Socket assembly for test of integrated circuit, and its integrated circuit and tester
    1.
    发明授权
    Socket assembly for test of integrated circuit, and its integrated circuit and tester 失效
    集成电路测试用插座组件及其集成电路和测试仪

    公开(公告)号:US06942497B2

    公开(公告)日:2005-09-13

    申请号:US10748931

    申请日:2003-12-30

    摘要: The socket assembly includes a guide block, a guide part and a pressurizing plate. The guide block is in a terminal region of a test board, the guide block defining an area into which an integrated circuit can be inserted opposite terminals formed on the test board in the terminal region. The guide part is provided on an inner side wall of the guide block, to guide an insertion position of the integrated circuit so that respective leads of the integrated circuit are aligned with the corresponding terminals of the test board. The pressurizing plate is adapted to interface with the guide block, the pressurizing plate including a pressurizing protrusion on a surface thereof, such that when the pressurizing plate is applied to the guide block, the respective leads of the integrated circuit are urged to connect with the corresponding terminals of the test board.

    摘要翻译: 插座组件包括引导块,引导部和加压板。 引导块位于测试板的端子区域中,引导块限定了可以在终端区域中形成在测试板上的相对端子上插入集成电路的区域。 引导部设置在引导块的内侧壁上,以引导集成电路的插入位置,使得集成电路的各个引线与测试板的相应端子对准。 所述加压板适于与所述引导块相接合,所述加压板在其表面上包括加压突起,使得当所述加压板被施加到所述引导块时,所述集成电路的各个引线被迫与所述加压板连接, 相应的测试板端子。