Abstract:
A magnetic memory cell having a ferromagnetic free layer and a ferromagnetic pinned reference layer, each having an out-of-plane magnetic anisotropy and an out-of-plane magnetization orientation and switchable by spin torque. The cell includes a ferromagnetic assist layer proximate the free layer, the assist layer having a low magnetic anisotropy less than about 500 Oe. The assist layer may have in-plane or out-of-plane anisotropy.
Abstract:
Flux-closed spin-transfer torque memory having a specular insulative spacer is disclosed. A flux-closed spin-transfer torque memory unit includes a multilayer free magnetic element including a first free magnetic layer anti-ferromagnetically coupled to a second free magnetic layer through an electrically insulating and electronically reflective layer. An electrically insulating and non-magnetic tunneling barrier layer separates the free magnetic element from a reference magnetic layer.
Abstract:
A read head is provided, which includes a first layer structure having a pinned ferromagnetic layer, a first spacer layer and a second layer structure including a synthetic anti-ferromagnetic (SAF) multi-layer structure. The SAF multi-layer structure includes a first ferromagnetic free layer, a second ferromagnetic free layer, and a second spacer layer arranged in between the two ferromagnetic layers. A first magnetization of the first ferromagnetic free layer and a second magnetization of the second ferromagnetic layer are perpendicular to a fixed magnetization of the pinned ferromagnetic layer.
Abstract:
A multi-state magnetoresistive random access memory unit (MRAM) having a plurality of memory cells, each of the cells are written to and read from, independently of other cells. The plurality of memory cells comprises a recording layer as a pinned magnetic layer and a read layer as an unpinned layer. The unpinned layer has a higher Curie point than the pinned layer. The pinned layer in an individual cell is heated to near its Curie point and a bit line current and a word line current is used to align the magnetization vector of the recording layer at a plurality of angles relative to the magnetization vector of the read layer.
Abstract:
Magnetic spin-torque memory cells, also referred to as magnetic tunnel junction cells, which have magnetic anisotropies (i.e., magnetization orientation at zero field and zero current) of the associated ferromagnetic layers aligned perpendicular to the wafer plane, or "out-of-plane". A memory or magnetic junction cell may have a ferromagnetic free layer, a first pinned reference layer and a second pinned reference layer, each having a magnetic anisotropy perpendicular to the substrate. The free layer has a magnetization orientation perpendicular to the substrate that is switchable by spin torque from a first orientation to an opposite second orientation.
Abstract:
Spin-transfer torque memory having a specular insulative spacer is disclosed. The spin-transfer torque memory unit (30) includes a free magnetic layer (F6), a reference magnetic layer (RL), an electrically insulating and non-magnetic tunneling barrier layer (TB) separating the free magnetic layer from the reference magnetic layer, an electrode layer (E1, E2) and an electrically insulating and electronically reflective layer (ER) separating the electrode layer and the free magnetic layer.
Abstract:
A memory cell for a magnetic memory device comprising a first hard magnetic later having a first fixed magnetization vector; a second hard magnetic later having a second fixed magnetization vector; a first soft magnetic layer having a first alterable magnetization vector and disposed adjacent to the first hard magnetic layer and a second soft magnetic layer having a second alterable magnetization vector and disposed adjacent to the second hard magnetic layer, the first and the second soft magnetic layers are magnetostatically coupled antiparallel to each other to form a flux-closed structure. An electrically conductive layer is disposed between the two soft magnetic layers for passing an electric current therethrough to perform the read and write operations. A magnetic memory device made thereof possesses a higher thermal stability against external thermal fluctuations and in the meantime has a lower power dissipation in writing operations.
Abstract:
A resistive sense memory ( 130, 150) and method (200) of writing data thereto. In accordance with various embodiments, the resistive sense memory comprises a first reference layer (132) with a fixed magnetic orientation in a selected direction coupled to a first tunneling barrier ( 136), a second reference layer (134) with a fixed magnetic orientation in the selected direction coupled to a second tunneling barrier (138), and a recording structure (140) disposed between the first and second tunneling barriers comprising first and second free layers (142, 144). A selected logic state is written to the resistive sense memory (206, 208) by applying a programming input (148) to impart complementary first and second programmed magnetic orientations to the respective first and second free layers.
Abstract:
A magnetic memory device includes a plurality of transistors (316, 317) formed on a substrate and a common magnetic memory block (312) including multiple effective magnetoresistive elements (318, 319), a ferromagnetic recording (321), a non-magnetic space (323), and a free magnetic reading (322) layer formed above the transistors (316, 317). An extended common digital line (315) is located above the common magnetic memory block (312). The common magnetic memory block (312) is electrically connected with a respective source/drain electrode of the transistors (316, 317) through each a contact at a respective active area. The specific magnetization state of the ferromagnetic recording layer at the active areas can be changed by a heating process and applying an external field induced from the common digital line (315) and the bit (309, 311) or word (307) or word (307) lines. The change in resistance of the effective magnetoresistive element (318, 319) can be detected by means of changing the magnetization state of the free magnetic reacting layer during reading, thus a smaller switching field is required.
Abstract:
A memory cell (310) for a magnetic memory device (300) includes a free layer (311), a cap layer, an antiferromagnetic layer, and a synthetic antiferromagnetic layer which comprises two or more than two ferromagnetic layers that are antiferromagnetically coupled through non-magnetic space layers. The synthetic antiferromagnetic layer is pinned by antiferromagnetic layer. The antiferromagnetic layer and the synthetic antiferromagnetic layer form a synthetic antiferromagnetic pinned (SAFP) recording layer. The magnetization of the SAFP recording layer can be changed by combining a heating process and an external field induced from currents flowing along the bit line (320) and the word line (330). Therefore, a MRAM with high density, high thermal stability, low power dissipation and high heat tolerance can be achieved after introducing the SAFP recording layer due to the high volume and anistropy energy of the SAFP recording layer.