Thermal wave microscopy using areal infrared detection
    1.
    发明授权
    Thermal wave microscopy using areal infrared detection 失效
    热波显微镜使用面红外探测

    公开(公告)号:US4578584A

    公开(公告)日:1986-03-25

    申请号:US573075

    申请日:1984-01-23

    摘要: A non-contact thermal imaging system based on infrared radiation detection is described which uses an energy source to provide a beam of energy that strikes a sample to be analyzed. The energy beam produces a thermal wave in the sample, there being infrared radiation emitted from the thermal wave. All of the infrared radiation emitted from the heated area of the sample is collected and directed to an infrared detector, to have a two-dimensional image of the sample. This is used to detect surface and sub-surface structure, defects, etc. The use of a focussed energy beam, such as a laser or electron beam, offers advantages. In this technique, all points of the sample are treated equally and the results are very easily interpreted to know the exact location and type of structure that is imaged in the heated area. An ellipsoidal collector is preferrably used to image the emitted infrared radiation onto the detector, where the sample is located at one focal point of the ellipse, and the detector is located at the other focal point.

    摘要翻译: 描述了基于红外辐射检测的非接触热成像系统,其使用能量源来提供撞击要分析的样品的能量束。 能量束在样品中产生热波,存在从热波发射的红外辐射。 将从样品的加热区域发射的所有红外线辐射收集并引导到红外检测器,以获得样品的二维图像。 这用于检测表面和亚表面结构,缺陷等。使用诸如激光或电子束的聚焦能量束提供了优点。 在这种技术中,样品的所有点被平等对待,结果很容易被解释为知道在加热区域中成像的结构的确切位置和类型。 椭圆形收集器优选用于将发射的红外辐射图像到检测器上,其中样品位于椭圆的一个焦点处,并且检测器位于另一焦点。

    Analyzing apparatus and calibration method
    2.
    发明授权
    Analyzing apparatus and calibration method 有权
    分析仪器和校准方法

    公开(公告)号:US09594037B2

    公开(公告)日:2017-03-14

    申请号:US14715812

    申请日:2015-05-19

    申请人: HORIBA, LTD.

    摘要: In an analyzing apparatus for analyzing compositions using a fluorescent X-ray in the atmosphere, a calibration to eliminate influences caused by a time-dependent change is performed. The analyzing apparatus includes an emission unit, a detection unit, an environment measurement unit, and a time-dependent change calculation unit. The emission unit emits a primary X-ray. The detection unit detects an intensity of a secondary X-ray passing through the atmosphere. The environment measurement unit measures an environment parameter defining the atmosphere. The time-dependent change calculation unit calculates a time-dependent change of the intensity of the secondary X-ray between a first timing and a second timing, based on a first environment parameter, a first intensity of the secondary X-ray, a second environment parameter, and a second intensity of the secondary X-ray.

    摘要翻译: 在用于分析大气中的荧光X射线成分的分析装置中,进行用于消除由时间依赖性变化引起的影响的校准。 分析装置包括发射单元,检测单元,环境测量单元和时间变化计算单元。 发射单元发射主X射线。 检测单元检测通过大气的次级X射线的强度。 环境测量单元测量定义大气的环境参数。 时间依赖变化计算单元基于第一环境参数,次X射线的第一强度,第二次X射线的第二强度来计算第一定时和第二定时之间的次X射线的强度的时间依赖性变化 环境参数和次要X射线的第二强度。

    ANALYZING APPARATUS AND CALIBRATION METHOD
    3.
    发明申请
    ANALYZING APPARATUS AND CALIBRATION METHOD 有权
    分析装置和校准方法

    公开(公告)号:US20150338357A1

    公开(公告)日:2015-11-26

    申请号:US14715812

    申请日:2015-05-19

    申请人: HORIBA, LTD.

    IPC分类号: G01N23/223 G01T7/04 G01T7/00

    摘要: In an analyzing apparatus for analyzing compositions using a fluorescent X-ray in the atmosphere, a calibration to eliminate influences caused by a time-dependent change is performed. The analyzing apparatus includes an emission unit, a detection unit, an environment measurement unit, and a time-dependent change calculation unit. The emission unit emits a primary X-ray. The detection unit detects an intensity of a secondary X-ray passing through the atmosphere. The environment measurement unit measures an environment parameter defining the atmosphere. The time-dependent change calculation unit calculates a time-dependent change of the intensity of the secondary X-ray between a first timing and a second timing, based on a first environment parameter, a first intensity of the secondary X-ray, a second environment parameter, and a second intensity of the secondary X-ray.

    摘要翻译: 在用于分析大气中的荧光X射线成分的分析装置中,进行用于消除由时间依赖性变化引起的影响的校准。 分析装置包括发射单元,检测单元,环境测量单元和时间变化计算单元。 发射单元发射主X射线。 检测单元检测通过大气的次级X射线的强度。 环境测量单元测量定义大气的环境参数。 时间依赖变化计算单元基于第一环境参数,次X射线的第一强度,第二次X射线的第二强度来计算第一定时和第二定时之间的次X射线的强度的时间依赖性变化 环境参数和次要X射线的第二强度。