公开(公告)号：WO2018226749A1

公开(公告)日：2018-12-13

申请号：PCT/US2018/036138

申请日：2018-06-05

Applicant: OPTIMAL PLUS LTD. ,  TEPLINSKY, Shaul

Inventor： TEPLINSKY, Shaul ,  SCHULDENFREI, Michael ,  SEBBAN, Dan

IPC: G01R31/28 ,  G01R31/26 ,  G06F17/18

CPC classification number: G01R31/2601 ,  G01R31/2837 ,  G01R31/2894 ,  G06Q10/06395 ,  G06Q50/04 ,  H01L22/00 ,  H01L22/14 ,  H01L22/20

Abstract: A method includes receiving, from a system manufacturer, system test data for a plurality of electronic systems. Each of the plurality of electronic systems includes a plurality of electronic components. The method also includes determining a relationship between a set of electronic components from the plurality of electronic components and the electronic systems upon which the electronic components of the set of electronic components are assembled and receiving, from a component manufacturer, manufacturing attributes for the set of electronic components. The method further includes selecting a data subset from the system test data corresponding to a subgroup of the set of electronic components. The subgroup includes components from a same fabrication cluster. Additionally, the method includes identifying an outlier relative to the data subset and communicating information about the outlier to at least one of the system manufacturer or the component manufacturer.

公开(公告)号：WO2016174654A1

公开(公告)日：2016-11-03

申请号：PCT/IL2016/050319

申请日：2016-03-24

Applicant: OPTIMAL PLUS LTD.

Inventor： LINDE, Reed ,  SCHULDENFREI, Michael ,  GLOTTER, Dan ,  PHILLIPS, Bruce Alan ,  TEPLINSKY, Shaul

IPC: G06Q10/06 ,  G06F11/00

CPC classification number: G06Q10/06395 ,  G06F11/008 ,  G06Q10/06 ,  Y02P90/82

Abstract: Disclosed are methods, systems and computer program products for concluding whether or not there is a correlation between a set of manufacturing condition(s) and performance of in-field end user devices. Also disclosed are methods, systems and computer program products for concluding whether or not there is an inconsistency in in-field end user devices data and/or manufacturing data associated with electronic elements included in end-user devices. In one example, a method includes analyzing received in-field data and/or data computed based on received in-field data, in order to determine whether or not there is a statistically significant difference in in-field performance between end-user devices including elements from a first population and end-user devices including elements from a second population, where manufacturing of the first population corresponds to a set of one or more manufacturing conditions, but manufacturing of the second population does not correspond to the set.

Abstract translation: 公开了用于确定一组制造条件和现场最终用户设备的性能之间是否存在相关性的方法，系统和计算机程序产品。 还公开了用于结束现场最终用户设备数据和/或与包括在最终用户设备中的电子元件相关联的制造数据是否不一致的方法，系统和计算机程序产品。 在一个示例中，一种方法包括分析接收到的现场数据和/或基于接收到的现场数据计算的数据，以便确定最终用户设备之间的现场性能是否存在统计上显着的差异，包括 来自第一种群的元素和包括来自第二种群的元素的最终用户装置，其中第一种群的制造对应于一组一个或多个制造条件，但第二种群的制造不对应于该组。

公开(公告)号：WO2019180714A1

公开(公告)日：2019-09-26

申请号：PCT/IL2019/050311

申请日：2019-03-20

Applicant: OPTIMAL PLUS LTD.

Inventor： GUROV, Leonid ,  PELED, Gal ,  SEBBAN, Dan ,  TEPLINSKY, Shaul

IPC: G01R31/28 ,  H01L21/66 ,  G01R31/317

Abstract: A method of identifying defects in an electronic assembly, comprising, by a processing unit, obtaining a grid of nodes representative of a location of electronic units of an electronic assembly, wherein each node is neighboured by at most eight other nodes, wherein a first plurality of nodes represents failed electronic units according to at least one test criterion, and a second plurality of nodes represents passing electronic units according to the least one first test criterion, based on the grid, determining at least one first and second straight lines, and attempting to connect the first and second straight lines into a new line, wherein if at least one node from the new line belongs to the second plurality of nodes, concluding that an electronic unit represented by the node on the grid is a failed electronic unit, thereby facilitating identification of a failed electronic unit on the substrate.

公开(公告)号：WO2018037347A1

公开(公告)日：2018-03-01

申请号：PCT/IB2017/055068

申请日：2017-08-22

Applicant: OPTIMAL PLUS LTD.

Inventor： TEPLINSKY, Shaul ,  PHILLIPS, Bruce Alan ,  SCHULDENFREI, Michael ,  SEBBAN, Dan

IPC: G06F3/01 ,  G06F15/16 ,  G06F17/30 ,  G06Q30/00 ,  H04B7/00 ,  H04K1/10 ,  H04L9/30

Abstract: Embodiments describe a method of manufacture including receiving a product attribute identifying a product, and receiving a first component attribute and a second component attribute, the first component attribute identifying a first component included in the product and the second component attribute identifying a second component included in the product. The method further includes receiving first manufacturing data associated with the first component and second manufacturing data associated with the second component, applying a set of compatibility rules to the first manufacturing data and the second manufacturing data, determining pairing data from the application of the set of compatibility rules to the first manufacturing data and the second manufacturing data, applying a set of pairing rules to the pairing data, determining one or more actions from the application of the set of pairing rules to the pairing data, and performing the one or more actions.

Abstract translation: 实施例描述了一种制造方法，包括：接收标识产品的产品属性;以及接收第一组件属性和第二组件属性，第一组件属性标识包括在产品中的第一组件，第二组件属性 组件属性标识包括在产品中的第二组件。 该方法进一步包括接收与第一部件相关联的第一制造数据和与第二部件相关联的第二制造数据，将一组兼容性规则应用于第一制造数据和第二制造数据，确定来自该组 对第一制造数据和第二制造数据的兼容性规则，将一组配对规则应用于配对数据，确定从配对规则组的应用到配对数据的一个或多个动作，以及执行一个或多个动作

公开(公告)号：WO2017093999A1

公开(公告)日：2017-06-08

申请号：PCT/IL2016/051225

申请日：2016-11-13

Applicant: OPTIMAL PLUS LTD.

Inventor： ROUSSEAU, Eran ,  PELTZ, Arie ,  TEPLINSKY, Shaul

IPC: G06F9/44 ,  G06F11/36 ,  G06F19/00

CPC classification number: G01R31/3172 ,  G01R31/31725 ,  G01R31/3177 ,  G01R31/31907

Abstract: A method for modifying the execution sequence of tests for testing an object on a test system. The tests include a group of tests that is a candidate for replacement. The method includes: while executing the tests according to the execution sequence and before executing the group of tests, modifying, in real time, the execution sequence including: executing a delay instead of the group of tests, wherein the delay is related to the group of tests.

Abstract translation:

一种用于修改测试执行顺序以测试测试系统上的对象的方法。 这些测试包括一组替代候选人的测试。 该方法包括：在根据执行顺序执行测试时并且在执行测试组之前，实时修改执行顺序，包括：执行延迟而不是测试组，其中延迟与组相关 的测试。