Invention Application
- Patent Title: OFF-FOCUS MICROSCOPIC IMAGES OF A SAMPLE
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Application No.: US17783831Application Date: 2020-12-10
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Publication No.: US20230011382A1Publication Date: 2023-01-12
- Inventor: Dan GLUCK , Amir ZAIT , Arnon HOURI YAFIN , Yonatan HALPERIN , Yochay Shlomo ESHEL , Sarah LEVY , Joseph Joel POLLAK , Sharon PECKER , Peretz YAFIN , Dana BENBASSAT , David BRAILOVSKY , Uriyah PUMERANTZ
- Applicant: S.D. Sight Diagnostics Ltd.
- Applicant Address: IL Tel Aviv
- Assignee: S.D. Sight Diagnostics Ltd.
- Current Assignee: S.D. Sight Diagnostics Ltd.
- Current Assignee Address: IL Tel Aviv
- International Application: PCT/IB2020/061728 WO 20201210
- Main IPC: G02B21/00
- IPC: G02B21/00 ; G06T7/00

Abstract:
Apparatus and methods are described use with a bodily sample that contains cells. A microscope (24) is focused, such that a focal plane of the microscope (24) at least approximately coincides with a level at which at least some cells belonging to the sample are at least partially disposed. At least one on-focus microscopic image of the sample, while the focal plane of the microscope (24) approximately coincides with the level. The microscope (24) is focused such that the focal plane of the microscope is offset with respect to the level, at least one off-focus microscopic image of the sample is acquired, while the focal plane of the microscope (24) is offset with respect to the level. A property of at least a portion of the sample is determined, at least partially based upon the on-focus and off-focus images. Other applications are also described.
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