-
1.发明申请SEMICONDUCTOR TESTING CIRCUIT, SEMICONDUCTOR TESTING JIG, SEMICONDUCTOR TESTING APPARATUS, AND SEMICONDUCTOR TESTING METHOD 有权半导体测试电路，半导体测试仪，半导体测试仪器和半导体测试方法公开(公告)号：US20110057681A1
公开(公告)日：2011-03-10
申请号：US12873738
申请日：2010-09-01
申请人： Yuichi Watanabe , Kiyotaka Shinada , Yuushin Kimura , Shigeru Goto , Yasuhiko Tandou , Eiji Takada , Kouji Uesaka
发明人： Yuichi Watanabe , Kiyotaka Shinada , Yuushin Kimura , Shigeru Goto , Yasuhiko Tandou , Eiji Takada , Kouji Uesaka
IPC分类号： G01R31/26
CPC分类号： G01R31/2889
摘要： A signal processing section included in a semiconductor testing circuit supplies a test signal inputted from a tester via a signal line to a plurality of DUTs and generates a test result by synthesizing response signals transmitted from the plurality of DUTs on the basis of the test signal. A test result output section included in the semiconductor testing circuit makes a voltage level of the test result differ from a voltage level of the test signal inputted and outputs the test result to the tester via the signal line.
摘要翻译： 包括在半导体测试电路中的信号处理部分通过信号线向测试者输入的测试信号提供给多个DUT，并且通过根据测试信号合成从多个DUT发送的响应信号来产生测试结果。 包含在半导体测试电路中的测试结果输出部分使得测试结果的电压电平与输入的测试信号的电压电平不同，并通过信号线将测试结果输出给测试者。
-
2.发明授权Semiconductor testing circuit, semiconductor testing jig, semiconductor testing apparatus, and semiconductor testing method 有权半导体测试电路，半导体测试夹具，半导体测试仪器和半导体测试方法公开(公告)号：US08736295B2
公开(公告)日：2014-05-27
申请号：US12873738
申请日：2010-09-01
申请人： Yuichi Watanabe , Kiyotaka Shinada , Yuushin Kimura , Shigeru Goto , Yasuhiko Tandou , Eiji Takada , Kouji Uesaka
发明人： Yuichi Watanabe , Kiyotaka Shinada , Yuushin Kimura , Shigeru Goto , Yasuhiko Tandou , Eiji Takada , Kouji Uesaka
IPC分类号： G01R31/26
CPC分类号： G01R31/2889
摘要： A signal processing section included in a semiconductor testing circuit supplies a test signal inputted from a tester via a signal line to a plurality of DUTs and generates a test result by synthesizing response signals transmitted from the plurality of DUTs on the basis of the test signal. A test result output section included in the semiconductor testing circuit makes a voltage level of the test result differ from a voltage level of the test signal inputted and outputs the test result to the tester via the signal line.
摘要翻译： 包括在半导体测试电路中的信号处理部分通过信号线向测试者输入的测试信号提供给多个DUT，并且通过根据测试信号合成从多个DUT发送的响应信号来产生测试结果。 包含在半导体测试电路中的测试结果输出部分使得测试结果的电压电平与输入的测试信号的电压电平不同，并通过信号线将测试结果输出给测试者。
-
搜索结果
2 条记录 (耗时 0.027 秒)
