公开(公告)号：US06683300B2

公开(公告)日：2004-01-27

申请号：US09953403

申请日：2001-09-17

申请人： Vladimir M. Doroshenko ,  Victor V. Laiko ,  Mikhail Yakshin ,  Coorg R. Prasad ,  Hyo Sang Lee

发明人： Vladimir M. Doroshenko ,  Victor V. Laiko ,  Mikhail Yakshin ,  Coorg R. Prasad ,  Hyo Sang Lee

IPC分类号： H01J4916

CPC分类号： H01J49/04

摘要： A method, system, and apparatus for mass spectroscopic analysis of an analyte solution in which a liquid volume of the analyte solution is irradiated with a light source resulting in desorption of solution-specific ions into a surrounding gas to produce gas-phase ions, the gas-phase ions are transferred to an inlet port of a mass analyzer, and the gas-phase ions are mass analyzed. More specifically, the apparatus may include a laser configured to pulse irradiate a surface of the analyte solution, a mass spectrometer configured to mass-analyze the gas-phase ions according to the mass-to-charge ratio, and a transfer mechanism configured to transfer the gas-phase ions to an inlet port of the mass spectrometer.

摘要翻译： 分析物溶液的质谱分析的方法，系统和装置，其中用光源照射分析物溶液的液体体积，导致溶液特异性离子解吸到周围气体中以产生气相离子， 将气相离子转移到质量分析器的入口，并对气相离子进行质量分析。 更具体地，该装置可以包括被配置为脉冲照射分析物溶液的表面的激光器，配置成根据质荷比对气相离子进行质量分析的质谱仪，以及被配置为转移 气相离子到质谱仪的入口。

公开(公告)号：US06479814B2

公开(公告)日：2002-11-12

申请号：US09814799

申请日：2001-03-23

申请人： Yoshiro Shiokawa ,  Megumi Nakamura ,  Toshihiro Fujii

发明人： Yoshiro Shiokawa ,  Megumi Nakamura ,  Toshihiro Fujii

IPC分类号： H01J4916

CPC分类号： H01J49/04

摘要： An ion source of an ion attachment mass spectrometry apparatus has an emitter and a voltage-impressed portion for impressing a bias voltage to the emitter. In the ion source, the emitter is heated to emit positive charge metal ions that are attached to a detected gas to ionize it. By changing the material of the emitter, the electrical resistance between the ion emission point of the emitter and the reference-voltage-impressed portion of the voltage-impressed portion is reduced. By shortening the distance between the reference-voltage-impressed portion and the ion emission point, the electrical resistance between the ion emission point of the emitter and the reference-voltage-impressed portion of the voltage-impressed portion is reduced to not more than 1010&OHgr;. It is also possible to form a thin film emitter on the surface of the reference-voltage-impressed portion. Due to this, it is possible to suppress the occurrence of fluctuations in the potential difference between the ion emitter and the reference-voltage-impressed portion, stabilize the amount of ion emission, and analyze the mass with a high accuracy.

摘要翻译： 离子附着质谱装置的离子源具有用于向偏置电压施加偏压的发射极和电压施加部。 在离子源中，发射体被加热以发射附着于被检测气体的正电荷金属离子以使其离子化。 通过改变发射极的材料，发射极的离子发射点与电压压入部分的基准电压压入部分之间的电阻降低。 通过缩短参考电压施加部分和离子发射点之间的距离，发射极的离子发射点和电压施加部分的基准电压施加部分之间的电阻降低到不大于1010OMEGA 。 也可以在基准电压施加部分的表面上形成薄膜发射极。 由此，可以抑制离子发射体与基准电压印制部之间的电位差的波动的发生，稳定离子发射量，并且高精度地分析质量。

公开(公告)号：US06294780B1

公开(公告)日：2001-09-25

申请号：US09285806

申请日：1999-04-01

申请人： Gregory J. Wells ,  Peter P. Yee ,  Marvin A. Ruport ,  Charles K. Huston

发明人： Gregory J. Wells ,  Peter P. Yee ,  Marvin A. Ruport ,  Charles K. Huston

IPC分类号： H01J4916

CPC分类号： H01J49/147

摘要： An ion source for use with an ion trap mass spectrometer. The ion source includes an electron source which produces a stream of electrons. The electrons are injected into an ionization chamber by the action of a repeller plate and electron lens. Inside the ionization chamber, the electrons interact with a gas-phase sample to produce sample ions through the electron ionization process, or with a reagent gas to form reagent ions as part of a chemical ionization process. The sample ions produced are extracted from the ionization chamber by the action of an ion repeller and an ion lens. The potentials on the electron repeller and lens, and ion repeller and lens are controlled to direct the electron stream away from the ionization chamber or to direct the sample ion beam away from an ion trap at the appropriate times during measurement of the sample ions.

