Invention Grant
- Patent Title: Assay detection, accuracy and reliability improvement
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Application No.: US17284083Application Date: 2020-04-06
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Publication No.: US11733151B2Publication Date: 2023-08-22
- Inventor: Stephen Y. Chou , Wu Chou , Xing Li , Hongbing Li , Yuecheng Zhang , Mingquan Wu , Wei Ding , Jun Tian
- Applicant: Essenlix Corporation
- Applicant Address: US NJ Monmouth Junction
- Assignee: Essenlix Corporation
- Current Assignee: Essenlix Corporation
- Current Assignee Address: US NJ Monmouth Junction
- International Application: PCT/US2020/026959 2020.04.06
- International Announcement: WO2020/206464A 2020.10.08
- Date entered country: 2021-04-09
- Main IPC: G01N15/14
- IPC: G01N15/14 ; G06T7/62 ; G06T7/00 ; G06T7/40 ; G06T7/10 ; G06N20/00
Abstract:
The present invention is related to, among other things, the devices and methods that improve the accuracy and reliability of an assay, even when the assay device and/or the operation of the assay device has certain errors, and in some embodiments the errors are random.
Public/Granted literature
- US20210312621A1 ASSAY DETECTION, ACCURACY AND RELIABILITY IMPROVEMENT Public/Granted day:2021-10-07
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