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    SYSTEM COMPRISING AN APPARATUS AND A CARTRIDGE FOR ASSAY MEASUREMENT
    1.
    发明申请
    SYSTEM COMPRISING AN APPARATUS AND A CARTRIDGE FOR ASSAY MEASUREMENT 审中-公开

    公开(公告)号：WO2021123812A1

    公开(公告)日：2021-06-24

    申请号：PCT/GB2020/053293

    申请日：2020-12-18

    Applicant: VIDYA HOLDINGS LTD

    Inventor： VAN WORKUM, Stefan Leo ,  TUREK, Vladimir Alexander ,  DORRESTIJN, Marko ,  KLUG, David R.

    IPC: G01N21/64 ,  G01N33/52 ,  G01N21/645 ,  G01N21/648

    Abstract: An apparatus (1) for detecting the presence and/or the quantity of a target component in a biological fluid in an integrated assay cartridge (52) of predetermined configuration, the assay cartridge comprising a capture component (22) at a predetermined location in the assay cartridge, the apparatus comprising: a detector (12) for detecting the amount of light scattered, transmitted or emitted by the sample to provide an indication of the presence and/or the quantity of the target component within the sample; three location positions (30), the three positions defining a location along the optical path of the detector on which to locate the cartridge of a predetermined size; wherein location positions are configured such that the capture component of the assay cartridge is located, in use, at the focal plane of the detector. Measures to ensure quality control may also be provided.

    A COMBINED SAMPLE COLLECTION AND FILTRATION DEVICE
    4.
    发明申请
    A COMBINED SAMPLE COLLECTION AND FILTRATION DEVICE 审中-公开

    公开(公告)号：WO2022038375A1

    公开(公告)日：2022-02-24

    申请号：PCT/GB2021/052171

    申请日：2021-08-20

    Applicant: VIDYA HOLDINGS LTD

    Inventor： DORRESTIJN, Mark ,  KLUG, David R. ,  TUREK, Vladimir ,  VAN WORKUM, Stefan Leo

    IPC: A61B10/00

    Abstract: A combined sample collection and filtration device is provided for collecting and filtering a fluid sample. The device comprises: a sample collection location; a filter module for removing particulate matter from the fluid sample; the filter module having a bubble point and a burst pressure; and one or more voids in communication with the sample collection location for accommodating sample during pressurisation such that the pressure within the device remains below the bubble point and the burst pressure of the filter module.

    IMPROVEMENTS IN OR RELATING TO AN APPARATUS FOR DETECTION AND ANALYSIS OF A COMPONENT
    5.
    发明申请
    IMPROVEMENTS IN OR RELATING TO AN APPARATUS FOR DETECTION AND ANALYSIS OF A COMPONENT 审中-公开

    公开(公告)号：WO2022008933A1

    公开(公告)日：2022-01-13

    申请号：PCT/GB2021/051771

    申请日：2021-07-09

    Applicant: VIDYA HOLDINGS LTD

    Inventor： DORRESTIJN, Marko ,  KLUG, David R. ,  TUREK, Vladimir ,  WORKUM, Stefan Leo Van

    IPC: G01N21/64 ,  G01N21/65 ,  G01N21/76 ,  G01N33/543 ,  G01N21/51

    Abstract: An apparatus for creating and correcting a two dimensional intensity map of one or more assay spots in a detection zone is provided. The apparatus comprising, a locator for affirming the location of the detection zone; a total internal reflection excitation device comprising a light source for illuminating the one or more assay spots in the detection zone; a detector configured to receive light that is emitted, reflected or scattered from the one or more assay spots and to create a two dimensional intensity map of the one or more assay spots comprising a two dimensional array of quantitative pixel values; and a processor configured to correct the intensity map to remove noise through analysis of corresponding pixel values from an earlier intensity map; wherein the analysis includes curve fitting.

    IMPROVEMENTS IN OR RELATING TO AN APPARATUS FOR IMAGING
    6.
    发明申请
    IMPROVEMENTS IN OR RELATING TO AN APPARATUS FOR IMAGING 审中-公开

    公开(公告)号：WO2022008931A1

    公开(公告)日：2022-01-13

    申请号：PCT/GB2021/051768

    申请日：2021-07-09

    Applicant: VIDYA HOLDINGS LTD

    Inventor： DORRESTIJN, Marko ,  KLUG, David R. ,  BASIT, Hajra ,  VAN WORKUM, Stefan Leo

    IPC: G01N21/51 ,  G01N21/64 ,  G01N21/65 ,  G01N33/543

    Abstract: An apparatus for imaging a plurality of assay spots is provided. The apparatus comprising a plurality of assay spots deposited onto a substrate, each assay spot comprising one or more capture components and/or one or more detection reagents; and a total internal reflection excitation microscope comprising a light source for illuminating the assay spots; a lens system is configured to launch light towards the substrate and to collect the emitted, reflected or scattered light from the assay spots, wherein the lens system comprises an objective lens; and a detector configured to detect the collected emitted, reflected or scattered light from the lens system, wherein the detector is further configured to image multiple assay spots simultaneously within a field of view.

    DUAL WAVELENGTH NANOPARTICLE DETECTION
    8.
    发明申请
    DUAL WAVELENGTH NANOPARTICLE DETECTION 审中-公开

    公开(公告)号：WO2021123801A1

    公开(公告)日：2021-06-24

    申请号：PCT/GB2020/053279

    申请日：2020-12-18

    Applicant: VIDYA HOLDINGS LTD

    Inventor： VAN WORKUM, Stefan Leo ,  TUREK, Vladimir Alexander ,  DORRESTIJN, Marko ,  KLUG, David R. ,  SMITH, Callum Robertson

    IPC: B82Y15/00 ,  B82Y30/00 ,  G01N21/552 ,  B82Y20/00 ,  G01N21/554

    Abstract: The present invention provides a method for detecting a plasmonic nanoparticle label. The method for detecting a plasmonic nanoparticle label comprising: illuminating a sample with first and second beams of electromagnetic radiation having first and second frequencies, respectively; wherein the sample is located in a first optical medium on a surface defining a boundary between the first optical medium and a second optical medium having a higher refractive index; measuring the intensity of the radiation at the first and second frequencies after the first and second beams have traversed the sample; detecting the presence of a plasmonic nanoparticle label in the circumstances that the intensity differential between the first beam and the first traversed beam is greater than the intensity differential between the second beam and the second traversed beam; wherein the first frequency is a known plasmon resonance frequency of the nanoparticle, and wherein the second frequency is an off-resonance frequency of the nanoparticle; and wherein the step of illuminating the sample comprises directing the first and second beams at the sample through the second optical medium at an angle of incidence to the surface which is above the critical angle for total internal reflection.

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