Invention Grant
- Patent Title: Method of performing X-ray spectroscopy and X-ray absorption spectrometer system
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Application No.: US15927520Application Date: 2018-03-21
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Publication No.: US10416099B2Publication Date: 2019-09-17
- Inventor: Wenbing Yun , Srivatsan Seshadri , Sylvia Jia Yun Lewis , Janos Kirz , Alan Francis Lyon , Benjamin Donald Stripe
- Applicant: Sigray, Inc.
- Applicant Address: US CA Concord
- Assignee: Sigray, Inc.
- Current Assignee: Sigray, Inc.
- Current Assignee Address: US CA Concord
- Agency: Knobbe, Martens, Olson & Bear, LLP
- Main IPC: G01N23/00
- IPC: G01N23/00 ; G01N23/085 ; G21K1/06 ; H01J35/02 ; H01J35/10 ; H01J35/12

Abstract:
A method for performing x-ray absorption spectroscopy and an x-ray absorption spectrometer system to be used with a compact laboratory x-ray source to measure x-ray absorption of the element of interest in an object with both high spatial and high spectral resolution. The spectrometer system comprises a compact high brightness laboratory x-ray source, an optical train to focus the x-rays through an object to be examined, and a spectrometer comprising a single crystal analyzer (and, in some embodiments, also a mosaic crystal) to disperse the transmitted beam onto a spatially resolving x-ray detector. The high brightness/high flux x-ray source may have a take-off angle between 0 and 105 mrad. and be coupled to an optical train that collects and focuses the high flux x-rays to spots less than 500 micrometers, leading to high flux density. The coatings of the optical train may also act as a “low-pass” filter, allowing a predetermined bandwidth of x-rays to be observed at one time while excluding the higher harmonics.
Public/Granted literature
- US20190011379A1 METHOD OF PERFORMING X-RAY SPECTROSCOPY AND X-RAY ABSORPTION SPECTROMETER SYSTEM Public/Granted day:2019-01-10
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