摘要:
A system that can be used for used for semiconductor height inspection and metrology includes a complementary plate that is used with a beam splitter to create desired astigmatism and to remove chromatic aberration. Simultaneous optimization of lateral resolution and sensitivity can be enabled. The complementary plate can be made of the same material and have the same thickness as the beam splitter.
摘要:
In an example embodiment, method, apparatus and computer program product for improving image and video captures using depth maps of viewfinder depth map, are provided. The method includes facilitating receipt of a viewfinder depth map of a scene, the viewfinder depth map comprising depth information of a plurality of objects in the scene. One or more objects are selected from the plurality of objects based on depth information of the one or more objects in the viewfinder depth map. Two or more images of the scene are facilitated to be captured by at least adjusting focus of a camera corresponding to the depth information of the one or more objects that are selected.In an example, a method also includes facilitating capture of an image of the scene by at least adjusting focus of a camera corresponding to the depth information of the two or more objects that are selected.
摘要:
The disclosure describes systems and apparatuses that include a focusable lens, as well as methods for focusing the optical lens. The focusable lens system includes a single element lens having a concave refractive surface characterized by a first radius of curvature and a convex refractive surface characterized by a second radius of curvature larger than the first radius of curvature. A detector element generates electrical signals representative of infrared rays refracted by the single element lens and incident on the detector element, and an aperture stop is disposed around an optical axis of the optical system and secured in a constant position relative to the detector element, the aperture stop configured to limit a cone angle of rays refracted by the single element lens. They system also includes image processing circuitry configured to generate digital pixilation data based on electrical signals generated by the detector element.
摘要:
The disclosure describes systems and apparatuses that include a focusable lens, as well as methods for focusing the optical lens. The focusable lens system includes a single element lens having a concave refractive surface characterized by a first radius of curvature and a convex refractive surface characterized by a second radius of curvature larger than the first radius of curvature. A detector element generates electrical signals representative of infrared rays refracted by the single element lens and incident on the detector element, and an aperture stop is disposed around an optical axis of the optical system and secured in a constant position relative to the detector element, the aperture stop configured to limit a cone angle of rays refracted by the single element lens. They system also includes image processing circuitry configured to generate digital pixilation data based on electrical signals generated by the detector element.