Semiconductor device with contact check circuitry

    公开(公告)号:US11892521B2

    公开(公告)日:2024-02-06

    申请号:US17406121

    申请日:2021-08-19

    发明人: Tse-Hua Yao

    摘要: A semiconductor device with contact check circuitry is provided. The semiconductor device includes a plurality of pads, an internal circuit, and a contact check circuit. The plurality of pads includes a first pad and a second pad. The internal circuit is coupled to the plurality of pads. The contact check circuit, at least coupled to the first pad and the second pad, is used for checking, when the semiconductor device is under test, contact connections to the first pad and the second pad to generate a check result signal according to comparison of a first test signal and a second test signal received from the first pad and the second pad with at least one reference signal.

    System and method for detecting application of grounding pad for ablation devices

    公开(公告)号:US11617619B2

    公开(公告)日:2023-04-04

    申请号:US17089325

    申请日:2020-11-04

    摘要: Disclosed herein is an RF ablation system including a plurality of electrodes, a ground pad, and a signal generator. The electrodes are positioned at respective tissue sites within a patient's body, and the ground pad is positioned on the patient's body. The signal generator is coupled to the ground pad and the electrodes via corresponding channels including a selected channel and unselected channels. The signal generator commutates switching circuits for the corresponding channels to close the selected channel and to open the unselected channels, and measures a first impedance over the selected channel. The signal generator commutates the switching circuits to close the selected channel and the unselected channels, and then measures a second impedance. The signal generator computes a difference between the first and second impedances, and determines the ground pad has at least a poor electrical connection to the patient's body when the difference exceeds a threshold.

    Socket monitoring
    4.
    发明授权

    公开(公告)号:US11435412B2

    公开(公告)日:2022-09-06

    申请号:US16899212

    申请日:2020-06-11

    摘要: This applications relates to methods and apparatus for monitoring a socket (101), to detect a connection status of a mating plug (102), e.g. for monitoring an audio jack socket for connection of an audio jack plug. A monitor (115, 305) is configured to monitor a voltage (VM) at a monitoring node (114), which is coupled to a jack detect contact (112) of the socket and a voltage pull-up element (113). The voltage (VM) at the monitoring node (114) is monitored against a threshold (Vthv) and a threshold module (302) is configured to vary the threshold depending on an indication of signal activity (SACT) of a signal path for a first socket contact (103) which will be electrically connected to the jack detect contact when a plug when inserted in the socket.

    Test coverage rate improvement system for pins of tested circuit board and method thereof

    公开(公告)号:US11435400B1

    公开(公告)日:2022-09-06

    申请号:US17357429

    申请日:2021-06-24

    摘要: A test coverage rate improvement system for pins of tested circuit board and a method thereof are disclosed. In the system, partial pins of a circuit board connector in a tested circuit board are not electrically connected to the boundary scan chip, test pins of the test pin board are pressed with the partial pins by a fixture of a boundary scan interconnect testing workstation to electrically connect the test pins to the partial pins. A test access port controller receives a detection signal for detecting the partial pins, which are not electrically connected to the boundary scan chip, of the circuit board connector through the test pin board from the test adapter card, and determines whether conduction is formed based on the detection signal, thereby achieving the technical effect of improving a test coverage rate for the pins of the tested circuit board.

    Testing device
    6.
    发明授权

    公开(公告)号:US11372059B2

    公开(公告)日:2022-06-28

    申请号:US17002963

    申请日:2020-08-26

    IPC分类号: G01R31/68 G01R1/02

    摘要: The present disclosure relates to a testing device comprising a bracket including a first groove and a second groove parallel to each other, wherein the first groove and the second groove run through an inner surface of the bracket perpendicularly to a thickness direction of the testing device; a plate assembly including a first plate and a second plate parallel to each other, wherein the first plate is disposed within the first groove and fits closely within the first groove along a length direction and a thickness direction of the testing device, the second plate is disposed within the second groove, with a gap present in the second groove along a length direction and/or a thickness direction of the testing device; a connector array including a plurality of connector assemblies disposed on the plate assembly in a predetermined pattern, wherein each of the plurality of connector assemblies is connected between the first plate and the second plate; and a displacing tool disposed on the bracket and/or the plate assembly and configured to displace the second plate relative to the first plate within the second groove along a length direction and/or a thickness direction of the testing device. The testing device may simulate various different axial deviations and/or angular deviations of the opposed printed circuit boards, and may be used to test the performance parameters such as low PIM, return loss and insertion loss between the printed circuit boards and the connectors under different axial deviations and/or angular deviations.

