DEVICE FOR MANUFACTURING PANEL WITH FUNCTIONAL FILM, METHOD OF ITS MANUFACTURING, AND PANEL
    1.
    发明申请
    DEVICE FOR MANUFACTURING PANEL WITH FUNCTIONAL FILM, METHOD OF ITS MANUFACTURING, AND PANEL 审中-公开
    用于制造具有功能膜的面板的装置,其制造方法和面板

    公开(公告)号:WO1999017327A1

    公开(公告)日:1999-04-08

    申请号:PCT/JP1997003537

    申请日:1997-10-01

    Abstract: A functional film is uniformly stuck to the surface of a panel having a curvature in three-dimensional directions by using press rollers. Press roller sections (41 and 42) having equalizers which are displaceable in accordance with the variation of the curvature, in the roller forward direction (X), of the first and second edge portions (E1 and E2) of the surface (1S) of a panel are provided on the first and second edge protions (E1 and E2) behind a main press roller section (3) in terms of the roller forward direction (X) and pressure regulators which regulate the pressing pressures of rollers are provided to the press roller sections. The two follow-up press roller sections (41 and 42) are moved in the forward direction (X) of the rollers, following up the movement of the main press roller section (3) by moving the section (3) in the direction (X) as the leader. This panel can be applied to a CRT display device etc.

    Abstract translation: 通过使用压辊将功能性膜均匀地贴合在具有三维方向的曲率的面板的表面。 具有均衡器的压辊部分(41和42)具有可根据辊子向前方向(X)的曲率变化而位移的表面(1S)的第一和第二边缘部分(E1和E2) 在滚筒正向(X)方向上,在主压辊部分(3)的后面的第一和第二边缘部件(E1和E2)上设置一个面板,并且将压力调节器调节辊的压力提供给压力机 滚筒部分。 两个跟随压辊部分(41和42)沿着辊的向前方向(X)移动,跟随主压辊部分(3)的移动,通过使部分(3)沿( X)为领导者。 该面板可应用于CRT显示设备等

    IC CONVEYOR, IC POSTURE CHANGER AND IC TAKEOUT APPARATUS
    2.
    发明申请
    IC CONVEYOR, IC POSTURE CHANGER AND IC TAKEOUT APPARATUS 审中-公开
    IC输送机,IC更换器和IC采购设备

    公开(公告)号:WO1997017619A1

    公开(公告)日:1997-05-15

    申请号:PCT/JP1995002393

    申请日:1995-11-24

    Abstract: A semiconductor device transfer system used in a semiconductor tester of a tray-magazine type, which comprises a semiconductor device conveyor and a device for changing the attitude of devices being conveyed. The semiconductor devices are loaded into a horizontal testing tray from a magazine which is supported obliquely to feed them by gravity. The inclined semiconductor devices from the magazine are turned to be horizontal by means of a rail extending gently downward and ending in horizontal state, or a movable rail which rotates in a horizontal direction after receiving inclined semiconductor devices, or a rotary arm which holds inclined semiconductor devices and puts them in horizontal state while turning 180 DEG .

    Abstract translation: 一种用于托盘型半导体测试器的半导体器件传输系统,其包括半导体器件输送器和用于改变被传送器件的姿态的器件。 将半导体器件从倾斜地支撑的料仓装载到水平测试托盘中,以通过重力进给它们。 来自盒体的倾斜半导体器件通过轻轻地向下延伸并且以水平状态结束的轨道被转动成水平的,或者在接收倾斜的半导体器件之后沿水平方向旋转的活动导轨或者保持倾斜半导体的旋转臂 装置,并将其置于水平状态,同时转动180度。

    IMAGE PROCESSOR, DATA PROCESSOR, AND THEIR METHODS
    3.
    发明申请
    IMAGE PROCESSOR, DATA PROCESSOR, AND THEIR METHODS 审中-公开
    图像处理器,数据处理器及其方法

    公开(公告)号:WO1998029832A1

    公开(公告)日:1998-07-09

    申请号:PCT/JP1997004841

    申请日:1997-12-25

    Inventor: SONY CORPORATION

    CPC classification number: H04N9/75 G06T1/20 G06T5/009

    Abstract: The characteristic of nonlinear processing of image data are designated by means of a GUI and the processing results are immediately displayed. A personal computer (72) displays a GUI image for input on a monitor. When a user designates a nonlinear characteristic through an input device (70), the computer (72) extracts a polygonal line function representing the nonlinear characteristic and displays the function in the GUI image. In addition, the computer (72) generates a program used when a linear array type multiple-parallel processor (DSP80) executes the nonlinear processing specified by the extracted polygonal line function and downloads the program in the processor (DSP80).

    Abstract translation: 通过GUI指定图像数据的非线性处理的特征,并立即显示处理结果。 个人计算机(72)在监视器上显示用于输入的GUI图像。 当用户通过输入装置(70)指定非线性特性时,计算机(72)提取表示非线性特征的折线函数,并在GUI图像中显示该功能。 此外,计算机(72)生成当线性阵列型多并行处理器(DSP80)执行由提取的折线函数指定的非线性处理时使用的程序,并将该程序下载到处理器(DSP80)中。

    DEVICE FOR CONTROLLING IGNITION TIMING
    4.
    发明申请
    DEVICE FOR CONTROLLING IGNITION TIMING 审中-公开
    用于控制点火时间的装置

    公开(公告)号:WO1993013310A1

    公开(公告)日:1993-07-08

    申请号:PCT/JP1989001025

    申请日:1989-10-05

    CPC classification number: F02P5/155 F02P5/1558 Y02T10/46

    Abstract: A device for controlling ignition timing of an internal combustion engine employed in ships. In controlling the ignition timing in response to the opening degree of the throttle, when the throttle is actuated toward the closing direction, a relax/delay circuit relaxes the change of output from the throttle sensor in order to prevent the engine from stalling at the time of quick deceleration.

