Invention Grant
- Patent Title: Memory read stability enhancement with short segmented bit line architecture
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Application No.: US15162711Application Date: 2016-05-24
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Publication No.: US09922700B2Publication Date: 2018-03-20
- Inventor: Mahmut Sinangil , Hidehiro Fujiwara , Hung-Jen Liao , Jonathan Tsung-Yung Chang , Yen-Huei Chen , Sahil Preet Singh
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Eschweiler & Potashnik, LLC
- Main IPC: G11C11/00
- IPC: G11C11/00 ; G11C11/419 ; G11C8/12 ; G11C11/412 ; G11C7/16 ; G11C8/16 ; G11C7/18

Abstract:
In some embodiments, a semiconductor memory device includes an array of semiconductor memory cells arranged in rows and columns. The array includes a first segment of memory cells and a second segment of memory cells. A first pair of complementary local bit lines extend over the first segment of memory cells and is coupled to multiple memory cells along a first column within the first segment of memory cells. A second pair of complementary local bit lines extend over the second segment of memory cells and is coupled to multiple memory cells along the first column within the second segment of memory cells. A pair of switches is arranged between the first and second segments of memory cells. The pair of switches is configured to selectively couple the first pair of complementary local bit lines in series with the second pair of complementary local bit lines.
Public/Granted literature
- US20170345485A1 MEMORY READ STABILITY ENHANCEMENT WITH SHORT SEGMENTED BIT LINE ARCHITECTURE Public/Granted day:2017-11-30
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