    TECHNOLOGIES FOR A SMART ELECTRICAL OUTLET AND A SMART ELECTRICAL CORD

    公开(公告)号:US20220149571A1

    公开(公告)日:2022-05-12

    申请号:US17094477

    申请日:2020-11-10

    申请人: Grid Connect Inc.

    摘要: A device for providing a connection to electrical energy, the device includes an electrical outlet with at least one receptacle, a control circuit and functionality to generate one or more electrical pulses to indicate whether there is an insertion, or a lack of an insertion, into the at least one electrical receptacle. The device can be an in-wall electrical outlet and/or a power-cord based electrical outlet. The device includes a capacitive touch array comprising a plurality of capacitive touch buttons. The capacitive touch buttons control a plurality of function of the at least one receptacle, based on at least a user interaction with the plurality of capacitive touch buttons. The device may also monitor, display and/or transmit a plurality of electrical usage data related to a device powered by the electrical outlet. The functionality of the outlet may also be provided as part of a power cord coupled to a device and inserted into an electrical outlet.

    SYSTEM AND METHOD FOR DETECTING APPLICATION OF GROUNDING PAD FOR ABLATION DEVICES

    公开(公告)号:US20220133406A1

    公开(公告)日:2022-05-05

    申请号:US17089325

    申请日:2020-11-04

    IPC分类号: A61B18/16 G01R31/68

    摘要: Disclosed herein is an RF ablation system including a plurality of electrodes, a ground pad, and a signal generator. The electrodes are positioned at respective tissue sites within a patient's body, and the ground pad is positioned on the patient's body. The signal generator is coupled to the ground pad and the electrodes via corresponding channels including a selected channel and unselected channels. The signal generator commutates switching circuits for the corresponding channels to close the selected channel and to open the unselected channels, and measures a first impedance over the selected channel. The signal generator commutates the switching circuits to close the selected channel and the unselected channels, and then measures a second impedance. The signal generator computes a difference between the first and second impedances, and determines the ground pad has at least a poor electrical connection to the patient's body when the difference exceeds a threshold.

    Testing device for determining electrical connection status

    公开(公告)号:US11300636B2

    公开(公告)日:2022-04-12

    申请号:US17080908

    申请日:2020-10-27

    发明人: Jian-Yu Ciou

    IPC分类号: G01R31/30 G01R31/68

    摘要: A testing device includes a measuring unit, a testing board supporting the measuring unit and connected to the measuring unit, and a connecting interface coupled to the testing board. The connecting interface includes connecting terminals protruding in a direction away from the testing board, and is connected to a device under test (DUT) via the connecting terminals. When the DUT is connected to the connecting interface, the measuring unit supplies a constant electric current via the testing board and the connecting interface to the DUT for a preset duration to result in a voltage, measures the voltage, and determines, based on a result of measurement of the voltage, an electrical connection status of the DUT.

    CONNECTION DETECTOR AND SEMICONDUCTOR DEVICE

    公开(公告)号:US20210364578A1

    公开(公告)日:2021-11-25

    申请号:US17318592

    申请日:2021-05-12

    发明人: Tomoya NISHITANI

    IPC分类号: G01R31/68 G06F13/42

    摘要: A connection detector includes: a power supply line for use in supply of a power supply potential; a CC terminal; a ground terminal; an electric-current output circuit arranged between the power supply line and the CC terminal and including a first switch for use in disabling an electric-current output; a pulldown resistor circuit arranged between the CC terminal and the ground terminal and including a second switch for use in disabling a pulldown resistance; a bias circuit configured to generate a first reference potential and a second reference potential that is different from the first reference potential; and a role detector including a first comparator configured to compare the first reference potential with a voltage of the CC terminal and a second comparator configured to compare the second reference potential with a voltage of the CC terminal.