公开(公告)号：US06942497B2

公开(公告)日：2005-09-13

申请号：US10748931

申请日：2003-12-30

申请人： Jung-Hoon Oh ,  Jeong-yang Kim ,  Young-Soon Lim ,  Byung-Wook Park ,  Jung-Mu Lee

发明人： Jung-Hoon Oh ,  Jeong-yang Kim ,  Young-Soon Lim ,  Byung-Wook Park ,  Jung-Mu Lee

IPC分类号： G01R31/26 ,  G01R1/073 ,  H01R13/24 ,  H01R33/76 ,  H01R12/00

CPC分类号： G01R1/0466 ,  H01R12/85 ,  H01R2201/20

摘要： The socket assembly includes a guide block, a guide part and a pressurizing plate. The guide block is in a terminal region of a test board, the guide block defining an area into which an integrated circuit can be inserted opposite terminals formed on the test board in the terminal region. The guide part is provided on an inner side wall of the guide block, to guide an insertion position of the integrated circuit so that respective leads of the integrated circuit are aligned with the corresponding terminals of the test board. The pressurizing plate is adapted to interface with the guide block, the pressurizing plate including a pressurizing protrusion on a surface thereof, such that when the pressurizing plate is applied to the guide block, the respective leads of the integrated circuit are urged to connect with the corresponding terminals of the test board.

摘要翻译： 插座组件包括引导块，引导部和加压板。 引导块位于测试板的端子区域中，引导块限定了可以在终端区域中形成在测试板上的相对端子上插入集成电路的区域。 引导部设置在引导块的内侧壁上，以引导集成电路的插入位置，使得集成电路的各个引线与测试板的相应端子对准。 所述加压板适于与所述引导块相接合，所述加压板在其表面上包括加压突起，使得当所述加压板被施加到所述引导块时，所述集成电路的各个引线被迫与所述加压板连接， 相应的测试板端子。

公开(公告)号：US20080136429A1

公开(公告)日：2008-06-12

申请号：US12001960

申请日：2007-12-12

申请人： Young-Soon Lim ,  Jung-Woo Sung ,  Jung-Mu Lee ,  Yeon-Suk Shin

发明人： Young-Soon Lim ,  Jung-Woo Sung ,  Jung-Mu Lee ,  Yeon-Suk Shin

IPC分类号： G01R1/073 ,  H01S4/00

CPC分类号： G01R1/07342 ,  G01R1/06772 ,  Y10T29/49002

摘要： A probe card of a semiconductor test apparatus includes a printed circuit board (PCB) in which a signal wiring and a first ground plate are provided, a needle fixture mounted at the PCB and provided to fix a plurality of needles, a second ground plate provided at the needle fixture, a plurality of signal lines connecting the signal wiring to the plurality of needles corresponding to the signal wiring, a plurality of ground lines connecting the first ground plate to the second ground plate and corresponding to the plurality of signal lines, and a connecting electrode connecting the first ground plate to the second ground plate. A method of fabricating the same is also provided.

摘要翻译： 半导体测试装置的探针卡包括其中设置有信号线和第一接地板的印刷电路板（PCB），安装在PCB上并设置成固定多个针的针固定器，设置有第二接地板 在所述针固定装置处，将信号线与所述信号线对应的多个针连接的多条信号线，将所述第一接地板与所述第二接地板连接并对应于所述多条信号线的多条接地线，以及 将第一接地板连接到第二接地板的连接电极。 还提供了一种制造该方法的方法。