- 专利标题: INTEGRATED SENSOR FOR MULTI-DIMENSIONAL SIGNAL ANALYSIS
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申请号: US17190331申请日: 2021-03-02
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公开(公告)号: US20210270740A1公开(公告)日: 2021-09-02
- 发明人: Gerard Schmid , Dajiang Yang , Eric A.G. Webster , Xin Wang , Todd Rearick , Changhoon Choi , Ali Kabiri , Kyle Preston , Brian Reed
- 申请人: Quantum-Si Incorporated
- 申请人地址: US CT Guilford
- 专利权人: Quantum-Si Incorporated
- 当前专利权人: Quantum-Si Incorporated
- 当前专利权人地址: US CT Guilford
- 主分类号: G01N21/64
- IPC分类号: G01N21/64
摘要:
Some aspects relate to an integrated circuit, comprising at least one photodetection region configured to generate charge carriers responsive to incident photons emitted from a sample, at least one charge storage region configured to receive the charge carriers from the photodetection region, and at least one controller configured to obtain information about the incident photons, the information comprising at least one member selected from the group comprising pulse duration and interpulse duration and at least one member selected from the group comprising wavelength information, luminescence lifetime information, and intensity information. In some embodiments, the information comprises at least three, four, and/or five members selected from the group comprising wavelength information, luminescence lifetime information, intensity information, pulse duration information, and interpulse duration information. In some embodiments, the information obtained may be used to identify the sample.
公开/授权文献
- US11719639B2 Integrated sensor for multi-dimensional signal analysis 公开/授权日:2023-08-08
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