公开(公告)号：US10171184B2

公开(公告)日：2019-01-01

申请号：US14949591

申请日：2015-11-23

申请人： w2bi, Inc.

发明人： Derek Diperna ,  Ira Leventhal ,  Keith Schaub ,  Artun Kutchuk

IPC分类号： H04W24/00 ,  H04B17/16 ,  G05B19/418 ,  H04W4/80 ,  G06F3/0346 ,  H04M1/04 ,  H04N7/18 ,  H04W4/02 ,  H04W24/02 ,  G06F11/22 ,  H04B17/11 ,  H04B17/21 ,  H04B17/29 ,  B25J9/16 ,  H02J7/02 ,  H04M1/24 ,  H04W84/12 ,  H04W24/06

摘要： An automatic system level testing (ASLT) system for testing smart devices is disclosed. The system comprises a system controller coupled to a smart device in an enclosure, wherein the system controller comprises a memory comprising test logic and a processor. The enclosure comprises a plurality of components, wherein the processor is configured to automatically control the smart device and the plurality of components in accordance with the test logic. The plurality of components comprises: (a) a robotic arm comprising a stylus affixed thereto; and (b) a platform comprising a device holder affixed thereto, wherein the smart device is inserted into the device holder; and (c) a wireless access point. The processor is further configured to: (a) control the smart device to activate wireless mode; (b) receive wireless signals from the wireless access point using the smart device; (c) retrieve wireless scan results from the smart device; and (d) analyze the wireless scan results.

公开(公告)号：US10530499B2

公开(公告)日：2020-01-07

申请号：US16126980

申请日：2018-09-10

申请人： w2bi, Inc.

发明人： Derek Diperna ,  Ira Leventhal ,  Keith Schaub ,  Artun Kutchuk

IPC分类号： H04W24/00 ,  H04B17/16 ,  G05B19/418 ,  H04W4/80 ,  G06F3/0346 ,  H04M1/04 ,  H04N7/18 ,  H04W24/02 ,  G06F11/22 ,  H04B17/11 ,  H04B17/21 ,  H04B17/29 ,  B25J9/16 ,  H02J7/02 ,  H04M1/24 ,  H04W84/12 ,  H04W24/06

摘要： An automatic system level testing (ASLT) system for testing smart devices is disclosed. The system comprises a system controller coupled to a smart device in an enclosure, wherein the system controller comprises a memory comprising test logic and a processor. The enclosure comprises a plurality of components, wherein the processor is configured to automatically control the smart device and the plurality of components in accordance with the test logic. The plurality of components comprises: (a) a robotic arm comprising a stylus affixed thereto; and (b) a platform comprising a device holder affixed thereto, wherein the smart device is inserted into the device holder; and (c) a wireless access point. The processor is further configured to: (a) control the smart device to activate wireless mode; (b) receive wireless signals from the wireless access point using the smart device; (c) retrieve wireless scan results from the smart device; and (d) analyze the wireless scan results.

公开(公告)号：US10432328B2

公开(公告)日：2019-10-01

申请号：US15955610

申请日：2018-04-17

申请人： w2bi, Inc.

发明人： Derek Diperna ,  Ira Leventhal ,  Keith Schaub ,  Artun Kutchuk

IPC分类号： H04B17/16 ,  G05B19/418 ,  H04W4/80 ,  G06F3/0346 ,  H04M1/04 ,  H04N7/18 ,  H04W4/02 ,  H04W24/02 ,  G06F11/22 ,  H04B17/11 ,  H04B17/21 ,  H04B17/29 ,  B25J9/16 ,  H02J7/02 ,  H04M1/24 ,  H04W84/12 ,  H04W24/06

摘要： An automatic system level testing (ASLT) system for testing smart devices is disclosed. The system comprises a system controller operable to be coupled with a smart device in an enclosure, wherein the system controller comprises a memory comprising test logic and a processor. The system also comprises the enclosure, wherein the enclosure comprises a plurality of components, the plurality of components comprising: (i) a robotic arm comprising a stylus, wherein the stylus is operable to manipulate the smart device to simulate human interaction therewith; and (ii) a platform comprising a device holder, wherein the device holder is operable to receive a smart device inserted there into. The processor is configured to automatically control the smart device and the plurality of components in accordance with the test logic.

