Abstract:
An apparatus includes an adjustment circuit configured to receive a pulsed-width modulation (PWM) input, generate an adjusted PWM signal based upon the PWM input, and determine that a first pulse of the PWM input is shorter than a runt signal limit. The adjustment circuit is configured to, in the adjusted PWM signal, extend the first pulse of the PWM input based on the determination that the PWM input is shorter than the runt signal limit, and output the adjusted PWM signal to an electronic device.
Abstract:
A memory management circuit includes a direct memory access (DMA) channel. The DMA channel incudes logic configured to receive a buffer of data to be written using DMA. The DMA channel further includes logic to perform bit manipulation in real-time during a DMA write cycle of the first buffer of data.
Abstract:
In an embedded device with a plurality of processor cores, each core has a static random access memory (SRAM), a memory built-in self-test (MBIST) controller associated with the SRAM, an MBIST access port coupled with the MBIST controller, an MBIST finite state machine (FSM) coupled with the MBIST access port via a first multiplexer, and a JTAG interface coupled with the MBIST access ports of each processor core via the multiplexer of each processor core.
Abstract:
A constant current source, a stable time base and a capacitor are used to self-check operation of an analog-to-digital convertor (ADC) by charging the capacitor for a pre-determined amount of time to produce a voltage thereon. This voltage will be proportional to the amount of time that the capacitor was charged. Multiple points on the ADC transfer function can be verified in this self-check procedure simply by varying the amount of time for charging of the capacitor. Relative accuracy among test points may then be easily obtained. Absolute accuracy may be obtained by using an accurate clock reference for the time base, a known current source and capacitor value.
Abstract:
A microcontroller has a programmable timebase, wherein the timebase has a trigger input to start a timer or counter of the timebase and wherein the timebase can be configured to operate upon receiving a trigger signal in a first mode to generate a plurality of timer/counter event signals until a reset bit in a control register is set and in a second mode to generate a single timer/counter event signal and wherein the timebase can be configured to operate in a third mode to generate a predefined number of timer/counter event signals, wherein the predefined number is defined by a plurality of bits of a register.
Abstract:
Dead time compensated complementary pulse width modulation (PWM) signals (PWMH, PWML) are derived from a PWM generator by first applying time period compensation to the PWM generator signal (450) based upon the direction of current flow in an inductive load (correction control: 440) being controlled by the PWM generator. Dead time is then applied to the compensated PWM generator signal (462) for producing complementary dead time compensated PWM signals (PWMH, PWML) for controlling power switching circuits driving the inductive load.
Abstract:
A number of standard PWM generators produce PWM signals that may be used to drive the power stages for Full-Bridge, Feed-Forward, Push-Pull, Phase-Shift Zero Voltage Transition (ZVT), and other switched mode power supply (SMPS) conversion topologies. These PWM signals may be fed to logic functions of a combinatorial logic block. Appropriate PWM signals are selected as operands along with desired logic function(s) that operates on these input operands. The resultant combinatorial PWM signals may then be used directly or may be fed through dead-time processing circuitry prior to outputting to an application circuit. In addition to the combinatorial logic functions, sequential logic functions may also be used to provide sequential PWM signals, e.g., synchronous sequential, asynchronous sequential, and/or sequential-combinatorial PWM signals.
Abstract:
A microcontroller has a central processing unit (CPU), a plurality of peripherals, and a programmable scheduler unit with: - a timer being clocked by an independent clock signal; - a comparator coupled with a timer register of said timer and having an output generating an output signal; - an event register coupled with said comparator; - a delta time register; and - an arithmetic logic unit controlled by the output signal of the comparator and with first and second inputs and an output, wherein the first input is coupled with the timer register or the event register and the second input is coupled with the delta time register and the output is coupled with the event register.
Abstract:
Pulse Density Modulation (PDM) is used to control the amount of light from a fluorescent lamp by applying a voltage to the lamp filaments at a low frequency that is approximately at a series resonant frequency of the lamp ballast inductor and the lamp filament capacitor, no voltage and a voltage at a high frequency. The lamp gas ionizes to produce light only when the low frequency voltage is applied. The fluorescent lamp gas does not ionize when the voltage at the high frequency is applied, but the high frequency voltage keeps the lamp filaments warm during low light output conditions. The low frequency, no and high frequency voltages have time periods that occur within a modulation frame time period that repeats continuously. The ratio of the low frequency voltage time period, and the no voltage and/or high frequency voltage time periods determine the light output of the fluorescent lamp.
Abstract:
An apparatus includes a debugger circuit, debug pins, and a test controller circuit. The test controller circuit is configured to, in a programming mode, determine a subset of the debug pins used in programming the apparatus. The test controller circuit is further configured to save a designation of the subset of the debug pins. The test controller circuit is further configured to, in a test mode subsequent to the programming mode, use the designation to route the subset of the debug pins used in programming the apparatus to the debugger circuit for debug input and output with the server.