公开(公告)号：US20170248628A1

公开(公告)日：2017-08-31

申请号：US15444162

申请日：2017-02-27

申请人： mCube, Inc.

发明人： Sanjay BHANDARI ,  Ken WANG ,  Ben LEE

IPC分类号： G01P15/08 ,  B81B7/00

CPC分类号： G01P15/08 ,  B81B7/0074 ,  B81B7/0087 ,  B81B2201/0235 ,  B81B2201/0242 ,  B81B2201/0257 ,  B81B2201/0264 ,  B81B2201/0292 ,  B81B2201/047 ,  B81B2207/012 ,  G01P15/0802 ,  H01L2224/32145 ,  H01L2224/48091 ,  H01L2224/73265 ,  H01L2924/00014

摘要： A method for operating an electronic device comprising a first and second MEMS device and a semiconductor substrate disposed upon a mounting substrate includes subjecting the first MEMS device and the second MEMS device to physical perturbations, wherein the physical perturbations comprise first physical perturbations associated with the first MEMS device and second physical perturbations associated with the second MEMS device, wherein the first physical perturbations and the second physical perturbations are substantially contemporaneous, determining in a plurality of CMOS circuitry formed within the one or more semiconductor substrates, first physical perturbation data from the first MEMS device in response to the first physical perturbations and second physical perturbation data from the second MEMS device in response to the second physical perturbations, determining output data in response to the first physical perturbation data and to the second physical perturbation data, and outputting the output data.

公开(公告)号：US20220229084A1

公开(公告)日：2022-07-21

申请号：US17667180

申请日：2022-02-08

申请人： mCube, Inc.

发明人： Sanjay BHANDARI ,  Giovanni BELLUSCI

IPC分类号： G01P15/08 ,  G01P21/00 ,  B81B7/00 ,  G01P15/18

摘要： A MEMS device includes a first MEMS sensor associated with a first spatial plane and a second MEMS sensor is associated with a spatial second plane not co-planar with the first spatial plane, wherein the first MEMS sensor is configured to provide a first interrupt and a first data in response to a physical perturbation, wherein the second MEMS sensor is configured to provide a second interrupt and second data in response to the physical perturbation, and a controller configured to receive the first interrupt at a first time and the second interrupt at a second time different from the first time, wherein the controller is configured to determine a latency between the first time and the second time, and wherein the controller is configured to determine motion data in response to the first data, to the second data, and to the latency.

公开(公告)号：US20140012531A1

公开(公告)日：2014-01-09

申请号：US13936117

申请日：2013-07-05

申请人： MCube, Inc.

发明人： Sanjay BHANDARI ,  Joe KELLY

IPC分类号： G01P21/00

CPC分类号： G01P21/00 ,  G01C25/005

摘要： A hand-held processor system for processing data from an integrated MEMS (Micro-Electro-Mechanical-Systems) device disposed within a hand-held computer system and methods therefor. The Single Point Offset Correction (SPOC) process computes offset values to calibrate MEMS sensors using a single set of data measurements at an orientation without dynamic perturbation, and without requiring advance knowledge of orientation of the device. Arbitrary output biases, which are known to be dominant on a single axis, can be corrected to ensure consistent performance. The SPOC process provides a simple method to effectively calibrate a MEMS sensor without requiring extensive system resources. This process can be enhanced by additional estimations of sensor offsets using the set of data measurements or by use of rule-based empirical gain factors.

摘要翻译： 一种用于处理设置在手持计算机系统内的集成MEMS（微机电系统）装置的数据的手持处理器系统及其方法。 单点偏移校正（SPOC）过程计算偏移值，以在没有动态扰动的方向上使用单个数据测量集来校准MEMS传感器，并且不需要事先了解设备的取向。 已知在单个轴上占优势的任意输出偏差可以被校正，以确保一致的性能。 SPOC过程提供了一种简单的方法来有效地校准MEMS传感器，而不需要大量的系统资源。 可以通过使用该组数据测量或通过使用基于规则的经验增益因子的传感器偏移的附加估计来增强该过程。