公开(公告)号：US07944224B2

公开(公告)日：2011-05-17

申请号：US12684272

申请日：2010-01-08

Applicant: January Kister

Inventor： January Kister

IPC: G01R31/20 ,  G01R31/067

CPC classification number: G01R1/06733

Abstract: A vertically folded probe is provided that can provide improved scrub performance in cases where the probe height is limited. More specifically, such a probe includes a base and a tip, and an arm extending from the base to the tip as a single continuous member. The probe arm is vertically folded, such that it includes three or more vertical arm portions. The vertical arm portions have substantial vertical overlap, and are laterally displaced from each other. When such a probe is vertically brought down onto a device under test, the probe deforms. During probe deformation, at least two of the vertical arm portions come into contact with each other. Such contact between the arm portions can advantageously increase the lateral scrub motion at the probe tip, and can also advantageously reduce the probe inductance.

Abstract translation: 提供垂直折叠的探针，其可以在探针高度受限的情况下提供改善的擦洗性能。 更具体地，这种探针包括基部和尖端，以及从基部到尖端作为单个连续部件延伸的臂。 探针臂垂直折叠，使得其包括三个或更多个垂直臂部分。 垂直臂部具有相当大的垂直重叠，并且彼此横向移位。 当这种探针垂直向下放置在被测设备上时，探头变形。 在探针变形期间，至少两个垂直臂部彼此接触。 臂部之间的这种接触可以有利地增加探针尖端处的横向擦洗运动，并且还可以有利地减小探针电感。

公开(公告)号：US07759949B2

公开(公告)日：2010-07-20

申请号：US11480302

申请日：2006-06-29

Applicant: January Kister

Inventor： January Kister

IPC: G01R31/28

CPC classification number: G01R1/06733 ,  G01R1/06738 ,  G01R3/00

Abstract: A probe having a conductive body and a contacting tip that is terminated by one or more blunt skates for engaging a conductive pad of a device under test (DUT) for performing electrical testing. The contacting tip has a certain width and the blunt skate is narrower than the tip width. The skate is aligned along a scrub direction and also has a certain curvature along the scrub direction such that it may undergo both a scrub motion and a self-cleaning rotation upon application of a contact force between the skate and the conductive pad. While the scrub motion clears oxide from the pad to establish electrical contact, the rotation removes debris from the skate and thus preserves a low contact resistance between the skate and the pad. The use of probes with one or more blunt skates and methods of using such self-cleaning probes are especially advantageous when testing DUTs with low-K conductive pads or other mechanically fragile pads that tend to be damaged by large contact force concentration.

Abstract translation: 一种探针，其具有导电体和接触尖端，所述接触尖端由一个或多个钝头溜冰鞋端接，用于接合待测器件（DUT）的导电焊盘，用于进行电气测试。 接触尖端具有一定的宽度，并且钝溜冰鞋比尖端宽度窄。 溜冰鞋沿着洗涤方向对准，并且沿擦洗方向也具有一定的曲率，使得它可以在施加滑板和导电垫之间的接触力的同时进行擦洗运动和自清洁旋转。 当擦洗动作从衬垫中清除氧化物以建立电接触时，旋转从溜冰鞋去除碎屑，从而保持溜冰鞋和衬垫之间的低接触电阻。 使用具有一个或多个钝头溜冰鞋的探头以及使用这种自清洁探针的方法在使用低K导电垫或其他易受大接触力浓度损伤的机械脆性垫进行测试时尤为有利。

公开(公告)号：US20100176832A1

公开(公告)日：2010-07-15

申请号：US12715896

申请日：2010-03-02

Applicant: January Kister

Inventor： January Kister

IPC: G01R31/02

CPC classification number: G01R1/07314 ,  G01R1/0675 ,  G01R1/06755 ,  G01R1/07357

Abstract: The present invention is a set of layered probes that make electrical contact to a device under test. The layered probes are disposed within openings of at least one guide plate. The guide plate surrounds the probes via the openings.

