摘要:
A dynamic random access memory (DRAM) with code bit and self-refresh operation is disclosed. In one particular exemplary embodiment, at least one code bit is appended to N bits of user data to form a new code data. The user data are stored in a plurality of user data sub-arrays and code bit is stored in code bit sub-array respectively. Each sub-array stores at least one bit per user-specified row and column address. Each sub-array is independently controlled in either refresh operation or user operation. Refresh operation works on at least one sub-array at a time out of a plurality of sub-arrays. User operations work on other sub-arrays out of a plurality of sub-arrays. The code bit is used by an error detection and correction circuit to detect error and correct the bit error according to the address of the refreshing sub-array. User read operation and internal refresh operation can work concurrently.
摘要:
Technology relating to tuning for operating memory devices is disclosed. The technology includes a computing device that selectively configures operating parameters for at least one operating memory device based at least in part of performance characteristics for an application or other workload that the computing device has been requested to execute. This technology may be implemented, at least in part, in the firmware via a Basic Input/Output System (BIOS) or Unified Extensible Firmware Interface (UEFI) of the computing device. Further, this technology may be employed by a computing device that is executing workloads on behalf of a distributed computing system, e.g., in a data center. Such data centers may include, for example, thousands of computing devices and even more operating memory devices.
摘要:
A device includes a redundant region of a magnetoresistive random access memory (MRAM) array that includes first memory cells. The device includes a data region of the MRAM array that includes second memory cells. The device includes a fail address region of the MRAM array, a first row of the fail address region including validity data, wherein the validity data includes multiple validity indicators, a last row indicator, or both.
摘要:
Techniques for memory store error checks are provided. In one aspect, a process running on a processor may execute an instruction to store a first value in memory. The processor may store a plurality of values, including the first value, from a plurality of processes to the memory. A check on a synchronous error notification path may be performed to determine whether an error in storing at least one of the plurality of values occurred.
摘要:
In one example in accordance with the present disclosure, a method includes mapping, using post-package repair, an address associated with a first memory row of a computing device to a spare memory row of the computing device, wherein the spare memory row has a memory failure pattern, and reading data from the spare memory row.
摘要:
A storage cluster is provided. The storage cluster includes a plurality of storage nodes within a chassis. The plurality of storage nodes has flash memory for storage of user data and is configured to distribute the user data and metadata throughout the plurality of storage nodes such that the storage nodes can access the user data with a failure of two of the plurality of storage nodes. Each of the storage nodes is configured to generate at least one address translation table that maps around defects in the flash memory on one of a per flash package basis, per flash die basis, per flash plane basis, per flash block basis, per flash page basis, or per physical address basis. Each of the plurality of storage nodes is configured to apply the at least one address translation table to write and read accesses of the user data.
摘要:
Techniques for assigning error rates to memory are described. In one aspect, an indication of physically addressable memory in a system is received. The indication may include available error rates and a range granularity for assigning error rates to ranges of the physically addressable memory. Error rates may be assigned to each range of the physically addressable memory.
摘要:
The present disclosure includes apparatuses, electronic device readable media, and methods for memory mapping. One example method can include testing a memory identifier against an indication corresponding to a set of mapped memory identifiers, and determining a memory location corresponding to the memory identifier responsive to testing.
摘要:
A system and method for configuring fault tolerance in nonvolatile memory (NVM) are operative to set a first threshold value, declare one or more portions of NVM invalid based on an error criterion, track the number of declared invalid NVM portions, determine if the tracked number exceeds the first threshold value, and if the tracked number exceeds the first threshold value, perform one or more remediation actions, such as issue a warning or prevent backup of volatile memory data in a hybrid memory system. In the event of backup failure, an extent of the backup can still be assessed by determining the amount of erased NVM that has remained erased after the backup, or by comparing a predicted backup end point with an actual endpoint.