摘要翻译： 用于离子阱质谱仪的离子源。 离子源包括产生电子流的电子源。 电子通过反转板和电子透镜的作用注入电离室。 在电离室内部，电子与气相样品相互作用，通过电子离子化过程产生样品离子，或者与反应气体形成试剂离子，作为化学电离过程的一部分。 所产生的样品离子通过离子斥力器和离子透镜的作用从电离室中提取。 控制电子排斥器和透镜以及离子斥力器和透镜的电位以将电子流引导离开电离室，或者在样品离子测量期间的适当时间将样品离子束引导离开离子阱。

公开(公告)号：US06803569B2

公开(公告)日：2004-10-12

申请号：US10397634

申请日：2003-03-26

申请人： Youri O. Tsybin ,  Gökhan Baykut

发明人： Youri O. Tsybin ,  Gökhan Baykut

IPC分类号： H01J4916

CPC分类号： H01J49/38 ,  H01J49/0054 ,  H01J49/0059

摘要： The present invention relates to a method and a device for irradiating ions in a ion cyclotron resonance (ICR) trap with photons and/or electrons. For electron irradiation a hollow electron emitter is used, through the hole of which a light beam can be sent into the ICR trap. The emitter generates a hollow, tubular electron beam. In a special application low energy ions within the tubular electron beam are irradiated with photons. The ions can be cyclotron-excited mass selectively, by which they enter the electron beam and interact with electrons.

摘要翻译： 本发明涉及用光子和/或电子在离子回旋共振（ICR）阱中照射离子的方法和装置。 对于电子照射，使用中空电子发射器，通过其中可以将光束发射到ICR阱中的孔。 发射器产生中空的管状电子束。 在特殊应用中，用光子照射管状电子束内的低能量离子。 离子可以选择性地回旋激发质量，通过它们进入电子束并与电子相互作用。

公开(公告)号：US06683301B2

公开(公告)日：2004-01-27

申请号：US10056671

申请日：2002-01-25

申请人： Craig Whitehouse ,  David G. Welkie

发明人： Craig Whitehouse ,  David G. Welkie

IPC分类号： H01J4916

CPC分类号： H01J49/40 ,  B82Y30/00 ,  H01J49/0068

摘要： A Time-Of-Flight mass spectrometer is configured with a pulsing region and electronic controls that generate a potential well for ions in the pulsing region, due to the repelling effect of a high-frequency electric field that is created in the space immediately proximate to a surface, and an additional static electric field that accelerates ions toward the surface. Ions can be constrained and accumulated over time in the potential well prior to acceleration into the Time-Of-Flight tube for mass analysis. Ions can also be directed to collide with the surface with high energy to cause Surface Induced Dissociation (SID) fragmentation, or with low energy to effect collisional cooling, hence, better spatial focusing, prior to mass analysis. The apparatus and methods described in the invention result in refined control of ion fragmentation energy and improved Time-Of-Flight mass analysis performance.

摘要翻译： 飞行时间质谱仪配置有脉冲区域和电子控制器，由于在紧邻的空间中产生的高频电场的排斥效应，脉冲区域中的离子产生潜在的阱 一个表面和一个额外的静电场，可以将离子加速到表面。 在加速进入飞行时间管以进行质量分析之前，离子可以在潜在的时间内受到约束和积累。 离子也可以被引导与高能量的表面碰撞以引起表面诱导解离（SID）碎裂，或者以低能量来实现碰撞冷却，因此在质量分析之前更好地进行空间聚焦。 本发明描述的装置和方法可以精确控制离子碎片能量和改进的飞行时间质量分析性能。

