发明授权
US06942497B2 Socket assembly for test of integrated circuit, and its integrated circuit and tester
失效
集成电路测试用插座组件及其集成电路和测试仪
- 专利标题: Socket assembly for test of integrated circuit, and its integrated circuit and tester
- 专利标题(中): 集成电路测试用插座组件及其集成电路和测试仪
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申请号: US10748931申请日: 2003-12-30
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公开(公告)号: US06942497B2公开(公告)日: 2005-09-13
- 发明人: Jung-Hoon Oh , Jeong-yang Kim , Young-Soon Lim , Byung-Wook Park , Jung-Mu Lee
- 申请人: Jung-Hoon Oh , Jeong-yang Kim , Young-Soon Lim , Byung-Wook Park , Jung-Mu Lee
- 申请人地址: KR
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人地址: KR
- 代理机构: Mills & Onello LLP
- 优先权: KR10-2003-0003261 20030117
- 主分类号: G01R31/26
- IPC分类号: G01R31/26 ; G01R1/073 ; H01R13/24 ; H01R33/76 ; H01R12/00
摘要:
The socket assembly includes a guide block, a guide part and a pressurizing plate. The guide block is in a terminal region of a test board, the guide block defining an area into which an integrated circuit can be inserted opposite terminals formed on the test board in the terminal region. The guide part is provided on an inner side wall of the guide block, to guide an insertion position of the integrated circuit so that respective leads of the integrated circuit are aligned with the corresponding terminals of the test board. The pressurizing plate is adapted to interface with the guide block, the pressurizing plate including a pressurizing protrusion on a surface thereof, such that when the pressurizing plate is applied to the guide block, the respective leads of the integrated circuit are urged to connect with the corresponding terminals of the test board.
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