公开(公告)号：US10020899B2

公开(公告)日：2018-07-10

申请号：US14949551

申请日：2015-11-23

申请人： w2bi, Inc.

发明人： Derek Diperna ,  Ira Leventhal ,  Keith Schaub ,  Artun Kutchuk

IPC分类号： G05B19/418 ,  G01R31/28 ,  H04B17/16 ,  H04W4/80 ,  G06F3/0346 ,  H04M1/04 ,  H04N7/18 ,  H04W4/00 ,  H04W4/02 ,  H04W24/02 ,  G06F11/22 ,  H04B17/11 ,  H04B17/21 ,  H04B17/29 ,  B25J9/16 ,  H02J7/02 ,  H04M1/24 ,  H04W84/12 ,  H04W24/06

CPC分类号： H04B17/16 ,  B25J9/1679 ,  G05B19/41875 ,  G05B2219/32368 ,  G05B2219/37021 ,  G05B2219/37022 ,  G05B2219/37231 ,  G05B2219/37388 ,  G05B2219/37431 ,  G05B2219/37433 ,  G05B2219/37634 ,  G05B2219/40041 ,  G05B2219/45089 ,  G06F3/0346 ,  G06F11/2221 ,  H02J7/025 ,  H04B17/11 ,  H04B17/21 ,  H04B17/29 ,  H04M1/04 ,  H04M1/24 ,  H04N7/18 ,  H04W4/80 ,  H04W24/02 ,  H04W24/06 ,  H04W84/12

摘要： An automated test system for testing smart devices is presented. The system includes a system controller coupled to a smart device, wherein the system controller includes a memory with test logic and a processor. The system also includes an enclosure with a plurality of components. The plurality of components include (a) a robotic arm with a stylus, wherein the stylus is operable to manipulate the smart device to simulate human interaction therewith; (b) a platform with a device holder, wherein the device holder is operable to hold a smart device inserted therein; (c) an audio capture and generator device; and (d) a microphone. The processor is configured to automatically control the smart device and the plurality of components in accordance with the test logic.

公开(公告)号：US09948411B2

公开(公告)日：2018-04-17

申请号：US14949576

申请日：2015-11-23

申请人： w2bi, Inc.

发明人： Derek Diperna ,  Ira Leventhal ,  Keith Schaub ,  Artun Kutchuk

IPC分类号： H04B17/16 ,  G05B19/418 ,  G06F3/0346 ,  H04M1/04 ,  H04N7/18 ,  H04W4/00 ,  H04W4/02 ,  H04W24/02 ,  G06F11/22 ,  H04B17/11 ,  H04B17/21 ,  H04B17/29 ,  B25J9/16 ,  H02J7/02 ,  H04M1/24 ,  H04W84/12 ,  H04W24/06

CPC分类号： H04B17/16 ,  B25J9/1679 ,  G05B19/41875 ,  G05B2219/32368 ,  G05B2219/37021 ,  G05B2219/37022 ,  G05B2219/37231 ,  G05B2219/37388 ,  G05B2219/37431 ,  G05B2219/37433 ,  G05B2219/37634 ,  G05B2219/40041 ,  G05B2219/45089 ,  G06F3/0346 ,  G06F11/2221 ,  H02J7/025 ,  H04B17/11 ,  H04B17/21 ,  H04B17/29 ,  H04M1/04 ,  H04M1/24 ,  H04N7/18 ,  H04W4/02 ,  H04W4/80 ,  H04W24/02 ,  H04W24/06 ,  H04W84/12

摘要： An automatic system level testing (ASLT) system for testing smart devices is disclosed. The system comprises a system controller operable to be coupled with a smart device in an enclosure, wherein the system controller comprises a memory comprising test logic and a processor. The system also comprises the enclosure, wherein the enclosure comprises a plurality of components, the plurality of components comprising: (i) a robotic arm comprising a stylus, wherein the stylus is operable to manipulate the smart device to simulate human interaction therewith; and (ii) a platform comprising a device holder, wherein the device holder is operable to receive a smart device inserted there into. The processor is configured to automatically control the smart device and the plurality of components in accordance with the test logic.