Abstract:
Circuitry to provide a supply voltage. A voltage regulator is coupled to receive a target reference signal. The voltage regulator generates a supply voltage (Vtt) and is coupled to receive the supply voltage as an input signal. An upper limit comparator receives an upper limit voltage signal that is higher than the target reference voltage signal and the supply voltage to generate a "too high" signal when the supply voltage exceeds an upper threshold. A lower limit comparator receives a lower limit voltage signal that is lower than the target reference voltage signal and the supply voltage to generate a "too low" signal when the supply voltage is below a lower threshold. A pull up current source is coupled to pull the supply voltage up in response to the too low signal. A pull down current source is coupled to pull the supply voltage down in response to the too high signal.
Abstract:
REUT (Robust Electrical Unified Testing) for memory links is introduced which speeds testing, tool development, and debug. In addition it provides training hooks that have enough performance to be used by BIOS to train parameters and conditions that have not been possible with past implementations. Address pattern generation circuitry is also disclosed.
Abstract:
A memory controller issues a targeted refresh command. A specific row of a memory device can be the target of repeated accesses. When the row is accessed repeatedly within a time threshold (also referred to as "hammered" or a "row hammer event"), physically adjacent row (a "victim" row) may experience data corruption. The memory controller receives an indication of a row hammer event, identifies the row associated with the row hammer event, and sends one or more commands to the memory device to cause the memory device to perform a targeted refresh that will refresh the victim row.
Abstract:
Described herein are a method, apparatus, and system for electrostatic discharge protection of supplies. The apparatus comprises a timer unit having a node with a first supply signal and operable to generate a first timer signal based on the first supply signal; and a clamp unit, coupled to the timer unit and having a node with a second supply signal, operable to clamp the second supply signal in response to electrostatic discharge (ESD) on the node with the second supply signal for a duration based on a signal level of the first timer signal.
Abstract:
Described herein are a method, apparatus, and system for electrostatic discharge protection of supplies. The apparatus comprises a timer unit having a node with a first supply signal and operable to generate a first timer signal based on the first supply signal; and a clamp unit, coupled to the timer unit and having a node with a second supply signal, operable to clamp the second supply signal in response to electrostatic discharge (ESD) on the node with the second supply signal for a duration based on a signal level of the first timer signal.
Abstract:
A low power delay-locked loop (DLL) is presented. In one embodiment, the DLL includes a phase detector which includes a reference input and a feedback input to determine a phase difference. The DLL also includes a controller to determine whether to provide a signal to both the reference input and the feedback input such that the reference input and the feedback input receive an identical input, for example, during low power operation.
Abstract:
Described is a voltage regulator with feed-forward and feedback control. Described is an apparatus which comprises: a circuit for providing power or ground supply for a target circuit in response to a control signal; and a feed-forward filter to receive data and to generate the control signal according to the received data.
Abstract:
Data pin mapping and delay training techniques. Valid values are detected on a command/address (CA) bus at a memory device. A first part of the pattern (high phase) is transmitted via a first subset of data pins on the memory device in response to detecting values on the CA bus; a second part of the pattern (low phase) is transmitted via a second subset of data pins on the memory device in response to detecting values on the CA bus. Signals are sampled at the memory controller from the data pins while the CA pattern is being transmitted to obtain a first memory device's sample (high phase) and the second memory device's sample (low phase) by analyzing the first and the second subset of sampled data pins. The analysis combined with the knowledge of the transmitted pattern on the CA bus leads to finding the unknown data pins mapping. Varying the transmitted CA patterns and the resulting feedbacks sampled on memory controller data signals allows CA/CTRL/CLK signals delay training with and without priory data pins mapping knowledge.
Abstract:
In one embodiment, a system on a chip (SoC) includes a plurality of processor cores and a memory controller to control communication between the SoC and a memory coupled to the memory controller. The memory controller may be configured to send mirrored command and address signals to a first type of memory device and to send non-mirrored control and address signals to a second type of memory device. Other embodiments are described and claimed.
Abstract:
A low power delay-locked loop (DLL) is presented. In one embodiment, the DLL includes a phase detector which includes a reference input and a feedback input to determine a phase difference. The DLL also includes a controller to determine whether to provide a signal to both the reference input and the feedback input such that the reference input and the feedback input receive an identical input, for example, during low power operation.