发明授权
- 专利标题: Method of and system for charged particle beam exposure
- 专利标题(中): 带电粒子束曝光的方法和系统
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申请号: US379712申请日: 1995-01-27
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公开(公告)号: US5546319A公开(公告)日: 1996-08-13
- 发明人: Takamasa Satoh , Hiroshi Yasuda , Junichi Kai , Yoshihisa Oae , Hisayasu Nishino , Kiichi Sakamoto , Hidefumi Yabara , Isamu Seto , Masami Takigawa , Akio Yamada , Soichiro Arai , Tomohiko Abe , Takashi Kiuchi , Kenichi Miyazawa
- 申请人: Takamasa Satoh , Hiroshi Yasuda , Junichi Kai , Yoshihisa Oae , Hisayasu Nishino , Kiichi Sakamoto , Hidefumi Yabara , Isamu Seto , Masami Takigawa , Akio Yamada , Soichiro Arai , Tomohiko Abe , Takashi Kiuchi , Kenichi Miyazawa
- 申请人地址: JPX Kawasaki
- 专利权人: Fujitsu Limited
- 当前专利权人: Fujitsu Limited
- 当前专利权人地址: JPX Kawasaki
- 优先权: JPX6-008849 19940128; JPX6-044473 19940315; JPX6-048301 19940318; JPX6-072286 19940411; JPX6-092065 19940428; JPX6-103998 19940518; JPX6-174642 19940726; JPX6-253952 19941019; JPX6-279474 19941114
- 主分类号: H01J37/153
- IPC分类号: H01J37/153 ; H01J37/302 ; H01J37/317 ; H01J37/00
摘要:
To improve in the throughput of an exposure system, the setting time during a step change in the output of an amplifier is reduced by switching resistance between the amplifier and a deflector, a glitch waveform generated during a step change in the output or a D/A converter at the preceding stage of the amplifier, is anticipated and is canceled out with a correction waveform, after the output of the D/A converter has settled, this output is sample held and the step change is interpolated at a smoothing circuit, the deflection area is increased by positioning a electrostatic deflector offset around the optical axis relative to another electrostatic deflector, the response speed of the main deflection is improved by adding auxiliary deflection coils of one or two turn, and the alignment time is reduced by combining the coordinate conversion in the wafer area and in the chip area. In order to correct the astigmatism of the electromagnetic lens, two stages or coils are provided and an electric current corresponding to the quantity of deflection is supplied to the coils.
公开/授权文献
- US4467210A Electron-beam image transfer device 公开/授权日:1984-08-21
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