Abstract:
Various embodiments disclosed herein describe an infrared (IR) imaging system for detecting a gas. The imaging system can include an optical filter that selectively passes light having a wavelength in a range of 1585 nm to 1595 nm while attenuating light at wavelengths above 1600 nm and below 1580 nm. The system can include an optical detector array sensitive to light having a wavelength of 1590 that is positioned rear of the optical filter.
Abstract:
A light detection device includes a Fabry-Perot interference filter provided with a light transmitting region on a predetermined line, a light detector disposed on one side with respect to the Fabry-Perot interference filter on the line, a package having an opening positioned on the other side with respect to the Fabry-Perot interference filter on the line, a light transmitting member provided in the package such that the opening is blocked, and a temperature control element having an endothermic region thermally connected to the Fabry-Perot interference filter and the light detector. The endothermic region is positioned on one side with respect to the light detector on the line.
Abstract:
A spectrometer 1A includes a light detection element 20 provided with a light passing part 21, a first light detection part 22, and a second light detection part 26, a support 30 fixed to the light detection element 20 such that a space S is formed, a first reflection part 11 provided in the support 30 and configured to reflect light L1 passing through the light passing part 21 in the space S, a second reflection part 12A provided in the light detection element 20 and configured to reflect the light L1 reflected by the first reflection part 11 in the space S, and a dispersive part 40A provided in the support 30 and configured to disperse and reflect the light L1 reflected by the second reflection part 12A to the first light detection part 22 in the space S. A plurality of second light detection parts 26 is disposed in a region surrounding the second reflection part 12A.
Abstract:
Frequency registration deviations occurring during a scan of a frequency or wavelength range by a spectroscopic analysis system can be corrected using passive and/or active approaches. A passive approach can include determining and applying mathematical conversions to a recorded field spectrum. An active approach can include modifying one or more operating parameters of the spectroscopic analysis system to reduce frequency registration deviation.
Abstract:
A photodetector compensating circuit (110) is proposed. The photodetector compensating circuit (110) comprises: - at least one photoconductor (112) having an electrical conductivity dependent on an illumination (114) of a light-sensitive region (116) of the photoconductor (112); - at least one transimpedance amplifier (118), wherein the transimpedance amplifier (118) comprises at least one inverting operational amplifier (120) and one or both of at least one feedback resistor (122) having a resistance R F or at least one feedback capacitor (126) having a capacity C F .
Abstract:
A method for determining spectral calibration data (λcal(Sd), Sd,cal(λ)) of a Fabry-Perot interferometer (100) comprises: forming a spectral notch (NC2) by filtering input light (LB1) with a notch filter (60) such that the spectral notch (NC2) corresponds to a transmittance notch (NC1) of the notch filter (60), measuring a spectral intensity distribution (M(Sd)) of the spectral notch (NC2) by varying the mirror gap (dFP) of the Fabry-Perot interferometer (100), and by providing a control signal (Sd) indicative of the mirror gap (dFP), and determining the spectral calibration data (λcal(Sd), Sd,cal(λ)) by matching the measured spectral intensity distribution (M(Sd)) with the spectral transmittance (TN(λ)) of the notch filter (60).
Abstract:
System and method for sensor alignment. In one example, a reimaging optical system includes reimaging foreoptics positioned to receive and reimage incident electromagnetic radiation to produce an intermediate image plane and output an optical beam of the received incident electromagnetic radiation, an imaging optical apparatus positioned to receive the optical beam and focus the electromagnetic radiation of the optical beam onto a first focal plane, a first imaging sensor positioned at the first focal plane and configured to produce a first image responsive to receiving the electromagnetic radiation of the optical beam, an alignment object selectively positioned at the intermediate image plane and configured to superimpose an alignment tool upon the first image, and a controller coupled to the first imaging sensor and configured to perform an alignment process for the first imaging sensor based on at least a position of the alignment tool in the first image.
Abstract:
A mirror plate (100) for a Fabry-Perot interferometer (300) comprises: - a substrate (50), which comprises silicon (Si), - a semi-transparent reflective coating (110) implemented on the substrate (50), - a de-coupling structure (DC1) formed on the substrate (50), - a first sensor electrode (G1a) formed on top of the de-coupling structure (DC1), and - a second sensor electrode (G1b), wherein the de-coupling structure (DC1) comprises an electrically insulating layer (60a), and a first stabilizing electrode (G0a), which is located between the first sensor electrode (G1a) and the substrate (50).