Abstract:
A novel method of connecting and operating an NVM transistor (13, 15, 17, 19, 21) in the switching circuit is provided. A full voltage signal can be switched across an NVM transistor. The device is turned on prior to the signal switching and the electrical characteristics of the NVM device relative to the associated circuitry is carefully regulated to prevent the source-drain voltage from rising above a preselected maximum voltage (e.g. 1v). Two embodiments of the present invention are described. In the first embodiment, the relative impedances of the NVM transistor and its driving circuit are controlled. The driver circuit and the NVM transistor switch act as a resistor divider circuit with a percentage of the full switching voltage appearing across the NVM transistor and the driver circuit according to their relative impedances. The second embodiment is applicable when the NVM transistor switch drives a capacitive load (40).
Abstract:
A programmable interconnect which closely integrates an independent switching transistor (40) with separate NVM programming and erasing elements. The programming element is an EPROM transistor (32), and the erasing element is a Fowler-Nordheim tunneling device (31). A unitary floating gate (28) is shared by the switching transistor, the NVM programming elements and the erasing elements. The shared floating gate structure (28) is the memory structure of the integrated programmable interconnect and controls the impedance of the switching transistor (40).
Abstract:
A field programmable device includes two separate and electrically isolated arrays (11 and 60) of rows and columns of conductors sharing the same area of an integrated circuit substrate, one array (11) interconnecting memory cells to form a random access memory (78) ("RAM"). The other array (60) forms a full or partial cross-point switching network (65) that is controlled by information stored in memory cells, and/or connects to an operating electronic circuit (66) that is configurable and operable in accordance with information stored in memory cells. In addition, the memory array (11) is easily used to access desired modes of the circuit array (60) in order to be able to easily observe internal signals during operation. A preferred memory structure is a dynamic random access memory ("DRAM") because of a high density and low cost of existing DRAM fabrication techniques, even though periodic reading and refreshing of the states of the memory cells is required. Several circuits (21, 25 and 41) and techniques are used which allow continuous assertion of the memory cell states without interruption during their refreshing cycles.
Abstract:
An array of programmable interconnect cells, each cell having a floating gate as the gate of an MOS switch transistor which programmably connects or disconnects nodes, is used in an FPGA. The floating gate (15G) of each cell, which is capacitively coupled to a control gate (53), is programmed by Fowler-Nordheim tunneling through an tunneling oxide (31G) above a programming/erase line (41) in the integrated circuit substrate (40). Contiguous and parallel to the programming/erase line is at least one tunneling control line (71A, B) which forms a PN junction in close proximity to the programming/erase line region under the tunneling oxide. Under reverse bias, a deep charge depletion region is formed in the programming/erase line region to block tunneling. In this manner, a selected cell can be programmed/erased, while the non-selected cells are not.
Abstract:
The present invention provides for an FPGA integrated circuit having an array of logic cells (10) and interconnect lines (X1, X2, X3) interconnected by programmable switches (24-29), each formed from a nonvolatile memory cell. The logic cell (10) is designed to provide logic or memory functions according to the setting of programmable switches (30-33) within the cell. The logic cells in the array are interconnectable by a hierarchy of local, long and global wiring segments. The interconnections are made by the setting of programmable switches between wiring segments.