专利检索 ap:("OMNIPROBE INC") AND inv:"HARTFIELD CHERYL" 第 1 页

1.

发明公开
METHOD FOR PROCESSING SAMPLES HELD BY A NANOMANIPULATOR 审中-公开
标题翻译：一种用于在纳操作器样品加工

公开(公告)号：EP2742334A4

公开(公告)日：2015-03-11

申请号：EP12822777

申请日：2012-08-08

申请人： OMNIPROBE INC

发明人： HARTFIELD CHERYL , MOORE THOMAS , MILLER BRIAN

IPC分类号： G01N1/32 , B82Y10/00 , B82Y40/00 , G01B9/04 , G01N1/28 , G02B21/32 , H01J37/20

CPC分类号： G01N1/32 , B82Y10/00 , B82Y40/00 , G01N1/286 , G01N2001/2886 , G02B21/32 , H01J37/20 , H01J2237/0216 , H01J2237/208 , H01J2237/31745

2.

发明公开
METHOD FOR SAMPLE SEPARATION AND LIFT-OUT 有权
标题翻译：方法样品分离并提起-OUT

公开(公告)号：EP1436601A4

公开(公告)日：2008-10-15

申请号：EP01945982

申请日：2001-05-23

申请人： OMNIPROBE INC

发明人： MOORE THOMAS M , KRUGER ROCKY D , HARTFIELD CHERYL

IPC分类号： G01N21/86 , G01N1/28 , H01J37/31 , H01L21/00

CPC分类号： G01N1/286 , H01J37/3056 , H01J37/31 , H01J2237/31745 , H01L21/67092

摘要： When a desired portion (110) is separated from an integrated circuit chip or a semiconductor wafer (100), the portion is separated so that the resulting sample can be moved to a location for examination by TEM, SEM or other means. A sample portion of the chip or wafer containing an area of interest is separated with a single cut by a focused ion-beam (160). Prior to separation, the sample is fixed to a micromanipulator probe (120). The sample is moved by the probe to the location for examination and fixed there. The probe is then detached form the sample by the focused ion-beam.

3.

发明公开
METHOD FOR ACQUIRING SIMULTANEOUS AND OVERLAPPING OPTICAL AND CHARGED PARTICLE BEAM IMAGES 审中-公开
标题翻译： VERFAHREN ZUM ERFASSEN SIMULTANER UNDÜBERLAPPENDERBILDER OPTISCHER UND GELADENER PARTIKELSTRAHLEN

公开(公告)号：EP2601477A4

公开(公告)日：2017-07-05

申请号：EP11815181

申请日：2011-08-02

申请人： OMNIPROBE INC

发明人： MOORE THOMAS , HARTFIELD CHERYL , MAGEL GREGORY

IPC分类号： G01B11/00 , G01B9/04 , G01N23/225 , H01J37/26

CPC分类号： H01J37/28 , G01N23/2251 , G01N2223/10 , G01N2223/418 , G02B21/002 , G02B21/367 , H01J37/228 , H01J2237/2445

4.

发明公开
GAS INJECTION SYSTEM FOR ENERGETIC-BEAM INSTRUMENTS 审中-公开
标题翻译：食品科技有限公司FÜRINSTRUMENTE MIT ENERGETISCHEM STRAHL

公开(公告)号：EP2872669A4

公开(公告)日：2016-03-23

申请号：EP13817088

申请日：2013-04-15

申请人： OMNIPROBE INC

发明人： KRUGER ROCKY , SMITH AARON , HARTFIELD CHERYL

IPC分类号： H01J37/02 , C23C16/448 , C23C16/48 , C23C16/52 , C23C16/56

CPC分类号： H01J37/08 , C23C16/448 , C23C16/48 , C23C16/52 , C23C16/56 , G01N1/28 , H01J37/02 , H01J2237/006 , H01J2237/317 , Y10T137/0329 , Y10T137/0352

5.

发明公开
METHOD FOR EXTRACTING FROZEN SPECIMENS AND MANUFACTURE OF SPECIMEN ASSEMBLIES 审中-公开
标题翻译：提取冷冻样品的方法和样本安排生产

公开(公告)号：EP2694941A4

公开(公告)日：2015-03-04

申请号：EP12768369

申请日：2012-04-04

申请人： OMNIPROBE INC

发明人： HARTFIELD CHERYL

IPC分类号： G02B21/34 , G01N1/04 , G01N1/32 , G01N1/42 , G02B21/32 , H01J37/20 , H01J37/305 , H01J37/31

CPC分类号： F25D3/107 , G01N1/42 , H01J37/20 , H01J2237/2002 , H01J2237/208 , H01J2237/31745

摘要： A method for attaching a frozen specimen to a manipulator probe tip typically inside a charged-particle beam microscope. The method comprises cooling the probe tip to a temperature at or below that of the frozen specimen, where the temperature of the frozen specimen is preferably at or below the vitrification temperature of water; bringing the probe tip into contact with the frozen specimen, and bonding the probe tip to the frozen specimen by flowing water vapor onto the region of contact between the probe tip and the frozen specimen. The bonded probe tip and specimen may be moved to a support structure such as a TEM grid and bonded to it by similar means. The probe tip can then be disconnected by heating the probe tip or applying a charged-particle beam.