Abstract:
A memory device includes a memory cell (102) whose data state is sensed by a sense amplifier (100). A balance amplifier (200) having the same construction as the sense amplifier is utilized to sense a balance cell (202) having the same construction as the memory cell. The balance cell is maintained in a erased (conductive) state. The balance cell is gated by the output of the sense amplifier. Such a device operates in a way to consume the same amount of power regardless of the data state of the memory cell. In one embodiment of the invention, a memory device consisting of a memory array includes a balance circuit associated with each of the sense amplifiers in the memory device. In another embodiment of the invention, a trim circuit (208) is used to adjust the conductivity of the balance circuit. This allows the balance circuit to be fine tuned during manufacture to compensate for process variations, thus allowing the balance circuit to be matched to the memory cells.
Abstract:
Procédé de détection d'une erreur dans une mémoire électronique Procédé de détection d'au moins une erreur causée par un phénomène photoélectrique ou radiatif dans une mémoire non volatile à semi-conducteur, la mémoire comportant une pluralité de cellules mémoire (CM) à transistors MOS, éventuellement à grille flottante, chaque cellule mémoire étant située à l'intersection d'une ligne de bit élémentaire (BLE) et d'une ligne de mot (WL), la lecture du contenu binaire d'une cellule mémoire s'effectuant par détection d'un courant de lecture (Ilecture) traversant cette cellule mémoire lors de la lecture après sélection de cette cellule mémoire au moyen des lignes de bit élémentaire et de mot, procédé dans lequel on détecte la présence éventuelle d'au moins une erreur lors de la lecture ou de la programmation d'une cellule mémoire en comparant le courant total, circulant dans la ligne de bit élémentaire où s'effectue la détection, à un seuil prédéfini (Ialarme) représentatif de la présence d'au moins une erreur.
Abstract:
A request to perform a secure erase operation for a memory component can be received. A voltage level that is applied to unselected wordlines of the memory component during a read operation can be determined. A voltage pulse can be applied to at least one wordline of the memory component to perform the secure erase operation. The voltage pulse can be associated with a program operation to place a memory cell of the memory component at another voltage level that exceeds the voltage level that is applied to the unselected wordlines of the memory component during the read operation.
Abstract:
Devices and techniques for NAND temperature-aware operations are disclosed herein. A device controller can receive a command to write data to a component in the device. A temperature corresponding to the component can be obtained in response to receiving the command. The command can be executed by the controller to write data to the component. Executing the command can include writing the temperature into a management portion of the device that is separate from a user portion of the device to which the data is written.
Abstract:
A storage system includes a controller that is configured to make host data inaccessible. To do so, the controller may control power control circuitry to supply pulses to storage locations storing host data. The pulses may include flash write pulses but no erase pulses, or a combination of flash write pulses and erase pulses. If erase pulses are supplied, the number of the erase pulses may be less than the number supplied for performance of a default erase operation.
Abstract:
The disclosed embodiments comprise a flash memory device that can be configured to operate as a read only memory device. In some embodiments, the flash memory device can be configured into a flash memory portion and a read only memory portion.
Abstract:
In a charge trapping memory, data that would otherwise be likely to remain adjacent to unwritten word lines is written three times, along three immediately adjacent word lines. The middle copy is protected from charge migration on either side and is considered a safe copy for later reading. Dummy data may be programed along a number of word lines to format a block for good data retention.
Abstract:
Methods, systems and devices provide for refreshing a data image stored on a NAND memory device. Aspects include sequentially copying each of a series of static data partitions into a scrub portion that does not store data image partitions identified in the partition table. The sequential copying begins with a last static data partition and proceeds sequentially to a first static data partition when the scrub portion occupies higher order addresses than the last address of the last static data partition. Alternatively, the sequential copying begins with the first static data partition and proceeds sequentially to the last static data partition when the scrub portion occupies addresses that are lower than the first address of the first static data partition. The partition table may be updated as each static data partition is stored to the scrub portion. Such operations enable fail-safe scrubbing and refreshing of data in a NAND device.
Abstract:
A method of protecting data of a flash memory is provided. The method includes detecting primary power applied to the flash memory, and applying secondary power converted from the primary power to the flash memory. The primary power is compared to first and second values,and a writing-protection pin of the flash memory is enabled when the detected primary power reaches a predetermined value.
Abstract:
L'invention concerne un circuit à mémoire (MEM1) comprenant un plan mémoire (MA) comportant des cellules mémoire (MC), et un décodeur d'adresse (RDEC) configuré pour appliquer au plan mémoire des signaux (V 0 -V I-1 , Vsel) de sélection d'un groupe de cellules mémoire en fonction d'une adresse (AD1). Selon l'invention, le circuit à mémoirecomprenddes moyens (LCT) pour capturerdes signaux (Vsel) de sélection de cellules mémoire apparaissant dans le plan mémoire,et des moyens (RCOD), pour reconstituer, à partir des signaux de sélection capturés, une adresse (AD2) d'un groupe de cellules mémoire sélectionné.