Abstract translation: 本发明是一组分层探针，其与待测器件电接触。 分层探针设置在至少一个引导板的开口内。 引导板通过开口围绕探针。

公开(公告)号：US07514948B2

公开(公告)日：2009-04-07

申请号：US11786107

申请日：2007-04-10

Applicant: January Kister

Inventor： January Kister

IPC: G01R31/02 ,  H01R4/48

CPC classification number: G01R1/07307 ,  G01R1/06733

Abstract: Improved probing of closely spaced contact pads is provided by an array of vertical probes having all of the probe tips aligned along a single contact line, while the probe bases are arranged in an array having two or more rows parallel to the contact line. With this arrangement of probes, the probe base thickness can be made greater than the contact pad spacing along the contact line, thereby advantageously increasing the lateral stiffness of the probes. The probe tip thickness is less than the contact pad spacing, so probes suitable for practicing the invention have a wide base section and a narrow tip section.

Abstract translation: 通过具有所有探针尖端沿着单个接触线对准的垂直探针的阵列提供紧密间隔的接触垫的改进的探测，而探针基底布置成平行于接触线的两行或更多行的阵列。 利用这种探针的布置，可以使探针基底厚度大于沿着接触线的接触垫间距，从而有利地增加探针的横向刚度。 探针尖端厚度小于接触垫间距，因此适用于实施本发明的探针具有宽的基部和窄的尖端部分。

公开(公告)号：US07417447B2

公开(公告)日：2008-08-26

申请号：US12009128

申请日：2008-01-15

Applicant: January Kister

Inventor： January Kister

IPC: G01R31/02

CPC classification number: G01R1/07357 ,  G01R1/07371

Abstract: Method and apparatus using a retention arrangement with a potting enclosure for holding a plurality of probes by their retention portions, the probes being of the type having contacting tips for establishing electrical contact with pads or bumps of a device under test (DUT) to perform an electrical test. The retention arrangement has a top plate with top openings for the probes, a bottom plate with bottom openings for the probes, the plates being preferably made of ceramic with laser-machined openings, and a potting enclosure between the plates for admitting a potting agent that upon curing pots the retaining portions of the probes. In some embodiments a spacer is positioned between the top and bottom plates for defining the potting enclosure. Alternatively, the retention arrangement has intermediate plates located in the potting enclosure and having probe guiding openings to guide the probes.

公开(公告)号：US07345492B2

公开(公告)日：2008-03-18

申请号：US11302650

申请日：2005-12-14

Applicant: January Kister

Inventor： January Kister

IPC: G01R31/02 ,  G01R31/28

CPC classification number: G01R1/07357 ,  G01R1/07371

Abstract: Method and apparatus using a retention arrangement with a potting enclosure for holding a plurality of probes by their retention portions, the probes being of the type having contacting tips for establishing electrical contact with pads or bumps of a device under test (DUT) to perform an electrical test. The retention arrangement has a top plate with top openings for the probes, a bottom plate with bottom openings for the probes, the plates being preferably made of ceramic with laser-machined openings, and a potting enclosure between the plates for admitting a potting agent that upon curing pots the retaining portions of the probes. In some embodiments a spacer is positioned between the top and bottom plates for defining the potting enclosure. Alternatively, the retention arrangement has intermediate plates located in the potting enclosure and having probe guiding openings to guide the probes.

Abstract translation: 使用具有用于通过其保持部分保持多个探针的封装外壳的保持装置的方法和装置，所述探针具有用于与被测器件（DUT）的焊盘或凸块建立电接触的接触尖端，以执行 电气测试。 保持装置具有顶板，其具有用于探针的顶部开口，具有用于探针的底部开口的底板，该板优选地由具有激光加工孔的陶瓷制成，并且在该板之间的灌封封套用于容纳灌封剂， 在固化罐时，探针的保持部分。 在一些实施例中，间隔件定位在顶板和底板之间，用于限定灌封罩。 或者，保持装置具有位于灌封封壳中的中间板，并且具有用于引导探针的探针引导开口。

公开(公告)号：US08907689B2

公开(公告)日：2014-12-09

申请号：US12871420

申请日：2010-08-30

Applicant: January Kister ,  Alex Shtarker

Inventor： January Kister ,  Alex Shtarker

IPC: G01R31/20 ,  G01R1/073 ,  G01R3/00

CPC classification number: G01R31/2887 ,  G01R1/0408 ,  G01R1/07314 ,  G01R1/07342 ,  G01R1/07357 ,  G01R1/07371 ,  G01R3/00 ,  Y10T29/49826

Abstract: A retention arrangement that includes one or more templates for securing and aligning probes for testing a device under test.

