摘要:
An automated test system for testing smart devices is presented. The system comprises a system controller operable to be coupled to a smart device, wherein the system controller comprises a memory comprising test logic and a processor, and also comprises an enclosure comprising a plurality of components, the plurality of components comprising: (a) a robotic arm comprising a stylus, wherein the stylus is operable to manipulate the smart device to simulate human interaction therewith; (b) a platform comprising a device holder, wherein the device holder is operable to hold a smart device inserted therein; (c) an audio capture and generator device; and (d) a microphone. The processor is configured to automatically control the smart device and the plurality of components in accordance with the test logic.
摘要:
An automatic system level testing (ASLT) system for testing smart devices is disclosed. The system comprises a system controller operable to be coupled with a smart device in an enclosure, wherein the system controller comprises a memory comprising test logic and a processor. The system also comprises the enclosure, wherein the enclosure comprises a plurality of components, the plurality of components comprising: (i) a robotic arm comprising a stylus, wherein the stylus is operable to manipulate the smart device to simulate human interaction therewith; and (ii) a platform comprising a device holder, wherein the device holder is operable to receive a smart device inserted there into. The processor is configured to automatically control the smart device and the plurality of components in accordance with the test logic.
摘要:
A method for machine measurement for an NC processing machine is provided. The processing machine has a machine head, for example, a fork head and an associated mechanical and electrical spindle changing interface for holding a motor spindle. A laser interferometer with a beam generator and a beam detector is also provided and at least one measurement optic which interacts with the laser interferometer, for example, in the form of a reflector, and laser interference measurements, which are directed at a measurement optic, in particular distance measurements, carried out for machine measurement. The laser interferometer has an interface which corresponds to the spindle changing interface, and the laser interferometer is substituted for the motor spindle via the spindle changing interface for machine measurement, and is aligned by means of the machine axes for the laser interference measurements.
摘要:
An automatic system level testing (ASLT) system for testing smart devices is disclosed. The system comprises a system controller operable to be coupled with a smart device in an enclosure, wherein the system controller comprises a memory comprising test logic and a processor. The system also comprises the enclosure, wherein the enclosure comprises a plurality of components, the plurality of components comprising: (i) a robotic arm comprising a stylus, wherein the stylus is operable to manipulate the smart device to simulate human interaction therewith; and (ii) a platform comprising a device holder, wherein the device holder is operable to receive a smart device inserted there into. The processor is configured to automatically control the smart device and the plurality of components in accordance with the test logic.
摘要:
An automated test system for testing smart devices is presented. The system includes a system controller coupled to a smart device, wherein the system controller includes a memory with test logic and a processor. The system also includes an enclosure with a plurality of components. The plurality of components include (a) a robotic arm with a stylus, wherein the stylus is operable to manipulate the smart device to simulate human interaction therewith; (b) a platform with a device holder, wherein the device holder is operable to hold a smart device inserted therein; (c) an audio capture and generator device; and (d) a microphone. The processor is configured to automatically control the smart device and the plurality of components in accordance with the test logic.
摘要:
An automatic system level testing (ASLT) system for testing smart devices is disclosed. The system comprises a system controller coupled to and operable to stress a smart device in an enclosure, wherein the enclosure comprises a plurality of components, and wherein the system controller comprises: (a) a memory comprising test logic; and (b) a processor configured to automatically control the plurality of components and test the smart device in accordance with the test logic. Further, the plurality of components comprises: (a) a robotic arm comprising a stylus affixed thereto, wherein the stylus is operable to manipulate the smart device; and (b) a platform comprising a device holder affixed thereto, wherein the device holder is operable to receive the smart device, and wherein the platform and the robotic arm are robotically controlled to move by the processor.
摘要:
An automatic system level testing (ASLT) system for testing smart devices is disclosed. The system comprises a system controller coupled to a smart device in an enclosure, wherein the system controller comprises a memory comprising test logic and a processor. The enclosure comprises a plurality of components, wherein the processor is configured to automatically control the smart device and the plurality of components in accordance with the test logic. The plurality of components comprises: (a) a robotic arm comprising a stylus affixed thereto; and (b) a platform comprising a device holder affixed thereto, wherein the smart device is inserted into the device holder; and (c) a wireless access point. The processor is further configured to: (a) control the smart device to activate wireless mode; (b) receive wireless signals from the wireless access point using the smart device; (c) retrieve wireless scan results from the smart device; and (d) analyze the wireless scan results.
摘要:
An apparatus for checking the accuracy of a circular path of a work spindle or a machine table, in particular an NC-controlled machine tool, includes a clamping element coaxial with the work spindle, a first rotary bearing disposed on the clamping element and coaxial with the rotation axis of the work spindle, a measurement arm with a first pivot bearing having a first pivot axis orthogonal to the rotation axis of the clamping element, a length measurement system disposed in measurement arm with a glass rod with a marking and a reading device, an adjusting device receiving the measurement arm and having a second pivot bearing with a pivot axis aligned parallel to the first pivot axis, a second rotary bearing having a second rotation axis aligned parallel to the rotation axis of the work spindle, and a stator supporting the second rotary bearing.
摘要:
For introducing a weakened line into a component 10, which is rigid per se and does not conform to a supporting mold or a receiving means in correspondence with the true shape, especially into an injection-molded part such as an instrument panel of an automobile, a device is provided comprising a multi-axis machine tool with a CNC-control suited for processing base-oriented programs, and a receiving means 11 for the component 10 to be processed, distance sensors 13 for the CNC-control being assigned to the receiving means to detect the actual three-dimensional position of the component.
摘要:
An automatic system level testing (ASLT) system for testing smart devices is disclosed. The system comprises a system controller operable to be coupled with a smart device in an enclosure, wherein the system controller comprises a memory comprising test logic and a processor. The system also comprises the enclosure, wherein the enclosure comprises a plurality of components, the plurality of components comprising: (i) a robotic arm comprising a stylus, wherein the stylus is operable to manipulate the smart device to simulate human interaction therewith; and (ii) a platform comprising a device holder, wherein the device holder is operable to receive a smart device inserted there into. The processor is configured to automatically control the smart device and the plurality of components in accordance with the test logic.