公开(公告)号：US20150034606A1

公开(公告)日：2015-02-05

申请号：US14337566

申请日：2014-07-22

申请人： ROLLS-ROYCE PLC

发明人： Michael Lewis BLACKMORE

IPC分类号： B23K15/02 ,  B23K15/00

CPC分类号： B23K15/02 ,  B22F3/1055 ,  B22F2003/1057 ,  B23K15/0026 ,  B23K15/0086 ,  G01N23/203 ,  G01N2223/102 ,  G01N2223/62 ,  Y02P10/295

摘要： An additive layer manufacture machine generates a first electron beam for scanning a powder layer to be melted in a selective melting process. Backscatter electrons from the interaction between the first electron beam and the powder layer is detected by a backscatter detector. Any defects in the powder layer can then be identified, or inferred, from the detected backscatter electrons. If necessary, any defects can be removed from the powder layer before selective melting. Once the powder layer has been inspected and if necessary improved, selective melting of the layer is performed in order to produce a layer of the component. The process may be repeated to generate a finished component with good mechanical properties.

摘要翻译： 添加层制造机器在选择性熔融过程中产生用于扫描待熔融的粉末层的第一电子束。 通过反向散射检测器检测来自第一电子束和粉末层之间的相互作用的反向散射电子。 然后可以从检测到的反向散射电子中识别或推断粉末层中的任何缺陷。 如果需要，在选择性熔融之前可以从粉末层中除去任何缺陷。 一旦已经检查了粉末层，并且如果需要的话，进行该层的选择性熔融，以便产生该组分的层。 可以重复该过程以产生具有良好机械性能的成品组分。

公开(公告)号：US5272745A

公开(公告)日：1993-12-21

申请号：US882871

申请日：1992-05-14

申请人： Allan H. Smallbone

发明人： Allan H. Smallbone

IPC分类号： G01N23/223

CPC分类号： G01N23/223 ,  G01N2223/076 ,  G01N2223/206 ,  G01N2223/303 ,  G01N2223/62 ,  G01N2223/635

摘要： This invention relates to the application of on-line or inprocess elemental analysis by X-ray fluorescence spectroscopy and in particular to improvements in the field of continuously analyzing flowing dry powder samples from processes such as raw mix cement, iron ore, slag, mineral concentrates, concentrator feeds, phosphate, food products and similar materials.

摘要翻译： 本发明涉及通过X射线荧光光谱法进行在线或进程元素分析的应用，特别涉及从生混合水泥，铁矿石，矿渣，矿物精矿等工艺中连续分析流动干粉样品领域的改进 ，浓缩饲料，磷酸盐，食品和类似材料。

公开(公告)号：US20170343492A1

公开(公告)日：2017-11-30

申请号：US15479473

申请日：2017-04-05

申请人： Rigaku Corporation

发明人： Yukiko Ikeda ,  Keigo Nagao ,  Akihiro Himeda

IPC分类号： G01N23/207

CPC分类号： G01N23/207 ,  G01N2223/0566 ,  G01N2223/304 ,  G01N2223/401 ,  G01N2223/605 ,  G01N2223/606 ,  G01N2223/62

摘要： A crystalline phase contained in a sample is identified, from X-ray diffraction data of the sample which contain data of a plurality of ring-shaped diffraction patterns, using a database in which are registered data related to peak positions and peak intensity ratios of X-ray diffraction patterns for a plurality of crystalline phases. Peak positions and peak intensities for a plurality of the diffraction patterns are detected from the X-ray diffraction data (step 102), and the circumferential angle versus intensity data of the diffraction patterns is created (step 103). The diffraction patterns are grouped into a plurality of clusters on the basis of the circumferential angle versus intensity data (step 105). Crystalline phase candidates contained in the sample are searched from the database on the basis of sets of ratios of peak positions and peak intensities of the diffraction patterns grouped into the same cluster (step 106).

公开(公告)号：US20060015265A1

公开(公告)日：2006-01-19

申请号：US09947153

申请日：2001-09-05

申请人： Anne Raich

发明人： Anne Raich

IPC分类号： G06F19/00

CPC分类号： G01N23/20 ,  G01N2223/62 ,  G16C20/20 ,  G16C20/70

摘要： A method to rapidly identify multiple X-ray powder diffraction patterns, such as those generated through combinatorial chemistry, has been developed. More particularly, the method is directed toward measuring X-ray powder diffraction patterns of a set of materials and applying hierarchical clustering analysis to determine clusters of X-ray powder diffraction patterns that are similar. A search-match algorithm is applied to the X-ray powder diffraction patterns within a cluster to determine the several most likely structural identities of the materials forming the cluster, and correspondence factor analysis is applied to the multiple sets of possible identities to establish the most likely structural identity of all the members of the cluster.

摘要翻译： 已经开发了快速鉴定多个X射线粉末衍射图案的方法，例如通过组合化学产生的衍射图案。 更具体地，该方法旨在测量一组材料的X射线粉末衍射图案并应用层次聚类分析来确定类似的X射线粉末衍射图案的簇。 将搜索匹配算法应用于群集中的X射线粉末衍射图，以确定形成簇的材料的几种最可能的结构身份，并将对应因子分析应用于多组可能身份以建立最多 群集的所有成员可能具有结构身份。

公开(公告)号：US20180292334A1

公开(公告)日：2018-10-11

申请号：US15479335

申请日：2017-04-05

申请人： Bruker AXS, Inc.

