OPTICAL DETECTOR MODULE, MEASUREMENT SYSTEM AND METHOD OF DETECTING PRESENCE OF A SUBSTANCE IN A TEST MATERIAL
    2.
    发明公开
    OPTICAL DETECTOR MODULE, MEASUREMENT SYSTEM AND METHOD OF DETECTING PRESENCE OF A SUBSTANCE IN A TEST MATERIAL 审中-公开
    检测材料存在的光学检测器模块,测量系统和方法

    公开(公告)号:EP3194932A2

    公开(公告)日:2017-07-26

    申请号:EP15775709.7

    申请日:2015-10-07

    Abstract: Embodiments of the invention comprise apparatus and methods for detecting the presence of a substance in a test material using a plurality of wavelength-specific couplers (e.g. tilted fibre gratings) which provide a spatially distributed multi-node all-optical measurement system. Each node of the measurement system can comprise an optical module that is sensitive to the intensity of a limited band of wavelengths. The node is thus capable of detecting the presence of an absorption peak in a spectrum without having to obtain the full spectrum. By providing a plurality of optical modules that are sensitive to different wavelengths, the spectral signature of different substances may be monitored without having to measure full spectra. The measurement system may be particularly useful in a process control environment where it is desirable to take measurements of one or more substances in different locations.

    Abstract translation: 本发明的实施例包括用于使用提供空间分布式多节点全光学测量系统的多个波长专用耦合器(例如,倾斜光纤光栅)来检测测试材料中物质的存在的装置和方法。 测量系统的每个节点可以包括对有限波长带的强度敏感的光学模块。 节点因此能够检测谱中吸收峰的存在而不必获得全谱。 通过提供对不同波长敏感的多个光学模块,可以监测不同物质的光谱特征,而不必测量全光谱。 测量系统在过程控制环境中特别有用,其中期望测量一个或多个物质在不同位置。

    QUANTUM-YIELD MEASUREMENT DEVICE
    3.
    发明公开
    QUANTUM-YIELD MEASUREMENT DEVICE 有权
    量子产量测量装置

    公开(公告)号:EP2647980A4

    公开(公告)日:2017-04-12

    申请号:EP11844471

    申请日:2011-08-31

    Inventor: IGUCHI KAZUYA

    CPC classification number: G01N21/645 G01N2201/065

    Abstract: A quantum-yield measurement device 1 measures a quantum yield of a sample S by irradiating a sample container 3 of a sample cell 2 for containing the sample S with pumping light L1 and detecting light to be measured L2 emitted from at least one of the sample S and sample container 3. The quantum-yield measurement device 1 comprises a dark box 5 for arranging therein the sample container 3; a light generation unit, having a light exit part 7 connected to the dark box 5, for generating the pumping light L1; a light detection unit, having a light entrance part 11 connected to the dark box 5, for detecting the light to be measured L2; an integrating sphere 14, arranged within the dark box 5, having a light entrance opening 15 for the pumping light L1 to enter and a light exit opening 16 for the light to be measured L2 to exit; and a movement mechanism 30 for moving the integrating sphere 14 within the dark box 5 such that the sample container 3 attains each of a first state of being located inside of the integrating sphere 14 and a second state of being located outside of the integrating sphere 14 and, causing the light entrance opening 15 to oppose the light exit part 7 and causing the light exit opening 16 to oppose the light entrance part 11, in the first state.

    SPECTRUM MEASURING DEVICE AND SPECTRUM MEASURING METHOD
    5.
    发明公开
    SPECTRUM MEASURING DEVICE AND SPECTRUM MEASURING METHOD 审中-公开
    SPEKTRUMSMESSVORRICHTUNG UND SPEKTRUMSMESSVERFAHREN

    公开(公告)号:EP2952882A1

    公开(公告)日:2015-12-09

    申请号:EP13873653.3

    申请日:2013-09-17

    Abstract: A spectral measurement apparatus includes a light source for generating a excitation light; an integrator having an input opening portion and an output opening portion; a housing portion arranged in the integrator and for housing a sample; an incidence optical system for making the excitation light incident to the sample; a photodetector for detecting a light to be measured output from the output opening portion; and an analysis means for calculating a light absorptance of the sample, based on a detection value detected by the photodetector, and an irradiation area with the excitation light at a position of incidence to the sample is set larger than an irradiated area of the sample, and the analysis means performs an area ratio correction regarding the irradiation area with the excitation light and the irradiated area of the sample, with respect to the light absorptance calculated.

    Abstract translation: 光谱测量装置包括用于产生激发光的光源; 积分器,具有输入开口部分和输出开口部分; 布置在积分器中并用于容纳样品的壳体部分; 用于使激发光入射到样品的入射光学系统; 用于检测从输出开口部分输出的被测光的光电检测器; 以及分析装置,用于基于由光电检测器检测的检测值来计算样品的光吸收率,并且将入射到样品的位置处的激发光的照射面积设定为大于样品的照射面积, 并且分析装置相对于计算的光吸收率执行关于具有激发光的照射区域和样品的照射面积的面积比率校正。

    DISPOSITIF DE PHOTO REFLECTANCE
    6.
    发明公开

    公开(公告)号:EP2932236A1

    公开(公告)日:2015-10-21

    申请号:EP13802946.7

    申请日:2013-12-09

    CPC classification number: G01B11/303 G01N21/1717 G01N2021/1725 G01N2201/065

    Abstract: The invention concerns a photoreflectance device (1) for characterising a rough surface comprising: - Means (2) for emitting a pump beam (3); - Means (8) for emitting a probe beam (11); - Means (14) for detecting the probe beam reflected by the surface; - An integrating sphere (13) capable of collecting the probe beam reflected by the surface, the integrating sphere comprising: - a first output (15) connected to the detection means (14), and disposed so as to receive a majority of the probe beam (11) reflected by the surface (4); - a second output (16) arranged so as to receive a majority of the pump beam (3) reflected by the surface.

