公开(公告)号：US11933720B2

公开(公告)日：2024-03-19

申请号：US17621216

申请日：2020-06-22

Applicant: Essenlix Corporation

Inventor： Stephen Y. Chou ,  Wei Ding ,  Ji Qi ,  Jun Tian ,  Wu Chou ,  Hongbing Li

IPC: G01N21/31 ,  G01N21/03

CPC classification number: G01N21/31 ,  G01N21/03 ,  G01N2021/0346 ,  G01N2021/3129

Abstract: The disclosure provides an apparatus, a device, and methods for improving optical analysis of a thin layer of a sample between two plates, particularly for multiple wavelengths.

公开(公告)号：US11733151B2

公开(公告)日：2023-08-22

申请号：US17284083

申请日：2020-04-06

Applicant: Essenlix Corporation

Inventor： Stephen Y. Chou ,  Wu Chou ,  Xing Li ,  Hongbing Li ,  Yuecheng Zhang ,  Mingquan Wu ,  Wei Ding ,  Jun Tian

IPC: G01N15/14 ,  G06T7/62 ,  G06T7/00 ,  G06T7/40 ,  G06T7/10 ,  G06N20/00

CPC classification number: G01N15/1475 ,  G06N20/00 ,  G06T7/0012 ,  G06T7/10 ,  G06T7/40 ,  G06T7/62 ,  G06T2207/10056 ,  G06T2207/30004 ,  G06T2207/30024 ,  G06T2207/30204

Abstract: The present invention is related to, among other things, the devices and methods that improve the accuracy and reliability of an assay, even when the assay device and/or the operation of the assay device has certain errors, and in some embodiments the errors are random.

公开(公告)号：US20220148177A1

公开(公告)日：2022-05-12

申请号：US17616178

申请日：2020-06-02

Applicant: Essenlix Corporation

Inventor： Wu Chou ,  Hongbing Li ,  Susan Y. Sun ,  Xing Li ,  Wei Ding ,  Stephen Y. Chou

IPC: G06T7/00 ,  G01N1/31 ,  G01N1/28 ,  G01N21/64

Abstract: Among other things, the present invention provides devices and methods that stain a sample simply (e.g. one step) and quickly (e.g.

公开(公告)号：US12007320B2

公开(公告)日：2024-06-11

申请号：US18215302

申请日：2023-06-28

Applicant: Essenlix Corporation

Inventor： Stephen Y. Chou ,  Wu Chou ,  Xing Li ,  Hongbing Li ,  Yuecheng Zhang ,  Mingquan Wu ,  Wei Ding ,  Jun Tian

IPC: G01N15/1433 ,  G06N20/00 ,  G06T7/00 ,  G06T7/10 ,  G06T7/40 ,  G06T7/62

CPC classification number: G01N15/1433 ,  G06N20/00 ,  G06T7/0012 ,  G06T7/10 ,  G06T7/40 ,  G06T7/62 ,  G06T2207/10056 ,  G06T2207/30004 ,  G06T2207/30024 ,  G06T2207/30204

Abstract: The present invention is related to, among other things, the devices and methods that improve the accuracy and reliability of an assay, even when the assay device and/or the operation of the assay device has certain errors, and in some embodiments the errors are random.