- Patent Title: Single wavelength reflection for leadframe brightness measurement
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Application No.: US16566140Application Date: 2019-09-10
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Publication No.: US11421981B2Publication Date: 2022-08-23
- Inventor: Hung-Yu Chou , Chien-Hao Wang , Tse-Tsun Chiu , Fu-Kang Lee , Liang-Kang Su
- Applicant: TEXAS INSTRUMENTS INCORPORATED
- Applicant Address: US TX Dallas
- Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee Address: US TX Dallas
- Agent Ronald O. Neerings; Charles A. Brill; Frank D. Cimino
- Main IPC: G01B11/06
- IPC: G01B11/06 ; G01B11/30 ; G01B11/28 ; G01B11/16 ; G01N21/00 ; G01N21/55 ; G01R31/00

Abstract:
A method for evaluating a leadframe surface includes positioning a leadframe on a measurement apparatus at a first predetermined distance relative to an end portion of a light source of an optical sensor; irradiating a predetermined area on a surface of the leadframe with light having a single predetermined wavelength from the light source; receiving, with a light receiver of the optical sensor, reflected light from the predetermined area on the surface of the leadframe, and converting the reflected light into an electric signal; determining a reflection intensity value of the predetermined area on the surface of the leadframe based on the electric signal; and calculating a reflection ratio of the predetermined area on the surface of the leadframe based on the reflection intensity value and a predetermined reference reflection intensity value associated with the light source.
Public/Granted literature
- US20200003548A1 SINGLE WAVELENGTH REFLECTION FOR LEADFRAME BRIGHTNESS MEASUREMENT Public/Granted day:2020-01-02
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