SCANNING TERAHERTZ PROBE
    1.
    发明申请
    SCANNING TERAHERTZ PROBE 审中-公开
    扫描TERAHERTZ探头

    公开(公告)号:WO2009027675A2

    公开(公告)日:2009-03-05

    申请号:PCT/GB2008002907

    申请日:2008-08-28

    Abstract: A THz radiation probe for examining an object, the probe comprising a first portion configured to be inserted into an opening of said object in a first direction, said probe further comprising at least one THz emitter, directing means for directing THz radiation emitted from said emitter to said object via an aperture located at said first portion and subsequently from said object to at least one THz detector and, means for scanning said emitted THz radiation across said object in a scan direction, said scan direction having a component in said first direction.

    Abstract translation: 一种用于检查物体的太赫兹辐射探头,所述探头包括构造成沿第一方向插入所述物体的开口中的第一部分,所述探针还包括至少一个太赫兹发射器,用于引导从所述发射器发射的太赫兹辐射的引导装置 通过位于所述第一部分并且随后从所述物体到达至少一个THz检测器的孔的所述物体,以及用于沿扫描方向扫过所述物体的所述发射的THz辐射的装置,所述扫描方向具有在所述第一方向上的分量。

    COHERENT THZ EMITTER WITH DC POWER REDUCING RESISTOR
    3.
    发明申请
    COHERENT THZ EMITTER WITH DC POWER REDUCING RESISTOR 审中-公开
    具有直流减压电阻器的相关THZ发射器

    公开(公告)号:WO2004023611A1

    公开(公告)日:2004-03-18

    申请号:PCT/GB2003/003871

    申请日:2003-09-04

    CPC classification number: G01N21/3581 G01N21/3563 H01S1/02

    Abstract: An emitter for emitting radiation in a first range of frequencies comprising: a photoconductive material (11); and first and second contact elements (12, 13, 14) separated by a photoconducting gap provided by said photoconducting material (11), for applying a bias across said photoconducting gap, wherein at least one of said first and second contact elements (12, 13, 14) comprises a resistive element (14) for restricting current flow between said first and second contact elements in a second range of frequencies lower than the first range of frequencies.

    Abstract translation: 用于在第一频率范围内发射辐射的发射器,包括:光电导材料(11); 以及由所述光导材料(11)提供的光导间隔分开的用于跨所述光导间隙施加偏压的第一和第二接触元件(12,13,14),其中所述第一和第二接触元件(12, 13,14)包括用于在低于第一频率范围的第二频率范围内限制所述第一和第二接触元件之间的电流的电阻元件(14)。

    TERAHERTZ TIME DOMAIN SENSING TO DERIVE PHYSICAL CHARACTERISTICS OF AN OBJECT BY EALUATING THE CONTRIBUTION OF SURFACE WAVES TO THE REFLECTED/SCATTERED TIME DOMAIN WAVEFORM
    4.
    发明申请
    TERAHERTZ TIME DOMAIN SENSING TO DERIVE PHYSICAL CHARACTERISTICS OF AN OBJECT BY EALUATING THE CONTRIBUTION OF SURFACE WAVES TO THE REFLECTED/SCATTERED TIME DOMAIN WAVEFORM 审中-公开
    TERAHERTZ时域感测通过将表面波浪的贡献反射到反射/散射的时域波形来诱导物体的物理特性

    公开(公告)号:WO2006008456A1

    公开(公告)日:2006-01-26

    申请号:PCT/GB2005/002710

    申请日:2005-07-08

    CPC classification number: G01N21/55 G01N21/3563 G01N21/3586

    Abstract: The present invention provides a method of analysing an object (29) (for example a wive or a steut), comprising the steps of: (a) irradiating the object with a Terahertz pulse of electromagnetic radiation, such that a portion of the irradiating radiation couples to the object as a surface wave; (b) detecting radiation reflected and/or scattered from the object to obtain a time domain waveform; (c) extracting the parts of the radiation detected in step (b) relating to the surface wave on the object and (d) analysing the radiation identified in step (c) in order to derive information relating to a physical characteristic (for example the thickness of a coating) of the object.

    Abstract translation: 本发明提供了一种分析物体(29)(例如一个或一个或多个)的方法,包括以下步骤:(a)用电磁辐射的太赫兹脉冲照射物体,使得照射辐射的一部分 将物体作为表面波耦合; (b)检测从物体反射和/或散射的辐射以获得时域波形; (c)提取在步骤(b)中检测到的与物体上的表面波相关的辐射的部分,以及(d)分析在步骤(c)中识别的辐射,以获得与物理特性相关的信息(例如, 物体的厚度)。

    METHOD AND APPARATUS FOR GENERATION OF TERAHERTZ RADIATION
    6.
    发明申请
    METHOD AND APPARATUS FOR GENERATION OF TERAHERTZ RADIATION 审中-公开
    用于生成TERAHERTZ辐射的方法和装置

    公开(公告)号:WO2004027942A1

    公开(公告)日:2004-04-01

    申请号:PCT/GB2003/004038

    申请日:2003-09-19

    CPC classification number: H01S1/02 H01Q1/38 H01Q9/005 H01Q9/28

    Abstract: An emission system, particularly a terahertz emission system comprising an emitter comprising a photoconductive material and first and second electrodes; an excitation device for applying a pulsed radiation signal to the emitter at a pulse repetition frequency; and a biasing means configured to apply an alternating bias voltage signal to the first and second electrodes at a frequency synchronised with the pulse repetition frequency. Applying an AC bias to the emitter, such that the frequency is synchronised with the irradiation frequency, preferably at half the frequency of the irradiation frequency of the excitation laser, serves to reverse the effects of space charge polarisation. The present invention does not prevent space charge polarisation occurring, but utilises it advantageously. That is, when the sign of the applied field for the next laser pulse is reversed, the space charge polarisation that has built up then acts to enhance the electric field between the electrodes while reducing the field directly adjacent to the electrodes.

