Invention Grant
- Patent Title: In-field system testing
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Application No.: US15636762Application Date: 2017-06-29
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Publication No.: US10859627B2Publication Date: 2020-12-08
- Inventor: Sreejit Chakravarty , Oscar Mendoza , Ramasubramanian Rajamani , Bryan J. Gran , Sorin Iacobovici , Neel Shah , Michael Neve de Mevergnies , John Cruz Mejia , Amy L. Santoni
- Applicant: Intel Corporation
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Alliance IP, LLC
- Main IPC: G01R31/317
- IPC: G01R31/317 ; H04L12/26 ; G01R31/26 ; H04L12/24 ; G01R31/28

Abstract:
A processor, including: a core; system test circuitry, the system test circuitry to be locked during operational processor operation; reset circuitry including a kick-off test (KOT) input, the reset circuitry to detect a reset with the KOT input asserted, and to initiate an in-field system test (IFST) mode; a test interface controller to receive in IFST mode an encrypted test packet having a signature, verify the signature of the test packet, and decrypt the test packet; and IFST control circuitry to cause the system test circuitry to perform an IFST test according to the decrypted test packet and to log or report results.
Public/Granted literature
- US20190004112A1 In-Field System Testing Public/Granted day:2019-01-03
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