摘要:
A method is provided for centrally monitoring machines running at remote customer sites and providing customers with adequate support. The method includes collecting machine operating data, including data for each process stage, at the customer sites, and analyzing, at a central location, the collected machine operating data for each machine. Subsequently, a solution based upon the analysis is proposed to the customer for each of the machines, and the solution is then implemented. The method also includes continuously collecting data to check effectiveness of the installed machines and to verify the solution works.
摘要:
A method (300, 400, 500, 1200) for offline/online monitoring of batch processes. The method involves (312) decomposing a time domain of a batch process run (BPR) into several blocks and (334) building multivariate statistical models (MSMs) for each of them using archived data for a batch process (ABPD). ABPD comprises stored data obtained during BPRs. The method also involves (506, 1204) retrieving recently stored data (RSD) for a recent fully performed BPR run (FPRNEW) or current BPR run. The method further involves (520, 1210) building a feature vector matrix (FVM) using RSD. FVM contains feature vectors representing statistical measures of wavelet coefficients determined for variables (v0, . . . , vJ). A projection (1100, 1150, 1190) is formed by projecting feature vectors onto at least one MSM or a combined multivariate statistical model (CMSM). CMSM is a weighted average of at least two MSMs. Subsequently, at least one estimate is generated for FPRNEW or current BPR run using information provided by the projection (528, 1220).
摘要:
A method (300, 400, 500, 1200) for offline/online monitoring of batch processes. The method involves (312) decomposing a time domain of a batch process run (BPR) into several blocks and (334) building multivariate statistical models (MSMs) for each of them using archived data for a batch process (ABPD). ABPD comprises stored data obtained during BPRs. The method also involves (506, 1204) retrieving recently stored data (RSD) for a recent fully performed BPR run (FPRNEW) or current BPR run. The method further involves (520, 1210) building a feature vector matrix (FVM) using RSD. FVM contains feature vectors representing statistical measures of wavelet coefficients determined for variables (v0, . . . , vJ). A projection (1100, 1150, 1190) is formed by projecting feature vectors onto at least one MSM or a combined multivariate statistical model (CMSM). CMSM is a weighted average of at least two MSMs. Subsequently, at least one estimate is generated for FPRNEW or current BPR run using information provided by the projection (528, 1220).
摘要:
A method is provided for centrally monitoring machines running at remote customer sites and providing customers with adequate support. The method includes collecting machine operating data, including data for each process stage, at the customer sites, and analyzing, at a central location, the collected machine operating data for each machine. Subsequently, a solution based upon the analysis is proposed to the customer for each of the machines, and the solution is then implemented. The method also includes continuously collecting data to check effectiveness of the installed machines and to verify the solution works.
摘要:
A method is provided for centrally monitoring machines running at remote customer sites and providing customers with adequate support. The method includes collecting machine operating data, including data for each process stage, at the customer sites, and analyzing, at a central location, the collected machine operating data for each machine. Subsequently, a solution based upon the analysis is proposed to the customer for each of the machines, and the solution is then implemented. The method also includes continuously collecting data to check effectiveness of the installed machines and to verify the solution works.
摘要:
A method is provided for centrally monitoring machines running at remote customer sites and providing customers with adequate support. The method includes collecting machine operating data, including data for each process stage, at the customer sites, and analyzing, at a central location, the collected machine operating data for each machine. Subsequently, a solution based upon the analysis is proposed to the customer for each of the machines, and the solution is then implemented. The method also includes continuously collecting data to check effectiveness of the installed machines and to verify the solution works.
摘要:
The use of an intensity spectrum as a fingerprint to determine the layer structure of a semiconductor wafer product or partial product, thereby to determine the routing history of the product through a production line and prevent routing errors. Also, a production line having a plurality of successive stages for construction of a product such as a semiconductor wafer, and routers for transferring partly constructed product between the stages such that each stage receives a respective predefined partly constructed product as its input. The production line comprises: a predetermined intensity spectrum for at least one stage representing the respective part construction for the stage, an intensity spectrum deriver located at said at least one stage operable to obtain intensity spectra of incoming partly constructed product, and a comparator, for comparing said obtained intensity spectra with said predetermined intensity spectrum, to determine whether said incoming partly constructed products correspond with said respective predefined part construction for the stage.
摘要:
This industrial system is characterized by being provided with: a storage unit that stores design data used when constructing an industrial line; a simulation execution unit that executes a simulation of movement of the industrial line, based on the design data; and a detection unit that compares a result of the simulation with the movement of the industrial line during operation and detects an abnormality in components of the industrial line. With such a configuration and movement, the present invention can be utilized for line operation support and high-resolution abnormality detection.
摘要:
An analysis application utilizes several quantitative metrics that characterize a controller's performance with respect to: specification limits, extreme values, and target and trend versus time. The application utilizes the metrics to provide statistical p-values.
摘要:
The use of an intensity spectrum as a fingerprint to determine the layer structure of a semiconductor wafer product or partial product, thereby to determine the routing history of the product through a production line and prevent routing errors. Also, a production line having a plurality of successive stages for construction of a product such as a semiconductor wafer, and routers for transferring partly constructed product between the stages such that each stage receives a respective predefined partly constructed product as its input. The production line comprises: a predetermined intensity spectrum for at least one stage representing the respective part construction for the stage, an intensity spectrum deriver located at said at least one stage operable to obtain intensity spectra of incoming partly constructed product, and a comparator, for comparing said obtained intensity spectra with said predetermined intensity spectrum, to determine whether said incoming partly constructed products correspond with said respective predefined part construction for the stage.