    Abstract translation: 本发明涉及一种用于表征粗糙表面的光反射装置(1),包括: - 用于发射泵浦光束(3)的装置(2); - 用于发射探测光束(11)的装置(8); - 用于检测由表面反射的探测光束的装置(14) - 能够收集由所述表面反射的探测光束的积分球(13),所述积分球包括: - 连接到所述检测装置(14)的第一输出端(15),并且布置成接收大部分所述探针 由表面(4)反射的光束(11); - 第二输出(16),其布置成接收由表面反射的大部分泵浦光束(3)。

    QUANTUM-YIELD MEASUREMENT DEVICE
    8.
    发明公开
    QUANTUM-YIELD MEASUREMENT DEVICE 有权
    量子产量测量装置

    公开(公告)号:EP2647980A1

    公开(公告)日:2013-10-09

    申请号:EP11844471.0

    申请日:2011-08-31

    Inventor: IGUCHI Kazuya

    CPC classification number: G01N21/645 G01N2201/065

    Abstract: A quantum-yield measurement device 1 measures a quantum yield of a sample S by irradiating a sample container 3 of a sample cell 2 for containing the sample S with pumping light L1 and detecting light to be measured L2 emitted from at least one of the sample S and sample container 3. The quantum-yield measurement device 1 comprises a dark box 5 for arranging therein the sample container 3; a light generation unit, having a light exit part 7 connected to the dark box 5, for generating the pumping light L1; a light detection unit, having a light entrance part 11 connected to the dark box 5, for detecting the light to be measured L2; an integrating sphere 14, arranged within the dark box 5, having a light entrance opening 15 for the pumping light L1 to enter and a light exit opening 16 for the light to be measured L2 to exit; and a movement mechanism 30 for moving the integrating sphere 14 within the dark box 5 such that the sample container 3 attains each of a first state of being located inside of the integrating sphere 14 and a second state of being located outside of the integrating sphere 14 and, causing the light entrance opening 15 to oppose the light exit part 7 and causing the light exit opening 16 to oppose the light entrance part 11, in the first state.

    Abstract translation: 量子产率测量装置1通过用泵浦光L1照射用于容纳样品S的样品池2的样品容器3并且检测从至少一个样品发射的待测量的光L2来测量样品S的量子产率 S和样本容器3.量子产率测量装置1包括用于在其中布置样本容器3的暗盒5; 具有连接至暗盒5的光出射部分7的光产生单元,用于产生泵浦光L1; 光检测单元,具有连接至暗盒5的光入射部分11,用于检测待测光L2; 设置在暗箱5内的积分球14,积分球14具有用于泵浦光L1进入的光入口15和用于待测量的光L2出射的光出口16; 以及移动机构30,用于使积分球14在暗箱5内移动,使得样本容器3达到位于积分球14内侧的第一状态和位于积分球14外侧的第二状态 在第一状态下使光入射开口15与光出射部7相对并使光出射开口16与光入射部11相对。

    SPECTROMETER
    10.
    发明公开
    SPECTROMETER 有权
    光谱仪

    公开(公告)号:EP2320212A1

    公开(公告)日:2011-05-11

    申请号:EP09834591.1

    申请日:2009-09-24

    Abstract: A spectrometer is provided with an integrating sphere 20, inside which a sample S of a measurement target is disposed and which is adapted for observing measured light emitted from the sample S, and a Dewar vessel 50 which retains a refrigerant R for cooling the sample S and at least a portion of which is located so as to face the interior of the integrating sphere 20. Gas generated from the refrigerant R is introduced through predetermined gaps G1-G6 functioning as a gas introduction path and through a plurality of communicating passages 64 formed in a support pedestal 61, into the integrating sphere 20. The gas introduced into the integrating sphere 20 absorbs water in the integrating sphere 20 to decrease the temperature in the integrating sphere 20, so as to prevent dew condensation from occurring on a portion of a second container portion 50b of the Dewar vessel 50 exposed in the integrating sphere 20. This can prevent occurrence of dew condensation even in the case where the sample S is measured in a cooled state at a desired temperature.

    Abstract translation: 光谱仪设置有积分球20,测量对象的样品S设置在其内,并且适于观察从样品S发射的测量光;以及杜瓦容器50,其保留用于冷却样品S的制冷剂R 并且其至少一部分位于积分球20的内部。从制冷剂R产生的气体通过用作气体引入路径的预定间隙G1-G6并且通过形成的多个连通通道64被引入 在支撑基座61中,进入积分球20.引入积分球20的气体吸收积分球20中的水,以降低积分球20中的温度,以防止在一部分的一部分上发生结露 第二容器部分50b暴露在积分球20中,这样可防止出现结露,即使在槽 在冷却状态下在期望温度下测量。

Patent Agency Ranking