Abstract translation: 一种保留装置，包括一个或多个模板，用于固定和对准探头以测试被测设备。

公开(公告)号：US20120313621A1

公开(公告)日：2012-12-13

申请号：US13557879

申请日：2012-07-25

Applicant: January Kister

Inventor： January Kister

IPC: G01R1/067

CPC classification number: G01R3/00 ,  Y10T29/49158 ,  Y10T29/49163 ,  Y10T29/49208 ,  Y10T29/49213 ,  Y10T29/4922 ,  Y10T29/49222

Abstract: In assembly of probe arrays for electrical test, a problem can arise where a bonding agent undesirably wicks between probes. According to embodiments of the invention, this wicking problem is alleviated by disposing an anti-wicking agent on a surface of the probe assembly such that wicking of the bonding agent along the probes toward the probe tips is hindered. The anti-wicking agent can be a solid powder, a liquid, or a gel. Once probe assembly fabrication is complete, the anti-wicking agent is removed. In preferred embodiments, a template plate is employed to hold the probe tips in proper position during fabrication. In this manner, undesirable bending of probes caused by introduction or removal of the anti-wicking agent can be reduced or eliminated.

Abstract translation: 在用于电测试的探针阵列的组装中，可能会出现问题，其中粘结剂不期望地在探针之间吸取。 根据本发明的实施方案，通过在探针组件的表面上设置防虫剂来减轻这种芯吸问题，从而妨碍沿着探针朝向探针尖端的粘合剂的芯吸。 抗毛细作用剂可以是固体粉末，液体或凝胶。 探针组件制造完成后，除去防虫剂。 在优选的实施例中，采用模板来在制造期间将探针头保持在适当的位置。 以这种方式，可以减少或消除由引入或除去抗毛细作用剂引起的探针的不期望的弯曲。

公开(公告)号：US08230593B2

公开(公告)日：2012-07-31

申请号：US12156131

申请日：2008-05-29

Applicant: January Kister

Inventor： January Kister

IPC: H01R43/00

CPC classification number: G01R3/00 ,  Y10T29/49158 ,  Y10T29/49163 ,  Y10T29/49208 ,  Y10T29/49213 ,  Y10T29/4922 ,  Y10T29/49222

Abstract: In assembly of probe arrays for electrical test, a problem can arise where a bonding agent undesirably wicks between probes. According to embodiments of the invention, this wicking problem is alleviated by disposing an anti-wicking agent on a surface of the probe assembly such that wicking of the bonding agent along the probes toward the probe tips is hindered. The anti-wicking agent can be a solid powder, a liquid, or a gel. Once probe assembly fabrication is complete, the anti-wicking agent is removed. In preferred embodiments, a template plate is employed to hold the probe tips in proper position during fabrication. In this manner, undesirable bending of probes caused by introduction or removal of the anti-wicking agent can be reduced or eliminated.

Abstract translation: 在用于电测试的探针阵列的组装中，可能会出现问题，其中粘结剂不期望地在探针之间吸取。 根据本发明的实施方案，通过在探针组件的表面上设置防虫剂来减轻这种芯吸问题，从而妨碍沿着探针朝向探针尖端的粘合剂的芯吸。 抗毛细作用剂可以是固体粉末，液体或凝胶。 探针组件制造完成后，除去防虫剂。 在优选的实施例中，采用模板来在制造期间将探针头保持在适当的位置。 以这种方式，可以减少或消除由引入或除去抗毛细作用剂引起的探针的不期望的弯曲。

公开(公告)号：US20100182031A1

公开(公告)日：2010-07-22

申请号：US12703063

申请日：2010-02-09

Applicant: January Kister

Inventor： January Kister

IPC: G01R31/02

CPC classification number: G01R1/06761 ,  G01R1/06738 ,  G01R1/07314 ,  G01R1/07357

Abstract: The present invention is a probe for testing an electrical device under test comprising a core layer that is highly conductive.

Abstract translation: 本发明是一种用于测试被测电气装置的探针，包括具有高导电性的芯层。