    CATHODE-RAY TUBE
    5.
    发明申请
    CATHODE-RAY TUBE 审中-公开
    阴极射线管

    公开(公告)号:WO1993009559A1

    公开(公告)日:1993-05-13

    申请号:PCT/JP1992001428

    申请日:1992-11-05

    CPC classification number: G02B1/11 G02B1/116 H01J29/868 H05F3/02

    Abstract: A cathode-ray tube, wherein on the outer surface of the face plate, stuck is a glass panel on which a transparent indium oxide conductive film electrically grounded is formed, and wherein to this conductive film, added is an antireflection film and a silica film. Thereby, in an antistatic treated type CRT, blocked is the alternate electric field of a VLF band, which has a possibility of giving a harmful effect to human organism, and realized are an antireflection function and a glare-proof function both which reduce eyestrain.

    Abstract translation: 阴极射线管,其中在面板的外表面上粘附有玻璃面板,其上形成有电接地的透明氧化铟导电膜,并且其中添加的是防反射膜和二氧化硅膜 。 因此,在抗静电处理型CRT中,阻挡VLF带的交替电场,其具有对人体有害的作用的可能性,并且实现了减少眼睛疲劳的抗反射功能和防眩功能。

    CLASSIFYING SYSTEM AND FINE PARTICLE MEASURING DEVICE
    6.
    发明申请
    CLASSIFYING SYSTEM AND FINE PARTICLE MEASURING DEVICE 审中-公开
    分类系统和微粒测量装置

    公开(公告)号:WO2007072942A9

    公开(公告)日:2007-08-09

    申请号:PCT/JP2006325593

    申请日:2006-12-22

    CPC classification number: G01N15/0266

    Abstract: A classifying system for retrieving a specified particle size range after being classified. In a preferable embodiment, an electric field for classifying charged fine particles according to electric mobility is generated by a center electrode (3) and an outside electrode (4). A sheath gas supply unit (7) is provided at the upper portion of a housing (1). An aerosol supply unit (11), having an introducing port (11a) on the outside electrode (4) side in a classifying region (5) and supplying charged aerosol at a constant flow rate from the introducing port (11a), is provided. A large-particle-size-side discharge unit (13), having a discharge port (13a) on the outside electrode (4) side and discharging that part of charged fine particles in classified charged aerosol that has at least a specified particle size at a constant flow rate along with part of sheath gas, is provided on the downstream side in a sheath gas flow in the classifying region (5). A detector (18) for detecting as an electric quantity the remaining number of charged fine particles fed along with sheath gas is disposed at the lower portion of the housing (1).

    Abstract translation: 分类系统,用于在分类后检索指定的粒度范围。 在优选的实施方式中,通过中心电极(3)和外部电极(4)产生用于根据电迁移率对带电微粒进行分类的电场。 护套气体供给单元(7)设置在壳体(1)的上部。 一种气雾剂供应单元(11),其在分类区域(5)的外侧电极(4)侧具有引入口(11a),并且从引入口(11a)以恒定流量供给带电气溶胶。 一种大粒径侧排出单元(13),其在外侧电极(4)侧具有排出口(13a),并将具有至少规定粒径的分级带电气雾剂的部分带电微粒排出 在分类区域(5)中的鞘气流中的下游侧设置有恒定的流量以及鞘气体的一部分。 一种用于检测作为电量的检测器(18),其中壳体(1)的下部设置有与护套气体一起供给的带电微粒子的剩余数量。

    CONTACT STRUCTURE OF A HANDLER FOR AN IC TESTING DEVICE
    7.
    发明申请
    CONTACT STRUCTURE OF A HANDLER FOR AN IC TESTING DEVICE 审中-公开
    用于IC测试设备的处理器的接触结构

    公开(公告)号:WO1996025672A1

    公开(公告)日:1996-08-22

    申请号:PCT/JP1996000318

    申请日:1996-02-14

    CPC classification number: G01R1/04

    Abstract: A contact structure of a handler of self-weight-dropping type that is easy to deal with thinned IC device and IC socket to be measured. To this end, a gap (9) corresponding to the dimensions of a carrier (3) housing therein an IC device (4) is formed by a roof connecting portion (7) and a rail (5), and the carrier (3) is supported by the gap (9) so that the IC device (4) is caused to drop and slide down to a contact position. In addition, an opening (8) is provided in the roof connecting portion (7) at the contact position, and upper and lower sides of the opening (8) at the roof connecting portion (7) are made roof A (1) and roof B (2), respectively, whereby the carrier (3) is supported by the roof A (1) and roof B (2) so that contact of the IC socket with the IC device is effected at the contact position.

    Abstract translation: 一种易于处理变薄的IC器件和要测量的IC插座的自重型处理机的接触结构。 为此,通过屋顶连接部(7)和轨道(5)形成对应于容纳IC元件(4)的载体(3)的尺寸的间隙(9),载体(3) 由间隙(9)支撑,使得IC装置(4)下降并向下滑动到接触位置。 另外,在接触位置的屋顶连接部(7)设有开口(8),屋顶连接部(7)的开口(8)的上侧和下侧形成屋顶A(1)和 屋顶B(2),由此托架(3)由屋顶A(1)和屋顶B(2)支撑,使得IC插座与IC装置的接触在接触位置进行。

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