发明人： Bob Baoping HE

IPC分类号： G01N23/207

CPC分类号： G01N23/207 ,  G01N2223/056 ,  G01N2223/1016 ,  G01N2223/33 ,  G01N2223/62

摘要： A method and apparatus for performing an X-ray diffraction measurement with a diffractometer having an X-ray beam directed at a sample and a two-dimensional X-ray detector includes the performance of a physical scan during which the detector is moved through a scanning range in an angular direction about the sample position. To provide a uniform exposure time, the detector, when located at an extreme of the scanning range, is controlled to progressively change the portion of the detected X-ray energy that is used at a rate that maintains a uniform exposure time for each angular position in the scanning range. Alternatively, when located at an extreme of the range, the detector is kept stationary until a desired minimum exposure time is obtained for each angular position, after which the collected diffraction data is normalized relative to exposure time.

公开(公告)号：US20130044864A1

公开(公告)日：2013-02-21

申请号：US13570453

申请日：2012-08-09

申请人： Yun Wang ,  Hisamitu Hatou ,  Toshikazu Kikuchi

发明人： Yun Wang ,  Hisamitu Hatou ,  Toshikazu Kikuchi

IPC分类号： G01N23/207

CPC分类号： G01N23/20008 ,  G01L1/25 ,  G01L5/0047 ,  G01N2223/62

摘要： There is provided an X-ray diffraction instrument including: a two-dimensional plate-like X-ray detector; an X-ray emitter integrated with the X-ray detector so as to penetrate the plate of the X-ray detector; a cylinder-like shield to define an orientation of the X-ray emitter and to prevent X-ray leakage, the X-ray detector being attached to one open end of the cylinder-like shield; and a standard powder attachment device to attach a standard powder for X-ray diffraction measurement to a surface of an object to be measured. The X-ray diffraction instrument can perform an X-ray diffraction measurement to an object larger than the X-ray detector thereof. The invented X-ray diffraction instrument is small in size, and can perform accurate X-ray diffraction measurement of stationary immovable objects without limitation on an orientation of the measurement surface. In addition, X-ray leakage is prevented for operator safety.

摘要翻译： 提供了一种X射线衍射仪器，包括：二维板状X射线检测器; 与X射线检测器集成的X射线发射器，以穿透X射线检测器的板; 用于限定X射线发射器的取向并防止X射线泄漏的圆筒状屏蔽，X射线检测器附接到圆柱状屏蔽的一个开口端; 以及将用于X射线衍射测量的标准粉末附着到待测量物体的表面的标准粉末附着装置。 X射线衍射仪可以对大于其X射线检测器的物体进行X射线衍射测量。 本发明的X射线衍射仪的尺寸小，可以对固定不动物进行精确的X射线衍射测量，而不会限制测量面的取向。 另外，为了操作者的安全，防止了X射线泄漏。

公开(公告)号：US20180348150A1

公开(公告)日：2018-12-06

申请号：US15608533

申请日：2017-05-30

申请人： MALVERN PANALYTICAL B.V.

发明人： Bruno Alfred Robert VREBOS ,  Dick KUIPER ,  Saskia Maria Angela BEERKENS

IPC分类号： G01N23/223 ,  G01N23/22 ,  G01N23/207

CPC分类号： G01N23/223 ,  G01N33/383 ,  G01N2223/076 ,  G01N2223/312 ,  G01N2223/62

摘要： A method of quantitative X-ray analysis includes capturing X-ray fluorescence data from a pressed powder sample including a binder. A quantity and/or distribution of binder is assumed and the concentration of various components of the sample is calculated from the measured data and the assumed quantity of binder. Then, the concentration of binder is adjusted and the calculation step repeated until the method converges. The method is allowed to take widely different values of quantity of binder, which may be the concentration of the binder in the sample or alternatively the thickness of an assumed thin layer at the surface of a model used for calculation.

公开(公告)号：US08923480B2

公开(公告)日：2014-12-30

申请号：US13570453

申请日：2012-08-09

申请人： Yun Wang ,  Hisamitu Hatou ,  Toshikazu Kikuchi

发明人： Yun Wang ,  Hisamitu Hatou ,  Toshikazu Kikuchi

IPC分类号： G01N23/20 ,  G01L5/00 ,  G01L1/25

CPC分类号： G01N23/20008 ,  G01L1/25 ,  G01L5/0047 ,  G01N2223/62

摘要： There is provided an X-ray diffraction instrument including: a two-dimensional plate-like X-ray detector; an X-ray emitter integrated with the X-ray detector so as to penetrate the plate of the X-ray detector; a cylinder-like shield to define an orientation of the X-ray emitter and to prevent X-ray leakage, the X-ray detector being attached to one open end of the cylinder-like shield; and a standard powder attachment device to attach a standard powder for X-ray diffraction measurement to a surface of an object to be measured. The X-ray diffraction instrument can perform an X-ray diffraction measurement to an object larger than the X-ray detector thereof. The invented X-ray diffraction instrument is small in size, and can perform accurate X-ray diffraction measurement of stationary immovable objects without limitation on an orientation of the measurement surface. In addition, X-ray leakage is prevented for operator safety.

摘要翻译： 提供了一种X射线衍射仪器，包括：二维板状X射线检测器; 与X射线检测器集成的X射线发射器，以穿透X射线检测器的板; 用于限定X射线发射器的取向并防止X射线泄漏的圆筒状屏蔽，X射线检测器附接到圆柱状屏蔽的一个开口端; 以及将用于X射线衍射测量的标准粉末附着到待测量物体的表面的标准粉末附着装置。 X射线衍射仪可以对大于其X射线检测器的物体进行X射线衍射测量。 本发明的X射线衍射仪的尺寸小，可以对固定不动物进行精确的X射线衍射测量，而不会限制测量面的取向。 另外，为了操作者的安全，防止了X射线泄漏。