Invention Application
US20050178672A1 Polishing method, polishing device, and method of manufacturing semiconductor equipment
审中-公开
抛光方法,抛光装置以及制造半导体设备的方法
- Patent Title: Polishing method, polishing device, and method of manufacturing semiconductor equipment
- Patent Title (中): 抛光方法,抛光装置以及制造半导体设备的方法
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Application No.: US10512205Application Date: 2003-04-22
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Publication No.: US20050178672A1Publication Date: 2005-08-18
- Inventor: Shuzo Sato , Takeshi Nogami , Shingo Takahashi , Naoki Komai , Kaori Tai , Hiroshi Horikoshi , Hiizu Ohtorii
- Applicant: Shuzo Sato , Takeshi Nogami , Shingo Takahashi , Naoki Komai , Kaori Tai , Hiroshi Horikoshi , Hiizu Ohtorii
- Priority: JP2002-121333 20020423
- International Application: PCT/JP03/05108 WO 20030422
- Main IPC: B23H5/08
- IPC: B23H5/08 ; B23H3/04 ; B23H3/08 ; C25D3/16 ; C25D7/00 ; C25F3/02 ; C25F3/22 ; C25F7/00 ; H01L21/304 ; H01L21/306 ; H01L21/3063 ; B23H3/00

Abstract:
The object is to make it possible to pass an electric current to the object of polishing with a stable current density distribution up to the end point of polishing, to use the same plating apparatus, cleaning apparatus and other apparatuses as those conventionally used, and to carry out the conventional manufacturing process flow. A substrate (1) provided with a metallic film (2) and a opposite electrode (3) are disposed oppositely to each other with a predetermined distance therebetween in an electrolytic solution, and an electric current is passed to the metallic film (2) through the electrolytic solution by an anode (4) set out of contact with the metallic film (2), so as to electropolish the metallic film (2). Simultaneously with the electropolishing, wiping is conducted by sliding a pad on the metallic film.
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