摘要:
An apparatus for storing data in a magnetic random access memory (MRAM) is provided. The MRAM may store data in one or more resistance-based memory cells and may include a plurality of comparators to compare a voltage generated based on the resistance-based memory cells to a reference voltage to determine a stored logic state. In some implementations, the reference voltage may be generated by a plurality resistance-based memory cells. The reference voltage may be adjusted higher or lower by storing different logic states within the resistance-based memory cells.
摘要:
Methods and apparatus relating to dynamic voltage regulator sensing and/or reference voltage setting techniques for multiple gated loads are described. In an embodiment, voltage regulator logic is coupled to one or more loads. Each of the one or more loads is in a separate power domain. The voltage regulator logic controls a sensed voltage from the one or more loads in response to a power gate control signal. Other embodiments are also disclosed and claimed.
摘要:
An apparatus may include detection circuitry configured to detect a presence of a host clock signal on a host clock line, and detect a level of a host supply voltage upon detection of the host clock signal. The detection circuitry may configure a core regulator in a regulation mode or in a bypass mode based on the detected level of the host supply voltage. Additionally, components of analog circuitry of a non-volatile memory system may be partitioned into different supply voltage domains, with those components active during a sleep state receiving one supply voltage and those components inactive during the sleep state receiving a different supply voltage.
摘要:
Examples are given for techniques for entry to a lower power state for a memory device or die. The examples to include delaying transitions of the memory device or die from a first higher consuming power state to a second relatively lower power state using one or more programmable counters maintained at or with the memory device.
摘要:
A biasing circuit includes cascoded transistors including a first transistor and a second transistor. A first gate of the first transistor is coupled to a second gate of the second transistor at a first node. The circuit also includes a voltage control circuit coupled to at least one of the first transistor or the second transistor. The voltage control circuit is configured to change a voltage level of at least one of the first transistor or the second transistor to allow voltage domain transition of an output signal in view of a change in state of an input signal without ramping a supply signal of the biasing circuit.
摘要:
An electronic device includes a power pin to receive a power voltage from a power supply. A controller is to determine whether a status signal combined onto the power voltage is received through the power pin, and indicate a health of the power supply based on the determining.
摘要:
Selective coupling of power rails to memory domain(s) in processor-based system, such as to reduce or avoid the need to provide intentional decoupling capacitance in logic domain(s) is disclosed. To avoid or reduce providing additional intentional decoupling capacitance in logic domain to mitigate voltage droops on logic power rail, power rail selection circuit is provided. The power rail selection circuit is configured to couple memory domain to a logic power rail when the logic power rail can satisfy a minimum operating voltage of memory arrays. The additional intrinsic decoupling capacitance of the memory arrays is coupled to the logic power rail. However, if the operating voltage of the logic power rail is scaled down below the minimum operating voltage of the memory arrays when the logic domain does not need higher operation functionality, the power rail selection circuit is configured to couple the memory domain to separate memory power rail.
摘要:
Systems and methods are described for compensating for variations in process, voltage, temperature, or combinations thereof in an apparatus. An example apparatus may be a memory circuit. A pre-driver circuit and driver circuit may be associated with the memory circuit. A reference generator may provide the pre-driver circuit with reference signals that are insensitive to process, voltage, and temperature. The pre-driver circuit may receive the reference signals and the pre-driver circuit output ramping rate may then be made less sensitive to variations in process, voltage, and temperature. The pre-driver circuit output may then be supplied to a driver circuit that may then output a final driver data output with reduced noise.
摘要:
A bitline regulator for use in a high speed flash memory system is disclosed. The bitline regulator is responsive to a set of trim bits that are generated by comparing the bias voltage of a bitline to a reference voltage.