    Abstract translation: 一种发射系统,特别是包括发光体的太赫兹发射系统,包括光电导材料和第一和第二电极; 用于以脉冲重复频率向发射器施加脉冲辐射信号的激励装置; 以及偏置装置,被配置为以与脉冲重复频率同步的频率向第一和第二电极施加交流偏压信号。 将AC偏压施加到发射器,使得频率与照射频率同步,优选地为激发激光器的照射频率的一半频率,以反转空间电荷极化的影响。 本发明不会妨碍发生空间电荷极化,而是有利地利用它。 也就是说,当下一个激光脉冲的施加磁场的符号被反转时,积累的空间电荷极化然后用于增强电极之间的电场,同时减少与电极直接相邻的场。

    IMAGING APPARATUS AND METHOD
    7.
    发明申请
    IMAGING APPARATUS AND METHOD 审中-公开
    成像装置和方法

    公开(公告)号:WO03023383A2

    公开(公告)日:2003-03-20

    申请号:PCT/GB0203534

    申请日:2002-07-29

    CPC classification number: G01N21/3586 A61B5/0037 G01N21/4795 G01N22/00

    Abstract: A method of imaging a sample, the method comprising: (a) irradiating a sample with a pulse of electromagnetic radiation, said pulse having a plurality of frequencies in the range from 25 GHz to 100 THz; (b) determining a first parameter related to the amplitude of the radiation, which is either reflected from and/or transmitted by the sample, in the time domain; (c) calculating the value of the first parameter at a first time value relative to the value of the first parameter at a second time value which coincides with a physical feature of the dataset of the first parameter with respect to time; and (d) generating an image by plotting the value calculated in step (c) for different points of the sample.

    Abstract translation: 一种对样品成像的方法,该方法包括:(a)用电磁辐射脉冲照射样品,所述脉冲具有25GHz至100THz范围内的多个频率; (b)在时域中确定与从样本反射和/或由样本发射的辐射幅度有关的第一参数; (c)计算第一时间值处的第一参数相对于与第一参数的数据集关于时间的物理特征一致的第二时间值处的值的值; (d)通过对步骤(c)中计算的值绘制样本的不同点来生成图像。

    A PROBE APPARATUS AND METHOD FOR EXAMINING A SAMPLE
    8.
    发明申请
    A PROBE APPARATUS AND METHOD FOR EXAMINING A SAMPLE 审中-公开
    一种用于检验样品的探针装置和方法

    公开(公告)号:WO02061398A3

    公开(公告)日:2002-11-14

    申请号:PCT/GB0200432

    申请日:2002-01-30

    CPC classification number: G01N21/3581

    Abstract: A probe for examining a sample (5), the probe comprising an emitter (1) for emitting radiation, a detector (1) for detecting radiation and a dielectric member (3) configured to direct radiation from the emitter (1) to the sample (5) and to direct radiation reflected by the sample (5) to the detector (1), wherein in use, the dielectric member (3) occupies at least half of the radiation path length from the emitter (1) to the sample (5) to the detector (1).

    Abstract translation: 一种用于检查样品(5)的探针,所述探针包括用于发射辐射的发射体(1),用于检测辐射的检测器(1)和被配置为将发射体(1)的辐射引导到所述样品的电介质构件 (5)并且将由样品(5)反射的辐射引导到检测器(1),其中在使用中,电介质构件(3)占据从发射器(1)到样品(1)的辐射路径长度的至少一半 5)到检测器(1)。

    REFLECTOMETER TEST DEVICE FOR INTEGRATED CIRCUITS

    公开(公告)号:WO2012107782A3

    公开(公告)日:2012-08-16

    申请号:PCT/GB2012/050313

    申请日:2012-02-13

    Abstract: A reflectometer for allowing a test of a device, the reflectometer comprising: a source of pulsed radiation; a first photoconductive element configured to output a pulse in response to irradiation from said pulsed source; a second photoconductive element configured to receive a pulse; a transmission line arrangement configured to direct the pulse from the first photoconductive element to the device under test and to direct the pulse reflected from the device under test to the second photoconductive element; and a termination resistance provided for said transmission line configured to match the impedance of the transmission line.

    A TEST SYSTEM
    10.
    发明申请
    A TEST SYSTEM 审中-公开
    测试系统

    公开(公告)号:WO2012107782A2

    公开(公告)日:2012-08-16

    申请号:PCT/GB2012050313

    申请日:2012-02-13

    CPC classification number: G01R31/28 G01R31/11 G01R31/2822 G01R31/308

    Abstract: A reflectometer for allowing a test of a device, the reflectometer comprising: a source of pulsed radiation; a first photoconductive element configured to output a pulse in response to irradiation from said pulsed source; a second photoconductive element configured to receive a pulse; a transmission line arrangement configured to direct the pulse from the first photoconductive element to the device under test and to direct the pulse reflected from the device under test to the second photoconductive element; and a termination resistance provided for said transmission line configured to match the impedance of the transmission line.

    Abstract translation: 一种用于允许对装置进行测试的反射计,所述反射计包括:脉冲辐射源; 第一光电导元件,被配置为响应于来自所述脉冲源的照射而输出脉冲; 配置成接收脉冲的第二光电导元件; 传输线装置,被配置为将脉冲从第一光电导元件引导到被测器件,并将从被测器件反射的脉冲引导到第二光导元件; 以及针对配置成匹配传输线路的阻抗的所述传输线路提供的终端电阻。

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