Invention Application
- Patent Title: CONTACT PAD STRUCTURE AND METHOD OF FORMING THE SAME
-
Application No.: PCT/CN2020/094582Application Date: 2020-06-05
-
Publication No.: WO2021243686A1Publication Date: 2021-12-09
- Inventor: WANG, Di , ZHOU, Wenxi , XIA, Zhiliang , YANG, Yonggang , ZHANG, Kun , ZHANG, Hao , AI, Yiming
- Applicant: YANGTZE MEMORY TECHNOLOGIES CO., LTD.
- Applicant Address: No. 88 Weilai 3rd Road, East Lake High-Tech Development Zone
- Assignee: YANGTZE MEMORY TECHNOLOGIES CO., LTD.
- Current Assignee: YANGTZE MEMORY TECHNOLOGIES CO., LTD.
- Current Assignee Address: No. 88 Weilai 3rd Road, East Lake High-Tech Development Zone
- Agency: NTD UNIVATION INTELLECTUAL PROPERTY AGENCY LTD.
- Main IPC: H01L27/11551
- IPC: H01L27/11551 ; H01L2224/0231 ; H01L2224/02331 ; H01L2224/02333 ; H01L2224/02373 ; H01L2224/02381 ; H01L23/4824 ; H01L24/03 ; H01L24/08 ; H01L24/11 ; H01L27/11519 ; H01L27/11556 ; H01L27/11565 ; H01L27/11582
Abstract:
Aspects of the disclosure provide a semiconductor device and a method for fabricating the same. The method for fabricating the semiconductor device can include forming a stack of alternating first insulating layers and first sacrificial layers over a semiconductor substrate, and forming a staircase in the stack having a plurality of steps, with at least a first step of the staircase including a first sacrificial layer of the first sacrificial layers over a first insulating layer of the first insulating layers. Further, the method can include forming a recess in the first sacrificial layer, forming a second sacrificial layer in the recess, and replacing a portion of the first sacrificial layer and the second sacrificial layer with a conductive material that forms a contact pad.
Information query
IPC分类: