample (1) is set on the sample stage (2) and the sample cover (6) is closed, a cover detecting means (8) detects that the sample cover (6) is closed and X-ray is automatically projected from an X-ray source (3) to start analysis.
摘要翻译： 在荧光X射线分析方法中，将样品（1）设置在X射线照射室（7）的上侧的样品台（2）上，并且样品盖（6）从上部 的样品（1）包围样品（1），然后用X射线照射样品（1）的下平面用于分析。 当样品（1）被放置在样品台（2）上并且样品盖（6）被关闭时，盖检测装置（8）检测到样品盖（6）被关闭并且X射线从 X射线源（3）开始分析。
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4.发明授权公开(公告)号：US07382855B2
公开(公告)日：2008-06-03
申请号：US11587856
申请日：2005-04-27
IPC分类号： G01N23/223
CPC分类号： G01N23/223 , G01N2223/076
摘要： It is possible to solve the problem of the conventional fluorescent X-ray analysis that a concentration calculation result can be obtained only after elapse of a time set as a measurement time. In the fluorescent X-ray analysis method and fluorescent X-ray analysis device according to the present invention, a sample measurement condition is set before starting the measurement and the measurement concentration of the element contained in the sample and the measurement accuracy are calculated. When the measurement accuracy has become a value satisfying the predetermined measurement condition, the measurement is terminated and the concentration at that moment is outputted.
摘要翻译： 可以解决常规荧光X射线分析的问题，即只有经过设定为测量时间的时间才能获得浓度计算结果。 在根据本发明的荧光X射线分析方法和荧光X射线分析装置中，在开始测量之前设置样品测量条件，并且计算包含在样品中的元素的测量浓度和测量精度。 当测量精度已经成为满足预定测量条件的值时，测量结束并且此时的浓度被输出。
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5.发明申请公开(公告)号：US20070248211A1
公开(公告)日：2007-10-25
申请号：US11587856
申请日：2005-04-27
IPC分类号： G01N23/223 , G06F19/00
CPC分类号： G01N23/223 , G01N2223/076
摘要： It is possible to solve the problem of the conventional fluorescent X-ray analysis that a concentration calculation result can be obtained only after elapse of a time set as a measurement time. In the fluorescent X-ray analysis method and fluorescent X-ray analysis device according to the present invention, a sample measurement condition is set before starting the measurement and the measurement concentration of the element contained in the sample and the measurement accuracy are calculated. When the measurement accuracy has become a value satisfying the predetermined measurement condition, the measurement is terminated and the concentration at that moment is outputted.
摘要翻译： 可以解决常规荧光X射线分析的问题，即只有经过设定为测量时间的时间才能获得浓度计算结果。 在根据本发明的荧光X射线分析方法和荧光X射线分析装置中，在开始测量之前设置样品测量条件，并且计算包含在样品中的元素的测量浓度和测量精度。 当测量精度已经成为满足预定测量条件的值时，测量结束并且此时的浓度被输出。
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6.发明申请公开(公告)号：US20060029182A1
公开(公告)日：2006-02-09
申请号：US11197303
申请日：2005-08-05
IPC分类号： G01N23/223 , G01T1/36
CPC分类号： G01N23/223 , G01N2223/076
摘要： The concentration(s) of element(s) contained in an unknown sample is measured without necessity of judging the sample relying on a human's eye and obtaining information from a supplier of the sample previously. The concentration(s) of trace element(s) such as Cd, Pb and Hg contained in parts for electronic or electric equipment is determined by (1) irradiating the sample with an X-ray so as to identify whether the type of the sample is a nonmetal-based material or a metal-based material; (2) selecting measuring conditions for a fluorescent X-ray analysis depending on the identified type of the sample; and (3) measuring the concentration(s) of one or more element(s) contained in the sample by the fluorescent X-ray analysis according to the selected measuring conditions.
摘要翻译： 测量未知样品中所含元素的浓度，而不必依赖人眼判定样品，并从先前样品供应商获取信息。 用于电子或电气设备的部件中所含的痕量元素如Cd，Pb和Hg的浓度由（1）用X射线照射样品来确定样品的类型 是非金属基材料或金属基材料; （2）根据识别出的样品类型选择荧光X射线分析的测定条件; 和（3）根据所选择的测量条件通过荧光X射线分析测量样品中所含的一种或多种元素的浓度。
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公开(公告)号：US07720193B2
公开(公告)日：2010-05-18
申请号：US12064624
申请日：2006-08-14
IPC分类号： G01N23/223
CPC分类号： G01N23/223 , G01N2223/076
摘要： An object of the present invention is to shorten the time required by processing, and to simplify the work and increase the number of samples processed, in the X-ray analysis of a specific substance contained in a sample. To achieve the object, a method for assaying the content of a specific substance in a sample 106, comprises a measurement step (S3) of irradiating the sample 106 with X-rays, and measuring the spectrum of the sample 106, and an assay step (S4) of comparing the components of the specific substance in the spectrum of the sample 106 and in a reference spectrum that has been pre-stored for the sample 106, and determining whether the specific substance is contained in the sample 106 in an amount equal to or greater than a specific value.
