发明授权
US5423285A Process for fabricating materials for ferroelectric, high dielectric constant, and integrated circuit applications 失效
用于制造铁电,高介电常数和集成电路应用材料的工艺

Process for fabricating materials for ferroelectric, high dielectric
constant, and integrated circuit applications
摘要:
A precursor comprising a metal 2-ethylhexanoate in a xylenes solvent is applied to an integrated circuit wafer. The wafer is baked to dry the precursor, annealed to form a layered superlattice material on the wafer, then the integrated circuit is completed. If the metal is titanium, the precursor comprises titanium 2-methoxyethoxide having at least a portion of its 2-methoxyethoxide ligands replaced by 2-ethylhexanoate. If the metal is a highly electropositive element, the solvent comprises 2-methoxyethanol. If the metal is lead, bismuth, thallium, or antimony, 1% to 75% excess metal is included in the precursor to account for evaporation of the oxide during baking and annealing.
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