Invention Grant
- Patent Title: Short circuit detecting device of stacked memory chips and method thereof
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Application No.: US16106127Application Date: 2018-08-21
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Publication No.: US10509070B2Publication Date: 2019-12-17
- Inventor: Won-Joo Yun , Sukyong Kang , Hye-Seung Yu , Hyunui Lee
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Agency: Harness, Dickey and Pierce, P.L.C.
- Priority: KR10-2016-0010749 20160128
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G01R31/02 ; G01R31/26 ; H01L21/66 ; H01L25/065 ; H03K17/687 ; G11C29/00 ; G11C29/02 ; G11C29/50 ; G11C5/02
Abstract:
Disclosed are a method and a device for detecting a short circuit between adjacent micro-bumps. The method includes setting outputs of a pull-up driver and a pull-down driver of a data output circuit connected with a micro-bump to be suitable for a test type and determining whether a short circuit is generated.
Public/Granted literature
- US20180356458A1 SHORT CIRCUIT DETECTING DEVICE OF STACKED MEMORY CHIPS AND METHOD THEREOF Public/Granted day:2018-12-13
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