摘要翻译： 本发明的目的是缩短样品中所含特定物质的X射线分析中处理所需的时间，并且简化工作并增加样品数量。 为了实现该目的，用于测定样品106中特定物质的含量的方法包括用X射线照射样品106并测量样品106的光谱的测量步骤（S3）和测定步骤 （S4）比较样品106的光谱中的特定物质的组分和已经为样品106预先存储的参考光谱，并且确定特定物质是否包含在样品106中的量相等 达到或大于特定值。
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8.发明申请公开(公告)号：US20090262890A1
公开(公告)日：2009-10-22
申请号：US12064624
申请日：2006-08-14
IPC分类号： G01N23/223
CPC分类号： G01N23/223 , G01N2223/076
摘要： An object of the present invention is to shorten the time required by processing, and to simplify the work and increase the number of samples processed, in the X-ray analysis of a specific substance contained in a sample. To achieve the object, a method for assaying the content of a specific substance in a sample 106, comprises a measurement step (S3) of irradiating the sample 106 with X-rays, and measuring the spectrum of the sample 106, and an assay step (S4) of comparing the components of the specific substance in the spectrum of the sample 106 and in a reference spectrum that has been pre-stored for the sample 106, and determining whether the specific substance is contained in the sample 106 in an amount equal to or greater than a specific value.
摘要翻译： 本发明的目的是缩短样品中所含特定物质的X射线分析中处理所需的时间，并且简化工作并增加样品数量。 为了实现该目的，用于测定样品106中特定物质的含量的方法包括用X射线照射样品106并测量样品106的光谱的测量步骤（S3）和测定步骤 （S4）比较样品106的光谱中的特定物质的组分和已经为样品106预先存储的参考光谱，并且确定特定物质是否包含在样品106中的量相等 达到或大于特定值。
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公开(公告)号：US20100033641A1
公开(公告)日：2010-02-11
申请号：US12490682
申请日：2009-06-24
IPC分类号： H04N5/64
CPC分类号： H04N5/64
摘要： The image display device of the present invention includes a display panel having a front surface for displaying an image and a rear surface facing a side opposite to the front surface, and a chassis to which a circuit-bearing member is attached. The chassis supports the display panel. The chassis has a frame shape that surrounds the display panel from outside in a direction perpendicular to a thickness direction of the display panel, and that allows the rear surface of the display panel to be exposed. Thereby, heat can be radiated to air directly from the rear surface of the display panel.
摘要翻译： 本发明的图像显示装置包括具有用于显示图像的前表面和面向与前表面相对的一侧的后表面的显示面板和附接有电路承载构件的底架。 机箱支持显示面板。 底架具有从垂直于显示面板的厚度方向的方向从外部围绕显示面板的框架形状，并且允许显示面板的后表面露出。 由此，可以从显示面板的后表面直接将热量照射到空气中。
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公开(公告)号：US20050127144A1
公开(公告)日：2005-06-16
申请号：US10730982
申请日：2003-12-10
申请人： Atuhito Mochida , Korekazu Mochida , Kyoko Mochida , Hiroto Inoue , Suguru Nakao , Yukihiro Iwata , Akira Takamori , Hideto Adachi , Masatoshi Tamura
发明人： Atuhito Mochida , Korekazu Mochida , Kyoko Mochida , Hiroto Inoue , Suguru Nakao , Yukihiro Iwata , Akira Takamori , Hideto Adachi , Masatoshi Tamura
CPC分类号： B23K20/023 , B23K2101/36 , H01L24/83 , H01L2224/83192
摘要： The present invention to provide a method of mounting a semiconductor laser component capable of preventing deterioration of laser characteristics and destruction of the semiconductor laser component due to residual stresses as well as preventing decrease of a lifetime due to increase in temperature of the semiconductor laser component. The method of mounting a semiconductor laser device which comprises a step of pressure bonding a semiconductor laser component on a submount by a collet while a bonding member is heated to be fused or melt on a submount by heating a table on which the submount is placed, for example, characterized in that the table and the collet are heated to a temperature higher than a fusing point of said bonding member so as not to occur the heat transfer substantially to a collet, and then heating of the table and the collet is terminated with maintaining the pressure bonding state.
摘要翻译： 本发明提供一种安装半导体激光器部件的方法，该半导体激光器部件能够防止由于残余应力引起的激光特性的劣化和半导体激光器部件的破坏以及防止半导体激光部件的温度升高引起的寿命的降低。 一种半导体激光装置的安装方法，其特征在于，在通过加热配置有所述基台的工作台的同时，在接合部件被加热熔融或熔融在副安装座上时，通过夹头将半导体激光部件压接在副安装座上的工序， 例如，其特征在于，将工作台和夹头加热到高于所述接合构件的熔点的温度，以便不将热传递基本上发生到夹头，然后用桌子和夹头加热，以 保持压接状态。
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