DÉTACHEMENT D'UNE COUCHE AUTOPORTÉE DE SILICIUM<100>
    11.
    发明公开
    DÉTACHEMENT D'UNE COUCHE AUTOPORTÉE DE SILICIUM<100> 有权
    ABLÖSUNGEINER SELBSTTRAGENDEN SCHICHT AUS SILICIUM <100>

    公开(公告)号:EP2870627A1

    公开(公告)日:2015-05-13

    申请号:EP13739766.7

    申请日:2013-07-01

    IPC分类号: H01L21/762 H01L31/00

    摘要: A method for detaching a self-supporting layer (4) of silicon crystalline orientation , with a view, in particular, to applications in the photovoltaic field, characterised in that the method comprises the steps consisting of: a) Implanting ionic species in a substrate (1) of silicon crystalline orientation so as to create a plane of weakness (2) in the implanted substrate (1), delimiting, on either side, a self-supporting layer (4) and a negative (5) of the substrate (1), and b) Applying a heat treatment to the implanted substrate (1) with a temperature ramp greater than 30°C/sec. so as to detach the self-supporting layer (4) of silicon.

    摘要翻译: 一种用于分离晶体取向<100>的自支撑层的方法,特别是为了在光伏领域中的应用,其中该方法包括以下步骤:a)将离子物种植入由硅制成的衬底中, 晶体取向<100>,以便在衬底中产生脆化平面,在两侧限定衬底的自支撑层和负极,以及b)对步骤a)中植入的衬底进行热处理, 温度斜坡大于30℃/秒,以便分离硅的自支撑层。

    PROCEDE DE FORMATION D'UNE FRACTURE DANS UN MATERIAU
    18.
    发明公开
    PROCEDE DE FORMATION D'UNE FRACTURE DANS UN MATERIAU 有权
    一种用于生产TEAR在材料

    公开(公告)号:EP2705529A1

    公开(公告)日:2014-03-12

    申请号:EP12723839.2

    申请日:2012-04-27

    IPC分类号: H01L21/762

    CPC分类号: H01L21/76254

    摘要: The invention relates to a process for forming a semiconductor layer (26) using a substrate (20), called a donor substrate, made of the same semiconductor material, the process comprising: forming a region (22) with a high lithium concentration in said donor substrate, the lithium concentration in said region being between 5×10
    18 atoms/cm
    3 and 5×10
    20 atoms/cm
    3 ; next, implanting hydrogen (24) into the donor substrate, in, or in the vicinity of, the region with a high lithium concentration; applying a carrier (19) to the donor substrate; and applying a thermal budget so as to detach the layer (34) defined by the implantation.