Invention Grant
- Patent Title: Image-based assay using intelligent monitoring structures
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Application No.: US17268663Application Date: 2019-08-16
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Publication No.: US11346764B2Publication Date: 2022-05-31
- Inventor: Stephen Chou , Wei Ding , Wu Chou , Jun Tian , Yuecheng Zhang , Mingquan Wu , Xing Li
- Applicant: Essenlix Corporation
- Applicant Address: US NJ Monmouth Junction
- Assignee: Essenlix Corporation
- Current Assignee: Essenlix Corporation
- Current Assignee Address: US NJ Monmouth Junction
- International Application: PCT/US2019/046971 WO 20190816
- International Announcement: WO2020/055543 WO 20200319
- Main IPC: G06T1/00
- IPC: G06T1/00 ; G01N15/14 ; G06N20/00 ; G01N1/28 ; G06N3/08

Abstract:
The present invention is related to correct the errors in instruments, operation, and others using intelligent monitoring structures and machine learning, and others.
Public/Granted literature
- US20210181086A1 Image-Based Assay Using Intelligent Monitoring Structures Public/Granted day:2021-06-17
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