Invention Grant
- Patent Title: Direct current measurement of 1/f transistor noise
-
Application No.: US15859244Application Date: 2017-12-29
-
Publication No.: US11249130B2Publication Date: 2022-02-15
- Inventor: Yuguo Wang , Steven Loveless , Tathagata Chatterjee , Jerry Doorenbos
- Applicant: TEXAS INSTRUMENTS INCORPORATED
- Applicant Address: US TX Dallas
- Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee Address: US TX Dallas
- Agent Andrew R. Ralston; Charles A. Brill; Frank D. Cimino
- Main IPC: G01R31/26
- IPC: G01R31/26

Abstract:
A system comprises a noise generator circuit and a noise envelope detector circuit. The noise generator circuit comprises a first amplifier including a single transistor pair that is operable to generate 1/f noise, an output amplifier coupled to the first amplifier and configured to generate a 1/f noise signal as a function of the 1/f noise. The noise envelope detector circuit comprises a low pass filter operable to pass low frequency signals of the 1/f noise signal as a filtered 1/f noise signal, and a second amplifier or a comparator coupled to the low pass filter and operable to output a direct current (DC) voltage signal according to an envelope of the filtered 1/f noise signal, where the DC voltage signal is a function of an envelope of the filtered 1/f noise signal.
Public/Granted literature
- US20190204375A1 DIRECT CURRENT MEASUREMENT OF 1/F TRANSISTOR NOISE Public/Granted day:2019-07-04
Information query