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公开(公告)号：WO2019180714A1
公开(公告)日：2019-09-26
申请号：PCT/IL2019/050311
申请日：2019-03-20
Applicant: OPTIMAL PLUS LTD.
Inventor： GUROV, Leonid , PELED, Gal , SEBBAN, Dan , TEPLINSKY, Shaul
IPC: G01R31/28 , H01L21/66 , G01R31/317
Abstract: A method of identifying defects in an electronic assembly, comprising, by a processing unit, obtaining a grid of nodes representative of a location of electronic units of an electronic assembly, wherein each node is neighboured by at most eight other nodes, wherein a first plurality of nodes represents failed electronic units according to at least one test criterion, and a second plurality of nodes represents passing electronic units according to the least one first test criterion, based on the grid, determining at least one first and second straight lines, and attempting to connect the first and second straight lines into a new line, wherein if at least one node from the new line belongs to the second plurality of nodes, concluding that an electronic unit represented by the node on the grid is a failed electronic unit, thereby facilitating identification of a failed electronic unit on the substrate.
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公开(公告)号：WO2018037347A1
公开(公告)日：2018-03-01
申请号：PCT/IB2017/055068
申请日：2017-08-22
Applicant: OPTIMAL PLUS LTD.
Inventor： TEPLINSKY, Shaul , PHILLIPS, Bruce Alan , SCHULDENFREI, Michael , SEBBAN, Dan
Abstract: Embodiments describe a method of manufacture including receiving a product attribute identifying a product, and receiving a first component attribute and a second component attribute, the first component attribute identifying a first component included in the product and the second component attribute identifying a second component included in the product. The method further includes receiving first manufacturing data associated with the first component and second manufacturing data associated with the second component, applying a set of compatibility rules to the first manufacturing data and the second manufacturing data, determining pairing data from the application of the set of compatibility rules to the first manufacturing data and the second manufacturing data, applying a set of pairing rules to the pairing data, determining one or more actions from the application of the set of pairing rules to the pairing data, and performing the one or more actions.
Abstract translation: 实施例描述了一种制造方法，包括：接收标识产品的产品属性;以及接收第一组件属性和第二组件属性，第一组件属性标识包括在产品中的第一组件，第二组件属性 组件属性标识包括在产品中的第二组件。 该方法进一步包括接收与第一部件相关联的第一制造数据和与第二部件相关联的第二制造数据，将一组兼容性规则应用于第一制造数据和第二制造数据，确定来自该组 对第一制造数据和第二制造数据的兼容性规则，将一组配对规则应用于配对数据，确定从配对规则组的应用到配对数据的一个或多个动作，以及执行一个或多个动作
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公开(公告)号：WO2018226749A1
公开(公告)日：2018-12-13
申请号：PCT/US2018/036138
申请日：2018-06-05
Applicant: OPTIMAL PLUS LTD. , TEPLINSKY, Shaul
Inventor： TEPLINSKY, Shaul , SCHULDENFREI, Michael , SEBBAN, Dan
CPC classification number: G01R31/2601 , G01R31/2837 , G01R31/2894 , G06Q10/06395 , G06Q50/04 , H01L22/00 , H01L22/14 , H01L22/20
Abstract: A method includes receiving, from a system manufacturer, system test data for a plurality of electronic systems. Each of the plurality of electronic systems includes a plurality of electronic components. The method also includes determining a relationship between a set of electronic components from the plurality of electronic components and the electronic systems upon which the electronic components of the set of electronic components are assembled and receiving, from a component manufacturer, manufacturing attributes for the set of electronic components. The method further includes selecting a data subset from the system test data corresponding to a subgroup of the set of electronic components. The subgroup includes components from a same fabrication cluster. Additionally, the method includes identifying an outlier relative to the data subset and communicating information about the outlier to at least one of the system manufacturer or the component manufacturer.
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