公开(公告)号：US06621074B1

公开(公告)日：2003-09-16

申请号：US10198372

申请日：2002-07-18

申请人： Marvin L. Vestal

发明人： Marvin L. Vestal

IPC分类号： H01J4916

CPC分类号： H01J49/40 ,  H01J49/004

摘要： A tandem time-of-flight mass spectrometer is described. The tandem time-of-flight mass spectrometer includes a pulsed ion source that generates a plurality of ions. A first time-of-flight mass separator accelerates the plurality of ions, fragments at least a portion of the accelerated plurality of ions, and then selects a first group of ions and fragments thereof. A second time-of-flight mass separator accelerates the first group of ions and fragments thereof, fragments at least a portion of the accelerated first group of ions and fragments thereof, and then selects a second group of ions and fragments thereof. A third time-of-flight mass separator accelerates the second group of ions and fragments thereof. An ion detector detects the second group of ions and fragments thereof from the third time-of-flight mass separator.

摘要翻译： 描述了串联飞行时间质谱仪。 串联飞行时间质谱仪包括产生多个离子的脉冲离子源。 第一飞行时间质量分离器加速多个离子，碎片加速的多个离子的至少一部分，然后选择第一组离子及其片段。 第二飞行时间质量分离器加速第一组离子及其片段，将加速的第一组离子及其片段的至少一部分分段，然后选择第二组离子及其片段。 第三次飞行时间质量分离器加速第二组离子及其碎片。 离子检测器检测来自第三飞行时间质量分离器的第二组离子及其片段。

公开(公告)号：US06600155B1

公开(公告)日：2003-07-29

申请号：US09807796

申请日：2001-09-06

申请人： Bruce A. Andrien, Jr. ,  Michael A. Sansone ,  Allan G. Burt ,  Craig M. Whitehouse

发明人： Bruce A. Andrien, Jr. ,  Michael A. Sansone ,  Allan G. Burt ,  Craig M. Whitehouse

IPC分类号： H01J4916

CPC分类号： H01J49/40 ,  B82Y15/00 ,  B82Y30/00 ,  H01J49/0068

摘要： A Time-Of-Flight mass spectrometer (1) is configured with a pulsing region (10) and electronic controls to cause the directing of ions to a surface (12) in the Time-Of-Flight pulsing region (10). The population of ions resulting from the collecting of said ions on or near said surface (12) is subsequently accelerated into the Time-Of-Flight tube (17) for mass to charge analysis. Ions produced away from said surface (12) can be directed to the surface (12) with high or low surface collisional energies. Higher energy ion collisions with the surface (12) can result in Surface Induced Dissociation fragmentation and the resulting ion fragment population can be mass analyzed. Mass analysis can be performed prior to directing the ions to the surface allowing MS/MS Time-Of-Flight mass analysis with SID. Ion to surface low energy collisions or soft landings resulting in little or no ion fragmentation provide a means for spatially focusing ions on or near the surface prior to accelerating the surface collected ions into the Time-Of-Flight tube.

摘要翻译： 飞行时间质谱仪（1）配置有脉冲区域（10）和电子控制器以引导离子到飞行时间脉动区域（10）中的表面（12）。 随后将所述离子收集在所述表面（12）上或其附近产生的离子群随后被加速到飞行时间管（17）中以进行大量电荷分析。 离开所述表面（12）产生的离子可以以高或低的表面碰撞能量被引导到表面（12）。 与表面（12）的高能离子碰撞可导致表面诱导解离破碎，并且可以质量分析得到的离子片段。 在将离子引导到表面之前可以进行质量分析，允许使用SID进行MS / MS飞行时间质量分析。 离子到表面的低能量碰撞或软着陆导致很少或没有离子碎裂提供了在将表面收集的离子加速到飞行时间管之前将离子空间聚焦在表面上或附近的手段。

公开(公告)号：US06444980B1

公开(公告)日：2002-09-03

申请号：US09647250

申请日：2000-11-07

申请人： Eizo Kawato ,  Alan Joseph Smith ,  Koichi Tanaka

发明人： Eizo Kawato ,  Alan Joseph Smith ,  Koichi Tanaka

IPC分类号： H01J4916

CPC分类号： H01J49/164

摘要： The apparatus comprises a sample, an optical element (4) in the form of a truncated pyramid having at least one reflective surface (1a) and a hole (7). A laser (18) directs radiation on to the sample via the reflective surface (1a) and the charged particles are extracted and directed along an extraction axis through the hole (7).

