Abstract:
An apparatus uses reflectance spectrophotometry to characterize a sample (16) having any number of thin films. The apparatus uses two toroidal mirrors (33, 34) in an optical relay to direct light reflected by the sample (16) to a spectrophotometer (26). A computer then analyzes the reflected spectrum to characterize the optical properties of the sample (16). The optical relay allows a range of angles of reflection from the sample (16), and has no chromatic aberration. The optical relay is also arranged so that the non-chromatic aberration is minimized. The sample (16) is mounted on a movable stage (14) so that different areas of the sample (16) may be characterized. Furthermore, a deflector (24) and a viewer (28) are used to allow the operator of the apparatus to view the region of the sample (16) under study.
Abstract:
The invention relates to a method for imaging hand and/or finger lines with a camera which functions without contacting the skin with the recording device. By using linear or circular polarized light in the illuminating and imaging beam path, a separate representation of the upper and lower skin pattern is made possible. In doing this, an image of the skin relief which is rich in contrast is obtained. In addition, the information regarding the deeper lying skin layers through which blood flows can be obtained. An algorithm searches the skin pattern of the hand surface for line elements of different thicknesses and direction (vectors). The calculated numeric identification contains total frequencies of occurrence of vectors, amplitudes and phases of harmonic components of projections of vector images of both patterns. The method makes it possible to identify people from a distance, to completely protect the measuring device and to provide an improved security against deception.
Abstract:
Methods and apparatus for screening diverse arrays of materialsa nd for imaging a library of materials are provided using ultrasonic imaging techniques. Systems include tranducer lens (109) or mechanical resonator for exiting an element of library deposited onto a substrate (103) such that acoustic waves are propagated through, and from, the library element (101). The acoustic waves propagated from the element are detected and processed to yield a visual image of the library element; such acoustic wave data is processed to obtain information about various properties of the library elements (e.g. elasticity, molecular weight, viscosity, specific weight, dielectric properties, conductivity, etc.) of individual liquid elements. Acoustic waves are generated in an imaging tank filled with coupling liquid (107), with the library of materials then placed in the tank while the surface of the coupling liquid is scanned with a laser beam. The physical structure of the liquid surface distubed by these acoustic waves is recorded.
Abstract:
Methods and apparatus for screening diverse arrays of materialsa nd for imaging a library of materials are provided using ultrasonic imaging techniques. Systems include tranducer lens (109) or mechanical resonator for exiting an element of library deposited onto a substrate (103) such that acoustic waves are propagated through, and from, the library element (101). The acoustic waves propagated from the element are detected and processed to yield a visual image of the library element; such acoustic wave data is processed to obtain information about various properties of the library elements (e.g. elasticity, molecular weight, viscosity, specific weight, dielectric properties, conductivity, etc.) of individual liquid elements. Acoustic waves are generated in an imaging tank filled with coupling liquid (107), with the library of materials then placed in the tank while the surface of the coupling liquid is scanned with a laser beam. The physical structure of the liquid surface distubed by these acoustic waves is recorded.
Abstract:
An apparatus (10) comprises an optical filter (12), which resolves electromagnetic radiation into a sequence of resolved polarization components, an imaging device (14), having a storage device (16), and a driver (18). The imaging device (14) receives the sequence of resolved polarization components from the optical filter (12) and stores them in the storage device (16). The driver (18), which receives the video synchronization signal, produces a filter synchronization signal which is provided to the optical filter (12) to cause the optical filter (12) to produce the sequence of resolved polarization components so the optical filter (12) is in synchronization with the imaging device (14). This apparatus (10) is used to view the polarization properties of a scene.
Abstract:
The invention concerns an optical component of polarizing modulation, a polarimeter and a Mueller ellipsometer comprising this optical component. The optical component modulates an incident light beam (10) linearly polarized and sends back a modulated beam (11). It comprises a coupled phase modulator (6B) modulating twice successively the incident beam, the two modulations being at the same frequency φ/2π and being coupled by a system (61) modifying the state of polarization of the light between the two modulations. The ellipsometer comprises means for sensing a measuring beam sent back by a sample, which receives the modulated beam, and a processing unit. The sensing means include a polarimeter generating n measured quantities representing the states of polarization of the beam and the processing unit generates by Fourier transform m values for each of these quantities, with n x m ≥ 16 and m ≥ 4, for simultaneously acceding to the sixteen coefficients of the Mueller matrix of the sample.
Abstract:
A system and method for controlling polarisation state determining parameters of a polarised beam of light in an ellipsometer or polarimeter and the like system, so that they are in ranges wherein the sensitivity, of a sample system characterising PSI and DELTA value monitoring detector (DET) used to measure changes in said polarisation state resulting from interaction with a "composite sample system," comprised of a sample system per se. (SS) and a beam polarisation state determining variable retarder, to noise and measurement errors etc. therein), is reduced. This allows determining sample system per se. characterising PSI and DELTA values, from Composite Sample System characterising PSI and DELTA values, by compensating for the presence of components, (VR1) and/or (VR2), added to an ellipsometer or polarimeter and the like system. The arrangement also improves the ability of an ellipsometer or polarimeter and the like system fitted with components (VR1) and/or (VR2) to provide usably accurate and precise sample system characterising PSI and DELTA determining data values, wherein a sample system per se. investigating polarised beam of light is oriented at other than a Principal or Brewster Angle of Incidence thereto, the use of which Angle of Incidence would otherwise be difficult, if not impossible. The arrangement also allows determination of the "Handedness" of a polarised beam of light, and of sample system Jones or Mueller Matrix component values; and provides means for making system components (VR1) and/or (VR2) added to an ellipsometer or polarimeter and the like system, essentially end user transparent when desired, without removal thereof from said ellipsometer or polarimeter and the like system.
Abstract:
A polarization viewer comprising a mechanism (12, 18, 20) for forming a broadview image having a spectral width greater than 2 angstroms and 50 DEG based on polarization information of a scene. The polarization viewer is also comprised of a mechanism (12, 18, 20) for providing polarization information to the forming mechanism. The providing mechanism is in communication with the forming mechanism. In a first embodiment, the providing mechanism includes a camera mechanism in communication with the forming mechanism. The camera mechanism includes a fixed polarizer analyzer (12) disposed such that electromagnetic radiation entering the camera mechanism passes through the polarizer analyzer (12). The providing mechanism can also include a mechanism for steering a polarization plane of the radiation. The steering mechanism is disposed such that radiation passing through the polarizer analyser first passes through the steering mechanism. The steering mechanism preferably includes a first twist crystal (18) and at least a second twist crystal (20) aligned with the first twist crystal such that radiation passing through the first crystal has a first state and a second state.
Abstract:
An instrument includes a polarized optical source for producing three sequential predetermined states of polarization of a light beam at each of at least two wavelengths, as well as an optical polarization meter for measuring the polarization of a portion of the light beam at each wavelength transmitted by or reflected from an optical network by splitting it into four beams, passing three of the beams through optical elements, measuring the transmitted intensity of all four beams, and calculating Stokes parameters. The three sequential predetermined states of polarization at each wavelength yield three corresponding Jones input vectors at each wavelength, and the Stokes parameters for the responses of the optical network are converted to three Jones output vectors at each wavelength. A Jones matrix for the optical network to within a complex constant is then computed from the Jones input and output vectors at each wavelength. Polarization mode dispersion in the optical network is determined from these matrices.