- 专利标题: Silicon-based quantum dot device
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申请号: US15442113申请日: 2017-02-24
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公开(公告)号: US09941430B2公开(公告)日: 2018-04-10
- 发明人: Aleksey Andreev , David Williams , Ryuta Tsuchiya , Yuji Suwa
- 申请人: HITACHI, LTD.
- 申请人地址: JP Tokyo
- 专利权人: HITACHI, LTD.
- 当前专利权人: HITACHI, LTD.
- 当前专利权人地址: JP Tokyo
- 代理机构: Miles & Stockbridge P.C.
- 优先权: EP16163414 20160331
- 主分类号: H01L29/06
- IPC分类号: H01L29/06 ; H01L31/0352 ; H01L31/028 ; H01L31/024 ; H01L33/06 ; H01L33/34 ; H01L33/64 ; H01L31/112 ; H01L33/00 ; G06N99/00 ; B82Y10/00 ; B82Y20/00
摘要:
A silicon-based quantum dot device (1) is disclosed. The device comprises a substrate (8) and a layer (7) of silicon or silicon-germanium supported on the substrate which is configured to provide at least one quantum dot (51, 52: FIG. 5). The layer of silicon or silicon-germanium has a thickness of no more than ten monolayers. The layer of silicon or silicon-germanium may have a thickness of no more than eight or five monolayers.
公开/授权文献
- US20170288076A1 SILICON-BASED QUANTUM DOT DEVICE 公开/授权日:2017-10-05
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