Abstract:
The invention relates to a hall sensor (1) comprising two opposite-lying power supply contact electrodes (7a, 7c) between which an active region (5) is defined. Said electrodes are provided for generating a current flow through the active region. The inventive hall sensor also comprises two opposite-lying voltage tapping contact electrodes (7b, 7d) for tapping a hall voltage, whereby a section of each contact electrode facing the active region (5) is shaped in such a way that the interfering influence of the contacts on the offset-reducing effect of the spinning current operation is reduced.
Abstract:
The invention relates to an integrated component (10) comprising a filter structure having at least two structured metal layers (32; 82), each of the at least two structured metal layers having a zone plate structure (14) to achieve a spectral filtering effect, and an optoelectronic component (16). The filter structure (12) and the optoelectronic component (16) are integrated into a semiconductor substrate (16) in such a manner that the optoelectronic component (16) is arranged in a field concentration area of the filter structure (12).
Abstract:
The invention relates to a current measuring device for measuring an electric current using one or more conductors (L1, L2, L3) in an arrangement of n conductors, n being a natural number >/= 2. The device has n+1 sensors (S1 to S4) which are sensitive to magnetic fields and which are arranged in such a way that two sensors are adjacent to each conductor. The device provides a unit (12) for reading output signals from said sensors. The current measuring device also has a unit (10) for calculating the electric current using one or more of the conductors, based on the read output signals and coefficients which describe the influence of the electric currents that pass through each of the n conductors and the influence of a continuous magnetic field on the output signal from each of the magnetic field-sensitive sensors.
Abstract:
The invention relates to a device having a first optical component (102) on a first printed circuit board surface (104), a second optical component (106) on a second printed circuit board surface (108), wherein the first printed circuit board surface (104) and the second printed circuit board surface (108) are substantially disposed successively parallel to each other such that the first printed circuit board surface (104) and the second printed circuit board surface (108) point in the same normal direction (110), and wherein both the first optical component (102) and the second optical component (106) can be coupled to an optical interface positioned in a normal direction (110) behind the first and the second printed circuit board surfaces.
Abstract:
The invention relates to an integrated sensor element (10) which is produced in CMOS technology and comprises a pixel sensor (14) and a metal structure (16; 34-1) and produces a plasmon polariton resonance effect in response to electromagnetic radiation (12) in a predetermined transmission wavelength range, the metal structure (16; 34-1) being structured in a CMOS metal layer. The pixel sensor (14) and the metal structure (16; 34-1) are integrated on a common semiconductor substrate (30) so that owing to the plasmon-polariton resonance effect there is greater transmission through the metal structure (16; 34-1) to the pixel sensor for the transmission wavelength range then for wavelengths close to the transmission wavelength range.
Abstract:
The invention relates to a multi-spectral image sensor having a two-dimensional array of super-pixels, wherein each super-pixel has at least five sensor elements (11), each comprising a pixel sensor (14), a filter structure (12) having at least one structured layer made of metal or polycrystalline semi-conductor material, which, in response to the electromagnetic radiation of a wavelength region, results in a higher transmission through the filter structure to the pixel sensor (14) than wavelengths surrounding the wavelength region, wherein the at least five sensor elements (12) are jointly integrated on a semi-conductor substrate (16) and are configured on different wavelength regions in pairs.
Abstract:
The invention relates to an integrated component (10; 40; 50) comprising a filter structure (12) provided with at least one photonic crystal (22) formed from a stack of dielectric layers (36) and a plurality of structured metallic layers (34; 44). The structured metallic layers each have a periodical structure consisting of microelements, which is different from the periodical structure of microelements of an adjacent structured metallic layer of the at least one photonic crystal (22), or is laterally staggered in relation thereto. Said component also comprises an optoelectronic component part (14), the filter structure (12) and the optoelectronic component part (14) being incorporated together into a semiconductor substrate (16).