摘要翻译： 该装置包括样品，具有至少一个反射表面（1a）和孔（7）的截头棱锥形式的光学元件（4）。 激光器（18）通过反射表面（1a）将辐射引导到样品，并且带电粒子被提取并且沿着提取轴线通过孔（7）引导。

公开(公告)号：US06326615B1

公开(公告)日：2001-12-04

申请号：US09386577

申请日：1999-08-30

申请人： Jack A. Syage ,  Karl A. Hanold

发明人： Jack A. Syage ,  Karl A. Hanold

IPC分类号： H01J4916

CPC分类号： H01J49/424 ,  H01J49/105 ,  H01J49/162 ,  H01J49/40

摘要： A high speed mass spectrometer system capable of detecting in real-time multiple compounds in complex environments. This system includes a continuous ionization source coupled to a quadrupole ion trap to store ions, to filter ions for detection, to resonantly excite the ion trajectories to cause them to dissociate for more detailed analysis. This system includes a dual ionization configuration to cover broad and disparate classes of compounds. A glow discharge source is used to attach electrons to molecules with high electrons affinity. A photoionization source is used to detach electrons from molecules with low ionization potentials.

摘要翻译： 一种能够在复杂环境中实时检测多种化合物的高速质谱仪系统。 该系统包括连接到四极离子阱以存储离子的连续电离源，以过滤离子进行检测，以共振地激发离子轨迹，使其离解以进行更详细的分析。 该系统包括双电离配置以覆盖宽泛且不同类别的化合物。 辉光放电源用于将电子附着到具有高电子亲和力的分子上。 光电离源用于从具有低电离电位的分子中分离电子。

公开(公告)号：US06204500B1

公开(公告)日：2001-03-20

申请号：US09413443

申请日：1999-10-06

申请人： Craig M. Whitehouse ,  Bruce Andrien

发明人： Craig M. Whitehouse ,  Bruce Andrien

IPC分类号： H01J4916

CPC分类号： H01J49/40 ,  B82Y15/00 ,  B82Y30/00 ,  H01J49/0068

摘要： A Time-Of-Flight mass spectrometer is configured with a pulsing region and electronic controls to cause the directing of ions to a surface in the Time-Of-Flight pulsing region. The population of ions resulting from the collecting of said ions on or near said surface is subsequently accelerated into the Time-Of-Flight tube for mass to charge analysis. Ions produced away from said surface located in the pulsing region of a Time-Of-Flight mass spectrometer can be directed to the surface with high or low surface collisional energies. Higher energy ion collisions with the surface can result in Surface Induced Dissociation fragmentation and the resulting ion fragment population can be accelerated into Time-Of-Flight tube where the ions are mass to charge analyzed. Ion mass to charge selection can occur prior to directing ions to the pulsing region surface allowing MS/MS Time-Of-Flight mass analysis with SID. Ion to surface low energy collisions or soft landings resulting in little or no ion fragmentation provide a means for spatially focusing ions on or near the surface prior to accelerating the surface collected ions into the Time-Of-Flight tube. The apparatus and methods described in the invention result in refined control of ion fragmentation energy and improved Time-Of-Flight mass to charge analysis performance.

摘要翻译： 飞行时间质谱仪配置有脉冲区域和电子控制器，以将离子引导到飞行时间脉动区域中的表面。 随后在所述表面上或附近收集所述离子产生的离子群随后被加速到飞行时间管中用于质量进行电荷分析。 离开位于飞行时间质谱仪的脉冲区域的所述表面的离子可以被引导到具有高或低表面碰撞能量的表面。 与表面的高能离子碰撞可导致表面诱导解离破碎，并且所得到的离子片段群体可以加速到飞行时间管中，其中离子被质量分析。 在将离子引导到脉冲区域表面之前可以进行离子质量以进行电荷选择，从而允许使用SID的MS / MS飞行时间质量分析。 离子到表面的低能量碰撞或软着陆导致很少或没有离子碎裂提供了在将表面收集的离子加速到飞行时间管之前将离子空间聚焦在表面上或附近的手段。 本发明中描述的装置和方法导致离子断裂能量的精细控制和改进的飞行时间质量以进行电荷分析性能。